Impact of intercell and intracell variability on forming and switching parameters in RRAM arrays A Grossi, D Walczyk, C Zambelli, E Miranda, P Olivo, V Stikanov, A Feriani, ... IEEE Transactions on Electron Devices 62 (8), 2502-2509, 2015 | 69 | 2015 |
Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, C Walczyk, ... Solid-State Electronics 115, 17-25, 2016 | 55 | 2016 |
Statistical analysis of resistive switching characteristics in ReRAM test arrays C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ... 2014 International Conference on Microelectronic Test Structures (ICMTS), 27-31, 2014 | 37 | 2014 |
Relationship among current fluctuations during forming, cell-to-cell variability and reliability in RRAM arrays A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, T Schroeder, ... 2015 IEEE International Memory Workshop (IMW), 1-4, 2015 | 29 | 2015 |
Resistive switching behavior in TiN/HfO2/Ti/TiN devices D Walczyk, T Bertaud, M Sowinska, M Lukosius, MA Schubert, A Fox, ... 2012 International Semiconductor Conference Dresden-Grenoble (ISCDG), 143-146, 2012 | 24 | 2012 |
Electrical characterization of read window in ReRAM arrays under different SET/RESET cycling conditions C Zambelli, A Grossi, P Olivo, D Walczyk, J Dabrowski, B Tillack, ... 2014 IEEE 6th International Memory Workshop (IMW), 1-4, 2014 | 23 | 2014 |
A low-cost SiGe: C BiCMOS technology with embedded flash memory and complementary LDMOS module D Knoll, A Fox, KE Ehwald, B Heinemann, R Barth, A Fischer, H Rucker, ... Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005 …, 2005 | 12 | 2005 |
A 10 Vpp SiGe voltage driver P Ostrovskyy, H Gustat, C Scheytt, V Stikanov 2010 20th International Crimean Conference" Microwave & Telecommunication …, 2010 | 4 | 2010 |
Cost-effective integration of an FN-programmed embedded flash memory into a 0.25 μm SiGe: C RF-BiCMOS technology A Fox, KE Ehwald, P Schley, R Barth, S Marschmeyer, C Wolf, ... Microelectronics journal 37 (11), 1194-1199, 2006 | 3 | 2006 |
Cost-effective integration of an FN-programmed embedded flash memory into a 0.25/spl mu/m RF-BiCMOS technology A Fox, KE Ehwald, P Schley, R Barth, S Marschmeyer, C Wolf, ... Proceedings. The 16th International Conference on Microelectronics, 2004 …, 2004 | 3 | 2004 |
2015 IEEE 7TH INTERNATIONAL MEMORY WORKSHOP, IMW 2015 A Grossi, C Zambelli, P Olivo, E Miranda, V Stikanov, T Schroeder, ... | | 2015 |
2014 IEEE 6TH INTERNATIONAL MEMORY WORKSHOP, IMW 2014 L Zhang, CH Chang, ZH Kong, X Fong, K Roy, C Zambelli, A Grossi, ... | | 2014 |
IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES C Zambelli, A Grossi, P Olivo, D Walczyk, T Bertaud, B Tillack, ... | | 2014 |
ECS TRANSACTIONS T Bertaud, D Walczyk, M Sowinska, D Wolansky, B Tillack, G Schoof, ... | | 2012 |
IEEE 2012 INTERNATIONAL SEMICONDUCTOR CONFERENCE DRESDEN-GRENOBLE, ISCDG 2012 U Kaletta, D Wolansky, M Fraschke, C Wenger, D Walczyk, T Bertaud, ... | | 2012 |
КОНФЕРЕНЦИЯ D Knoll, A Fox, KE Ehwald, B Heinemann, R Barth, A Fischer, H Rücker, ... | | 2005 |