Follow
Jonathan P Pelz
Jonathan P Pelz
Verified email at osu.edu
Title
Cited by
Cited by
Year
Creation of an atomic superlattice by immersing metallic adatoms in a two-dimensional electron sea
F Silly, M Pivetta, M Ternes, F Patthey, JP Pelz, WD Schneider
Physical review letters 92 (1), 016101, 2004
2622004
Nanometer-scale test of the Tung model of Schottky-barrier height inhomogeneity
HJ Im, Y Ding, JP Pelz, WJ Choyke
Physical Review B 64 (7), 075310, 2001
1482001
Quantitative "local-interference" model for noise in metal films
J Pelz, J Clarke
Physical Review B 36 (8), 4479, 1987
1231987
Dependence of Noise on Defects Induced in Copper Films by Electron Irradiation
J Pelz, J Clarke
Physical review letters 55 (7), 738, 1985
1121985
Scanning tunneling microscopy study of oxide nucleation and oxidation-induced roughening at elevated temperatures on the Si (001)-(2× 1) surface
JV Seiple, JP Pelz
Physical review letters 73 (7), 999, 1994
1031994
Spatially-resolved spectroscopic measurements of Ec − 0.57 eV traps in AlGaN/GaN high electron mobility transistors
DW Cardwell, A Sasikumar, AR Arehart, SW Kaun, J Lu, S Keller, ...
Applied Physics Letters 102 (19), 193509, 2013
1022013
Striped Phase and Temperature Dependent Step Shape Transition on Highly B-Doped Si(001)-( ) Surfaces
DE Jones, JP Pelz, Y Hong, E Bauer, IST Tsong
Physical review letters 77 (2), 330, 1996
911996
Instrumentation for direct, low frequency scanning capacitance microscopy, and analysis of position dependent stray capacitance
DT Lee, JP Pelz, B Bhushan
Review of scientific Instruments 73 (10), 3525-3533, 2002
862002
Successive oxidation stages of adatoms on the Si (111) 7× 7 surface observed with scanning tunneling microscopy and spectroscopy
JP Pelz, RH Koch
Physical Review B 42 (6), 3761, 1990
811990
Successive oxidation stages and annealing behavior of the Si (111) 7× 7 surface observed with scanning tunneling microscopy and scanning tunneling spectroscopy
JP Pelz, RH Koch
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1991
721991
Nanometer-Scale Creation and Characterization of Trapped Charge in Si Films Using Ballistic Electron Emission Microscopy
B Kaczer, Z Meng, JP Pelz
Physical review letters 77 (1), 91, 1996
701996
Comparison of mixed anion, and mixed cation, metamorphic buffers grown by molecular beam epitaxy on (100) InP substrates
MK Hudait, Y Lin, MN Palmisiano, C Tivarus, JP Pelz, SA Ringel
Journal of applied physics 95 (8), 3952-3960, 2004
662004
Evolution of atomic‐scale roughening on Si (001)‐(2× 1) surfaces resulting from high temperature oxidation
JV Seiple, JP Pelz
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 13 (3 …, 1995
661995
Extremely low‐noise potentiometry with a scanning tunneling microscope
JP Pelz, RH Koch
Review of scientific Instruments 60 (3), 301-305, 1989
611989
Tip-related artifacts in scanning tunneling potentiometry
JP Pelz, RH Koch
Physical Review B 41 (2), 1212, 1990
601990
Scanning-tunneling spectroscopy of surface-state electrons scattered by a slightly disordered two-dimensional dilute “solid”: Ce on Ag (111)
M Ternes, C Weber, M Pivetta, F Patthey, JP Pelz, T Giamarchi, F Mila, ...
Physical review letters 93 (14), 146805, 2004
592004
Ballistic‐electron emission microscopy studies of charge trapping in SiO2
B Kaczer, JP Pelz
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996
571996
Coverage-dependent self-organization: from individual adatoms to adatom superlattices
F Silly, M Pivetta, M Ternes, F Patthey, JP Pelz, WD Schneider
New Journal of Physics 6 (1), 16, 2004
532004
Direct observation of conduction-band structure of - and using ballistic electron emission microscopy
B Kaczer, HJ Im, JP Pelz, J Chen, WJ Choyke
Physical Review B 57 (7), 4027, 1998
531998
Elevated temperature oxidation and etching of the Si (111) 7× 7 surface observed with scanning tunneling microscopy
J Seiple, J Pecquet, Z Meng, JP Pelz
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 11 (4 …, 1993
521993
The system can't perform the operation now. Try again later.
Articles 1–20