| Total-Ionizing-Dose Irradiation-Induced Dielectric Field Enhancement for High-Voltage SOI LDMOS X Zhou, L Shu, M Qiao, Z Lu, Y Zhao, Z Li, B Zhang IEEE Electron Device Letters 40 (4), 593-596, 2019 | 23 | 2019 |
| Numerical and Experimental Investigation of TID Radiation Effects on the Breakdown Voltage of 400-V SOI NLDMOSFETs L Shu, L Wang, X Zhou, CL Sui, Y Li, B Wang, YF Zhao, KF Galloway IEEE Transactions on Nuclear Science 66 (4), 710-715, 2019 | 17 | 2019 |
| Investigation on total-ionizing-dose radiation response for high voltage ultra-thin layer SOI LDMOS X Zhou, L Zhang, M Qiao, P Luo, L Shu, Z Li, B Zhang 2018 IEEE 30th International Symposium on Power Semiconductor Devices and …, 2018 | 17 | 2018 |
| Effect of Drift Length on Shifts in 400V SOI LDMOS Breakdown Voltage due to TID L Shu, YF Zhao, KF Galloway, L Wang, XS Wang, X Zhou, WP Chen, ... IEEE Transactions on Nuclear Science, 2020 | 12 | 2020 |
| TID-Induced Off-State Leakage Current in Partially Radiation-Hardened SOI LDMOS L Shu, L Wang, K Zhao, X Zhou, YF Zhao, KF Galloway, CL Sui, CM Liu, ... IEEE Transactions on Nuclear Science, 2020 | 12 | 2020 |
| Simulation Research on Single Event Burnout Performances of p-GaN Gate HEMTs With 2DEG AlₓGa₁₋ ₓN Channel S Liu, J Zhang, S Zhao, L Shu, X Song, X Qin, Y Wu, W Zhang, T Li, ... IEEE Transactions on Electron Devices, 2022 | 10 | 2022 |
| Modeling Irradiation-Induced Degradation for 4H-SiC Power MOSFETs S Liang, Y Yang, L Shu, Z Wu, B Chen, H Yu, H Liu, L Wang, T Li, G Deng, ... IEEE Transactions on Electron Devices, 2023 | 8 | 2023 |
| Total-Ionizing-Dose Radiation-Induced Dual-Channel Leakage Current at Unclosed Edge Termination for High Voltage SOI LDMOS X Zhou, Z Li, R Wang, L Shu, T Wang, M Qiao, Z Wang, Z Li, B Zhang IEEE Transactions on Electron Devices 68 (6), 2861-2866, 2021 | 8 | 2021 |
| Single-Event Transient Analysis and Hardening in a 180 nm CMOS Embedded Low-Dropout Regulator L Wang, X Han, Y Zhao, Q Bian, S Yue, S Lu, L Shu, J Liu, T Li 2017 17th European Conference on Radiation and Its Effects on Components and …, 2017 | 8 | 2017 |
| Observation of single event burnout (SEB) in an SOI NLDMOSFET using a pulsed laser L Shu, CH Qi, KF Galloway, YF Zhao, WY Cao, XJ Li, L Wang, EX Zhang, ... Microelectronics Reliability 116, 113997, 2021 | 7 | 2021 |
| Design of Data Management System for Remote ECG Monitoring JL Zhang, J Wang, L Shu, S Zhang Applied Mechanics and Materials 543, 993-996, 2014 | 7 | 2014 |
| TID Effects on Soft-breakdown and Self-heating Characteristics of 400V SOI NLDMOSFETs L Shu, L Wang, X Zhou, Y Li, CL Sui, YF Zhao 2018 18th European Conference on Radiation and Its Effects on Components and …, 2018 | 5 | 2018 |
| High energy proton and heavy ion induced single event transient in 65-nm CMOS technology J Liu, Y Zhao, L Wang, D Wang, H Zheng, M Chen, L Shu, T Li, D Li, ... Science China Information Sciences 60 (12), 120405, 2017 | 4 | 2017 |
| A Secret Key Classification Framework of Symmetric Encryption Algorithm Based on Deep Transfer Learning X Cui, H Zhang, X Fang, Y Wang, D Wang, F Fan, L Shu Applied Sciences 13 (21), 12025, 2023 | 2 | 2023 |
| TID-Induced Breakdown Voltage Degradation in Uniform and Linear Variable Doping SOI p-LDMOSFETs L Shu, YF Zhao, KF Galloway, L Wang, K Zhao, X Zhou, CM Liu, WY Cao, ... IEEE Transactions on Nuclear Science, 2019 | 2 | 2019 |
| 65nm 反相器单粒子瞬态脉宽分布的多峰值现象 刘家齐， 赵元富， 王亮， 郑宏超， 舒磊， 李同德 电子技术应用 43 (1), 20-23, 2017 | 2 | 2017 |
| Observations on Ruggedness Degradation of Planar-gate SiC MOSFETs after Total Ionizing Dose Radiation S Liang, Z Wu, L Shu, J Wang, H Chen, G Deng, Z Shen, F Fan, C Wang 2023 IEEE Energy Conversion Congress and Exposition (ECCE), 5379-5384, 2023 | 1 | 2023 |
| Hybrid Threshold Denoising Framework Using Singular Value Decomposition for Side-Channel Analysis Preprocessing Y Wang, H Zhang, X Fang, X Cui, W Ning, D Wang, F Fan, L Shu Entropy 25 (8), 1133, 2023 | 1 | 2023 |
| Comparison of Gamma Irradiation Effects on Short Circuit Characteristics of SiC MOSFET Power Devices between Planar and Trench Structures L Shu, HL Liao, ZY Wu, YY Li, XY Fang, SW Liang, TD Li, L Wang, J Wang, ... Electronics 12 (13), 2891, 2023 | 1 | 2023 |
| Remaining Useful Life Prediction Method of PEM Fuel Cell Based on Hybrid Model Q Tian, H Chen, S Ding, L Shu, L Wang, J Huang Preprints, 2023 | 1 | 2023 |
Liang WangBeijing Microelectronics Technology InstituteVerified email at vanderbilt.edu
