Saibal Mukhopadhyay
Saibal Mukhopadhyay
Professor of Electrical Engineering, Georgia Institute of Technology
Geverifieerd e-mailadres voor ece.gatech.edu
Titel
Geciteerd door
Geciteerd door
Jaar
Leakage current mechanisms and leakage reduction techniques in deep-submicrometer CMOS circuits
K Roy, S Mukhopadhyay, H Mahmoodi-Meimand
Proceedings of the IEEE 91 (2), 305-327, 2003
27882003
Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS
S Mukhopadhyay, H Mahmoodi, K Roy
IEEE transactions on computer-aided design of integrated circuits and …, 2005
5752005
Neurocube: A programmable digital neuromorphic architecture with high-density 3D memory
D Kim, J Kung, S Chai, S Yalamanchili, S Mukhopadhyay
ACM SIGARCH Computer Architecture News 44 (3), 380-392, 2016
3012016
A circuit-compatible model of ballistic carbon nanotube field-effect transistors
A Raychowdhury, S Mukhopadhyay, K Roy
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
2642004
Process variation in embedded memories: failure analysis and variation aware architecture
A Agarwal, BC Paul, S Mukhopadhyay, K Roy
IEEE Journal of Solid-State Circuits 40 (9), 1804-1814, 2005
2052005
Gate leakage reduction for scaled devices using transistor stacking
S Mukhopadhyay, C Neau, RT Cakici, A Agarwal, CH Kim, K Roy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 11 (4), 716-730, 2003
1962003
Leakage power analysis and reduction for nanoscale circuits
A Agarwal, S Mukhopadhyay, A Raychowdhury, K Roy, CH Kim
IEeE Micro 26 (2), 68-80, 2006
1882006
Estimation of delay variations due to random-dopant fluctuations in nanoscale CMOS circuits
H Mahmoodi, S Mukhopadhyay, K Roy
IEEE Journal of Solid-State Circuits 40 (9), 1787-1796, 2005
1872005
Low-power scan design using first-level supply gating
S Bhunia, H Mahmoodi, D Ghosh, S Mukhopadhyay, K Roy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (3), 384-395, 2005
1652005
Statistical design and optimization of SRAM cell for yield enhancement
S Mukhopadhyay, H Mahmoodi, K Roy
IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004 …, 2004
1622004
Modeling and estimation of total leakage current in nano-scaled CMOS devices considering the effect of parameter variation
S Mukhopadhyay, K Roy
Proceedings of the 2003 international symposium on Low power electronics and …, 2003
1612003
Accurate estimation of total leakage current in scaled CMOS logic circuits based on compact current modeling
S Mukhopadhyay, A Raychowdhury, K Roy
Proceedings of the 40th annual Design Automation Conference, 169-174, 2003
1602003
A forward body-biased low-leakage SRAM cache: device, circuit and architecture considerations
CH Kim, JJ Kim, S Mukhopadhyay, K Roy
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 13 (3), 349-357, 2005
1312005
Accurate estimation of total leakage in nanometer-scale bulk CMOS circuits based on device geometry and doping profile
S Mukhopadhyay, A Raychowdhury, K Roy
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005
1262005
An energy efficient cache design using spin torque transfer (STT) RAM
M Rasquinha, D Choudhary, S Chatterjee, S Mukhopadhyay, ...
2010 ACM/IEEE International Symposium on Low-Power Electronics and Design …, 2010
1242010
Device-optimization technique for robust and low-power FinFET SRAM design in nanoscale era
A Bansal, S Mukhopadhyay, K Roy
IEEE Transactions on Electron Devices 54 (6), 1409-1419, 2007
1142007
Modeling and estimation of failure probability due to parameter variations in nano-scale SRAMs for yield enhancement
S Mukhopadhyay, H Mahmoodi-Meimand, K Roy
2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No …, 2004
1112004
Process variations and process-tolerant design
S Bhunia, S Mukhopadhyay, K Roy
20th international conference on VLSI design held jointly with 6th …, 2007
992007
Fast and accurate analytical modeling of through-silicon-via capacitive coupling
DH Kim, S Mukhopadhyay, SK Lim
IEEE Transactions on Components, Packaging and Manufacturing Technology 1 (2 …, 2011
962011
Design of a process variation tolerant self-repairing SRAM for yield enhancement in nanoscaled CMOS
S Mukhopadhyay, K Kim, H Mahmoodi, K Roy
IEEE Journal of Solid-State Circuits 42 (6), 1370-1382, 2007
952007
Het systeem kan de bewerking nu niet uitvoeren. Probeer het later opnieuw.
Artikelen 1–20