| Automated circuit sizing with multi-objective optimization based on differential evolution and Bayesian inference C Vişan, O Pascu, M Stănescu, ED Şandru, C Diaconu, A Buzo, G Pelz, ... Knowledge-Based Systems 258, 109987, 2022 | 15 | 2022 |
| Modeling the dependency of analog circuit performance parameters on manufacturing process variations with applications in sensitivity analysis and yield prediction ED Şandru, E David, I Kovacs, A Buzo, C Burileanu, G Pelz IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2021 | 8 | 2021 |
| Unified feature selection and hyperparameter bayesian optimization for machine learning based regression ED Şandru, E David 2019 International Symposium on Signals, Circuits and Systems (ISSCS), 1-5, 2019 | 6 | 2019 |
| Modeling the dependencies between circuit and technology parameters for sensitivity analysis using machine learning techniques ED Sandru, C Burileanu, E David, A Buzo, G Pelz 2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019 | 5 | 2019 |
| Pre-silicon yield estimation using machine learning regression ED Şandru, E David, G Pelz 2019 26th IEEE International Conference on Electronics, Circuits and Systems …, 2019 | 4 | 2019 |
| Machine Learning-Based Local Sensitivity Analysis of Integrated Circuits to Process Variations ED Şandru, E David, G Pelz 2020 27th IEEE International Conference on Electronics, Circuits and Systems …, 2020 | 2 | 2020 |
| Recent Experiments and Findings in Baby Cry Classification CB Elena-Diana Șandru, Andi Buzo, Horia Cucu Future Access Enablers for Ubiquitous and Intelligent Infrastructures: Third …, 2018 | 1* | 2018 |
| Recent Experiments and Findings in Baby Cry Classification ED Șandru, A Buzo, H Cucu, C Burileanu International Conference on Future Access Enablers of Ubiquitous and …, 2017 | 1 | 2017 |
| ON THE ROBUSTNESS OF THE METHODOLOGY FOR MODELLING THE DEPENDENCIES BETWEEN CIRCUIT AND TECHNOLOGY PARAMETERS OF INTEGRATED CIRCUITS ED SANDRU, C BURILEANU, E DAVID, G PELZ University POLITEHNICA of Bucharest Scientific Bulletin, Series C …, 2021 | | 2021 |
| Correlating electrical and process parameters for yield detractors’ detection I Kovacs, M Țopa, C Pop, ED Șandru, A Buzo, G Pelz 2020 International Symposium on Electronics and Telecommunications (ISETC), 1-4, 2021 | | 2021 |
| SMACD 2019, Lausanne, Switzerland R Abd-Alhameed, A Abdulkhaleq, H Aboushady, E Afacan, S Ahmed, ... | | |
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