Arunkumar Vijayan
Arunkumar Vijayan
Postdoctoral Researcher, Karlsruhe Institute of Technology
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TitelGeciteerd doorJaar
Fine-grained aging-induced delay prediction based on the monitoring of run-time stress
A Vijayan, A Koneru, S Kiamehr, K Chakrabarty, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016
192016
Fine-grained aging prediction based on the monitoring of run-time stress using DfT infrastructure
A Koneru, A Vijayan, K Chakrabarty, MB Tahoori
2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 51-58, 2015
112015
Re-using BIST for circuit aging monitoring
F Firouzi, F Ye, A Vijayan, A Koneru, K Chakrabarty, MB Tahoori
2015 20th IEEE European Test Symposium (ETS), 1-2, 2015
92015
Online soft-error vulnerability estimation for memory arrays
A Vijayan, A Koneru, M Ebrahimit, K Chakrabarty, MB Tahoori
2016 IEEE 34th VLSI Test Symposium (VTS), 1-6, 2016
52016
Online soft-error vulnerability estimation for memory arrays and logic cores
A Vijayan, S Kiamehr, M Ebrahimi, K Chakrabarty, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
42017
Workload-aware static aging monitoring and mitigation of timing-critical flip-flops
A Vijayan, S Kiamehr, F Oboril, K Chakrabarty, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
32017
Workload-aware static aging monitoring of timing-critical flip-flops
A Vijayan, S Kiamehr, F Oboril, K Chakrabarty, MB Tahoori
2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), 176-181, 2017
22017
Self-awareness and self-learning for resiliency in real-time systems
MB Tahoori, A Chatterjee, K Chakrabarty, A Koneru, A Vijayan, ...
2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 128-131, 2015
12015
Machine Learning-Based Aging Analysis
A Vijayan, K Chakrabarty, MB Tahoori
Machine Learning in VLSI Computer-Aided Design, 265-289, 2019
2019
Runtime Monitoring for Dependable Hardware Design
A Vijayan
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Artikelen 1–10