Follow
Valeriy Stikanov
Valeriy Stikanov
National Techincal University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute
Verified email at kpi.ua - Homepage
Title
Cited by
Cited by
Year
Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays
A Grossi, D Walczyk, C Zambelli, E Miranda, P Olivo, V Stikanov, A Feriani, ...
IEEE Transactions on Electron Devices 62 (8), 2502-2509, 2015
692015
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays
A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, C Walczyk, ...
Solid-State Electronics 115, 17-25, 2016
552016
Statistical analysis of resistive switching characteristics in ReRAM test arrays
C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ...
2014 International Conference on Microelectronic Test Structures (ICMTS), 27-31, 2014
372014
Relationship among current fluctuations during forming, cell-to-cell variability and reliability in RRAM arrays
A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, T Schroeder, ...
2015 IEEE International Memory Workshop (IMW), 1-4, 2015
292015
Resistive switching behavior in TiN/HfO2/Ti/TiN devices
D Walczyk, T Bertaud, M Sowinska, M Lukosius, MA Schubert, A Fox, ...
2012 International Semiconductor Conference Dresden-Grenoble (ISCDG), 143-146, 2012
242012
Electrical characterization of read window in ReRAM arrays under different SET/RESET cycling conditions
C Zambelli, A Grossi, P Olivo, D Walczyk, J Dabrowski, B Tillack, ...
2014 IEEE 6th International Memory Workshop (IMW), 1-4, 2014
232014
A low-cost SiGe: C BiCMOS technology with embedded flash memory and complementary LDMOS module
D Knoll, A Fox, KE Ehwald, B Heinemann, R Barth, A Fischer, H Rucker, ...
Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005 …, 2005
122005
A 10 Vpp SiGe voltage driver
P Ostrovskyy, H Gustat, C Scheytt, V Stikanov
2010 20th International Crimean Conference" Microwave & Telecommunication …, 2010
42010
Cost-effective integration of an FN-programmed embedded flash memory into a 0.25 μm SiGe: C RF-BiCMOS technology
A Fox, KE Ehwald, P Schley, R Barth, S Marschmeyer, C Wolf, ...
Microelectronics journal 37 (11), 1194-1199, 2006
32006
Cost-effective integration of an FN-programmed embedded flash memory into a 0.25/spl mu/m RF-BiCMOS technology
A Fox, KE Ehwald, P Schley, R Barth, S Marschmeyer, C Wolf, ...
Proceedings. The 16th International Conference on Microelectronics, 2004 …, 2004
32004
2015 IEEE 7TH INTERNATIONAL MEMORY WORKSHOP, IMW 2015
A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, T Schroeder, ...
2015
2014 IEEE 6TH INTERNATIONAL MEMORY WORKSHOP, IMW 2014
L Zhang, CH Chang, ZH Kong, X Fong, K Roy, C Zambelli, A Grossi, ...
2014
IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES
C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ...
2014
ECS TRANSACTIONS
T Bertaud, D Walczyk, M Sowinska, D Wolansky, B Tillack, G Schoof, ...
2012
IEEE 2012 INTERNATIONAL SEMICONDUCTOR CONFERENCE DRESDEN-GRENOBLE, ISCDG 2012
U Kaletta, D Wolansky, M Fraschke, C Wenger, D Walczyk, T Bertaud, ...
2012
КОНФЕРЕНЦИЯ
D Knoll, A Fox, KE Ehwald, B Heinemann, R Barth, A Fischer, H Rücker, ...
2005
The system can't perform the operation now. Try again later.
Articles 1–16