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Yifeng Shao
Yifeng Shao
Verified email at tudelft.nl - Homepage
Title
Cited by
Cited by
Year
Noniterative spatially partially coherent diffractive imaging using pinhole array mask
X Lu, Y Shao, C Zhao, S Konijnenberg, X Zhu, Y Tang, Y Cai, HP Urbach
Advanced Photonics 1 (1), 016005-016005, 2019
452019
Phase detection of coherence singularities and determination of the topological charge of a partially coherent vortex beam
X Lu, C Zhao, Y Shao, J Zeng, S Konijnenberg, X Zhu, S Popov, ...
Applied Physics Letters 114 (20), 2019
422019
Spatial coherence measurement and partially coherent diffractive imaging using self-referencing holography
Y Shao, X Lu, S Konijnenberg, C Zhao, Y Cai, HP Urbach
Optics Express 26 (4), 4479-4490, 2018
322018
Study of surface modes on a vibrating electrowetting liquid lens
M Strauch, Y Shao, F Bociort, HP Urbach
Applied physics letters 111 (17), 171106, 2017
252017
Using saddle points for challenging optical design tasks
I Livshits, Z Hou, P van Grol, Y Shao, M van Turnhout, P Urbach, F Bociort
Current Developments in Lens Design and Optical Engineering XV 9192, 919204, 2014
92014
Adv. Photonics 1, 016005 (2019)
X Lu, Y Shao, C Zhao, S Konijnenberg, X Zhu, Y Tang, Y Cai, HP Urbach
6
Maximum-likelihood estimation in ptychography in the presence of Poisson–Gaussian noise statistics
J Seifert, Y Shao, R Van Dam, D Bouchet, T Van Leeuwen, AP Mosk
Optics Letters 48 (22), 6027-6030, 2023
42023
Spatially varying aberration calibration using a pair of matched periodic pinhole array masks
Y Shao, M Loktev, Y Tang, F Bociort, HP Urbach
Optics Express 27 (2), 729-742, 2019
22019
Projection lens testing with Moiré effect
M Loktev, Y Shao
Metrology, Inspection, and Process Control for Microlithography XXXI 10145 …, 2017
12017
Optical optimisation of Fabry-Pérot based spectral imaging systems
M Strauch, IL Livshits, Y Shao, F Bociort, P Urbach
EOSAM 2014, 2014
12014
Noise-robust latent vector reconstruction in ptychography using deep generative models
J Seifert, Y Shao, AP Mosk
Optics Express 32 (1), 1020-1033, 2024
2024
Maximum-likelihood estimation in ptychography in the presence of Poisson–Gaussian noise statistics: publisher’s note
J Seifert, Y Shao, R Van Dam, D Bouchet, T Van Leeuwen, AP Mosk
Optics Letters 48 (23), 6291-6291, 2023
2023
Wavelength-multiplexed Multi-mode EUV Reflection Ptychography based on Automatic-Differentiation
Y Shao, S Weerdenburg, J Seifert, HP Urbach, AP Mosk, W Coene
arXiv preprint arXiv:2311.14780, 2023
2023
EUV diffractive imaging in reflection for wafer metrology using HHG source and automatic differentiation based ptychography
S Weerdenburg, Y Shao, R Horsten, W Coene
Computational Optical Sensing and Imaging, CM4B. 2, 2023
2023
Systems and methods of determining aberrations in images obtained by a charged-particle beam tool
MRG Yifeng SHAO
US Patent US20220328282A1, 2022
2022
Reflection Ptychography via Auto Differentiation on a High Harmonic EUV beamline
S Weerdenburg, Y Shao, J Seifert, R Horsten, W Coene
Compact EUV & X-ray Light Sources, EW4A. 2, 2022
2022
Comment on “Efficient full-path optical calculation of scalar and vector diffraction using the Bluestein method”
Y Shao, HP Urbach
Light: Science & Applications 10 (1), 12, 2021
2021
Inverse problem on Imaging and Imaging System: The study of coherence, aberration, and optimization
Y Shao
2021
Optical device and method for measuring spatially-varying aberrations of an imaging system
Y Shao
2020
Wavefront shaping with an electrowetting liquid lens using surface harmonics
M Strauch, SP Konijnenberg, Y Shao, HP Urbach
SPIE BIOS, 2017
2017
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Articles 1–20