Joel Ferguson
Joel Ferguson
Professor of Computer Engineering, University of California Santa Cruz
Verified email at ucsc.edu - Homepage
Title
Cited by
Cited by
Year
Inductive fault analysis of MOS integrated circuits
JP Shen, W Maly, FJ Ferguson
IEEE Design & Test of Computers 2 (6), 13-26, 1985
5771985
Extraction and simulation of realistic CMOS faults using inductive fault analysis
FJ Ferguson, JP Shen
International Test Conference 1988 Proceeding@ m_New Frontiers in Testing …, 1988
2961988
Defect classes-an overdue paradigm for CMOS IC testing
CF Hawkins, JM Soden, AW Righter, FJ Ferguson
Proceedings., International Test Conference, 413-425, 1994
2521994
A CMOS fault extractor for inductive fault analysis
FJ Ferguson, JP Shen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1988
2411988
Carafe: An inductive fault analysis tool for CMOS VLSI circuits
A Jee, FJ Ferguson
Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium, 92-98, 1993
2131993
Test pattern generation for realistic bridge faults in CMOS ICs
FJ Ferguson, T Larrabee
University of California, Santa Cruz, Computer Research Laboratory, 1991
1891991
Systematic characterization of physical defects for fault analysis of MOS IC cells
W Maly, FJ Ferguson, JP Shen
Proceedings of the 1984 international test conference on The three faces of …, 1984
1421984
The design of easily testable VLSI array multipliers
JP Shen, FJ Ferguson
IEEE Transactions on Computers, 554-560, 1984
1341984
Testing for parametric faults in static CMOS circuits
FJ Ferguson, M Taylor, T Larrabee
Proceedings. International Test Conference 1990, 436-443, 1990
1171990
Diagnosis of realistic bridging faults with single stuck-at information
B Chess, DB Lavo, FJ Ferguson, T Larrabee
Proceedings of IEEE International Conference on Computer Aided Design (ICCAD …, 1995
771995
Diagnosing realistic bridging faults with single stuck-at information
DB Lavo, B Chess, T Larrabee, FJ Ferguson
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1998
761998
Testing CMOS logic gates for: realistic shorts
B Chess, A Freitas, FJ Ferguson, T Larrabee
Proceedings., International Test Conference, 395-402, 1994
501994
Defect Classes-An Overdue Paradigm for CMOS IC
CF Hawkins, JM Soden, AW Righter, FJ Ferguson
Proceedings of the IEEE International Test Conference on TEST: The Next 25 …, 0
47
On applying non-classical defect models to automated diagnosis
J Saxena, KM Butler, H Balachandran, DB Lavo, B Chess, T Larrabee, ...
Proceedings International Test Conference 1998 (IEEE Cat. No. 98CH36270 …, 1998
391998
On state reduction of incompletely specified finite state machines
S Gören, FJ Ferguson
Computers & Electrical Engineering 33 (1), 58-69, 2007
382007
Bridging fault diagnosis in the absence of physical information
DB Lavo, B Chess, T Larrabee, FJ Ferguson, J Saxena, KM Butler
Proceedings International Test Conference 1997, 887-893, 1997
371997
An unexpected factor in testing for CMOS opens: The die surface
H Konuk, FJ Ferguson
Proceedings of 14th VLSI Test Symposium, 422-429, 1996
361996
Method for diagnosing bridging faults in integrated circuits
FJ Ferguson, T Larabee, B Chess, DB Lavo
US Patent 6,560,736, 2003
342003
Method for diagnosing bridging faults in integrated circuits
FJ Ferguson, T Larabee, B Chess, DB Lavo
US Patent 6,202,181, 2001
332001
Oscillation and sequential behavior caused by interconnect opens in digital CMOS circuits
H Konuk, FJ Ferguson
Proceedings International Test Conference 1997, 597-606, 1997
331997
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