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Maurits de Jong
Maurits de Jong
Verified email at utwente.nl
Title
Cited by
Cited by
Year
Towards understanding recovery of hot-carrier induced degradation
MJ de Jong, C Salm, J Schmitz
Microelectronics reliability 88, 147-151, 2018
82018
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs
MJ de Jong, C Salm, J Schmitz
Microelectronics reliability 76, 136-140, 2017
82017
Recovery after hot-carrier injection: Slow versus fast traps
MJ de Jong, C Salm, J Schmitz
Microelectronics reliability 100, 113318, 2019
62019
Recovery of Hot-Carrier Degraded nMOSFETs
MJ de Jong
2022
Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material
AEM Smink, MJ de Jong, H Hilgenkamp, WG Van Der Wiel, J Schmitz
2020 IEEE 33rd International Conference on Microelectronic Test Structures …, 2020
2020
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices
MJ De Jong, C Salm, J Schmitz
2020 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2020
2020
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Articles 1–6