TransferD2: Automated Defect Detection Approach in Smart Manufacturing using Transfer Learning Techniques A Nuh Mih, H Cao, J Pickard, M Wachowicz, R Dubay 2023 IEEE International Conference on Omni-layer Intelligent Systems (COINS …, 2023 | 2 | 2023 |
Achieving Pareto Optimality using Efficient Parameter Reduction for DNNs in Resource-Constrained Edge Environment AN Mih, A Rahimi, A Kawnine, F Palma, M Wachowicz, R Dubay, H Cao arXiv preprint arXiv:2403.10569, 2024 | | 2024 |
Evaluating Multi-Global Server Architecture for Federated Learning A Kawnine, H Cao, A Nuh Mih, M Wachowicz 2024 IEEE International Conference on Consumer Electronics (ICCE), 1-6, 2024 | | 2024 |
ECAvg: An Edge-Cloud Collaborative Learning Approach using Averaged Weights A Nuh Mih, H Cao, A Kawnine, M Wachowicz 2024 IEEE International Conference on Consumer Electronics (ICCE), 1-6, 2024 | | 2024 |
Developing a Resource-Constraint EdgeAI model for Surface Defect Detection AN Mih, H Cao, A Kawnine, M Wachowicz arXiv preprint arXiv:2401.05355, 2023 | | 2023 |
Developing a Resource-Constraint EdgeAI model for Surface Defect Detection A Nuh Mih, H Cao, A Kawnine, M Wachowicz arXiv e-prints, arXiv: 2401.05355, 2023 | | 2023 |