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Reet Chaudhuri
Reet Chaudhuri
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Cited by
Year
A polarization-induced 2D hole gas in undoped gallium nitride quantum wells
R Chaudhuri, SJ Bader, Z Chen, DA Muller, HG Xing, D Jena
Science 365 (6460), 1454-1457, 2019
1292019
High breakdown voltage in RF AlN/GaN/AlN quantum well HEMTs
A Hickman, R Chaudhuri, SJ Bader, K Nomoto, K Lee, HG Xing, D Jena
IEEE Electron Device Letters 40 (8), 1293-1296, 2019
992019
Prospects for wide bandgap and ultrawide bandgap CMOS devices
SJ Bader, H Lee, R Chaudhuri, S Huang, A Hickman, A Molnar, HG Xing, ...
IEEE Transactions on Electron Devices 67 (10), 4010-4020, 2020
882020
Gate-recessed E-mode p-channel HFET with high on-current based on GaN/AlN 2D hole gas
SJ Bader, R Chaudhuri, K Nomoto, A Hickman, Z Chen, HW Then, ...
IEEE Electron Device Letters 39 (12), 1848-1851, 2018
762018
Next generation electronics on the ultrawide-bandgap aluminum nitride platform
AL Hickman, R Chaudhuri, SJ Bader, K Nomoto, L Li, JCM Hwang, ...
Semiconductor Science and Technology 36 (4), 044001, 2021
542021
First RF power operation of AlN/GaN/AlN HEMTs with> 3 A/mm and 3 W/mm at 10 GHz
A Hickman, R Chaudhuri, L Li, K Nomoto, SJ Bader, JCM Hwang, ...
IEEE Journal of the Electron Devices Society 9, 121-124, 2020
482020
Molecular beam epitaxial growth of scandium nitride on hexagonal SiC, GaN, and AlN
J Casamento, J Wright, R Chaudhuri, HG Xing, D Jena
Applied Physics Letters 115 (17), 2019
392019
GaN/AlN p-channel HFETs with Imax >420 mA/mm and ~20 GHz fT / fMAX
K Nomoto, R Chaudhuri, SJ Bader, L Li, A Hickman, S Huang, H Lee, ...
2020 IEEE International Electron Devices Meeting (IEDM), 8.3. 1-8.3. 4, 2020
322020
GaN/AlN Schottky-gate p-channel HFETs with InGaN contacts and 100 mA/mm on-current
SJ Bader, R Chaudhuri, A Hickman, K Nomoto, S Bharadwaj, HW Then, ...
2019 IEEE International Electron Devices Meeting (IEDM), 4.5. 1-4.5. 4, 2019
292019
Wurtzite phonons and the mobility of a GaN/AlN 2D hole gas
SJ Bader, R Chaudhuri, MF Schubert, HW Then, HG Xing, D Jena
Applied Physics Letters 114 (25), 2019
262019
Polarization-induced 2D hole gases in pseudomorphic undoped GaN/AlN heterostructures on single-crystal AlN substrates
Z Zhang, J Encomendero, R Chaudhuri, Y Cho, V Protasenko, K Nomoto, ...
Applied Physics Letters 119 (16), 2021
192021
GaN-based multi-channel transistors with lateral gate for linear and efficient millimeter-wave power amplifiers
K Shinohara, C King, EJ Regan, J Bergman, AD Carter, A Arias, ...
2019 IEEE MTT-S International Microwave Symposium (IMS), 1133-1135, 2019
182019
Toward AlGaN channel HEMTs on AlN: Polarization-induced 2DEGs in AlN/AlGaN/AlN heterostructures
J Singhal, R Chaudhuri, A Hickman, V Protasenko, HG Xing, D Jena
APL Materials 10 (11), 2022
172022
Terahertz spectroscopy of an electron-hole bilayer system in AlN/GaN/AlN quantum wells
H Condori Quispe, SM Islam, S Bader, A Chanana, K Lee, R Chaudhuri, ...
Applied Physics Letters 111 (7), 2017
152017
High-conductivity polarization-induced 2D hole gases in undoped GaN/AlN heterojunctions enabled by impurity blocking layers
R Chaudhuri, Z Chen, DA Muller, HG Xing, D Jena
Journal of Applied Physics 130 (2), 2021
132021
15-ghz epitaxial aln fbars on sic substrates
W Zhao, MJ Asadi, L Li, R Chaudhuri, K Nomoto, HG Xing, JCM Hwang, ...
IEEE Electron Device Letters, 2023
122023
In Situ Crystalline AlN Passivation for Reduced RF Dispersion in Strained‐Channel AlN/GaN/AlN High‐Electron‐Mobility Transistors
R Chaudhuri, A Hickman, J Singhal, J Casamento, HG Xing, D Jena
physica status solidi (a) 219 (4), 2100452, 2022
112022
Molecular beam epitaxy growth of large‐area GaN/AlN 2D hole gas heterostructures
R Chaudhuri, SJ Bader, Z Chen, D Muller, HG Xing, D Jena
physica status solidi (b) 257 (4), 1900567, 2020
102020
X-band epi-BAW resonators
W Zhao, MJ Asadi, L Li, R Chaudhuri, K Nomoto, HG Xing, J Hwang, ...
Journal of Applied Physics 132 (2), 2022
82022
Very High Density (>1014 cm−2) Polarization‐Induced 2D Hole Gases Observed in Undoped Pseudomorphic InGaN/AlN Heterostructures
R Chaudhuri, Z Zhang, HG Xing, D Jena
Advanced Electronic Materials 8 (5), 2101120, 2022
82022
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