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thomas merelle
thomas merelle
Senior consultant, PhD
Verified email at pi-lighting.com
Title
Cited by
Cited by
Year
finFET drive strength modification
T Merelle, G Doornbos, RJP Lander
US Patent 8,283,231, 2012
882012
Criterion for SEU occurrence in SRAM deduced from circuit and device simulations in case of neutron-induced SER
T Merelle, H Chabane, JM Palau, K Castellani-Coulie, F Wrobel, F Saigné, ...
IEEE transactions on nuclear science 52 (4), 1148-1155, 2005
762005
Monte-Carlo simulations to quantify neutron-induced multiple bit upsets in advanced SRAMs
T Mérelle, F Saigné, B Sagnes, G Gasiot, P Roche, T Carriere, MC Palau, ...
IEEE Transactions on Nuclear Science 52 (5), 1538-1544, 2005
452005
Matching performance of FinFET devices with fin widths down to 10 nm
P Magnone, A Mercha, V Subramanian, P Parvais, N Collaert, M Dehan, ...
IEEE electron device letters 30 (12), 1374-1376, 2009
432009
CMOS biosensor platform
F Widdershoven, D Van Steenwinckel, J Überfeld, T Merelle, H Suy, ...
2010 International Electron Devices Meeting, 36.1. 1-36.1. 4, 2010
362010
Device having self-assembled-monolayer
T Merelle, MHA Lambert, F Frederix
US Patent App. 13/378,302, 2012
322012
First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling
T Merelle, G Curatola, A Nackaerts, N Collaert, MJH Van Dal, G Doornbos, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
302008
Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices
L Pelaz, R Duffy, M Aboy, L Marques, P Lopez, I Santos, BJ Pawlak, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
222008
Quantified insights into LED variability
R Bornoff, T Mérelle, J Sari, A Di Bucchianico, G Farkas
2018 24rd International Workshop on Thermal Investigations of ICs and …, 2018
172018
Charge sharing study in the case of neutron induced SEU on 130 nm bulk SRAM modeled by 3-D device simulation
T Merelle, S Serre, F Saigné, B Sagnes, G Gasiot, P Roche, T Carriere, ...
IEEE transactions on nuclear science 53 (4), 1897-1901, 2006
142006
Modeling and quantifying LED variability
T Mérelle, R Bornoff, G Onushkin, L Gaál, G Farkas, A Poppe, G Hantos, ...
Proceedings of the 2018 LED Professional Symposium (LpS2018), Bregenz …, 2018
102018
Inter Laboratory Comparison of LED Measurements Aimed as Input for Multi-Domain Compact Model Development within a European-wide R&D Project
A Poppe, G Farkas, F Szabó, J Joly, J Thomé, J Yu, K Bosschaartl, ...
Proceedings of the Conference on “Smarter Lighting for Better Life” at the …, 2017
102017
FinFET drive strength modification
T Merelle, G Doornbos, RJP Lander
US Patent 8,779,527, 2014
92014
Determination of the deposited energy in a silicon volume by nuclear interaction
H Chabane, JR Vaillé, T Mérelle, F Saigné, L Dusseau, M Dumas, ...
Journal of applied physics 99 (12), 124916, 2006
82006
Delphi4LED: LED measurements and variability analysis
J Sari, T Mérelle, A Di Bucchianico, D Breton
2017 23rd International Workshop on Thermal Investigations of ICs and …, 2017
72017
FinFET drive strength modification
T Merelle, G Doornbos, RJ Lander
US Patent 9,048,122, 2015
62015
Alpha induced SEU and MBU rates evaluation for advanced srams by monte-carlo simulations
T Merelle, F Saigné, B Sagnes, G Gasiot, P Roche, T Carriere, MC Palau
2005 8th European Conference on Radiation and Its Effects on Components and …, 2005
62005
Does a single LED bin really represent a single LED type
T Mérelle, J Sari, A Di Bucchianico, G Onushkin, R Bornoff, G Farkas, ...
Proceedings of the CIE, 2019
52019
Inter Laboratory Comparison of LED Measurements Aimed as Input for Multi-Domain Compact Model Development within the Delphi4LED H2020 Project
A Poppe, G Hantos, G Farkas, F Szabó, J Joly, J Thomé, J Yu, ...
Proceedings of Lux Europa 2017, 2017
52017
IEDM Tech. Dig.
T Mérelle, G Curatola, A Nackaerts, N Collaert, MJH van Dal, G Doornbos, ...
52008
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