David Brunco
David Brunco
Unknown affiliation
Verified email at alum.mit.edu - Homepage
Title
Cited by
Cited by
Year
Germanium MOSFET devices: Advances in materials understanding, process development, and electrical performance
DP Brunco, B De Jaeger, G Eneman, J Mitard, G Hellings, A Satta, ...
Journal of The Electrochemical Society 155 (7), H552, 2008
2942008
Bone support assembly
KS Paul, RS Rogstad, TR Larson, BW Stursa
US Patent 6,755,833, 2004
1702004
Complete experimental test of kinetic models for rapid alloy solidification
JA Kittl, PG Sanders, MJ Aziz, DP Brunco, MO Thompson
Acta materialia 48 (20), 4797-4811, 2000
1442000
High performance Ge pMOS devices using a Si-compatible process flow
P Zimmerman, G Nicholas, B De Jaeger, B Kaczer, A Stesmans, ...
2006 International Electron Devices Meeting, 1-4, 2006
1372006
Record ION/IOFF performance for 65nm Ge pMOSFET and novel Si passivation scheme for improved EOT scalability
J Mitard, B De Jaeger, FE Leys, G Hellings, K Martens, G Eneman, ...
2008 IEEE International Electron Devices Meeting, 1-4, 2008
1332008
High-performance deep submicron Ge pMOSFETs with halo implants
G Nicholas, B De Jaeger, DP Brunco, P Zimmerman, G Eneman, ...
IEEE Transactions on Electron Devices 54 (9), 2503-2511, 2007
1172007
Impact of Donor Concentration, Electric Field, and Temperature Effects on the Leakage Current in Germanium p n Junctions
G Eneman, M Wiot, A Brugere, OSI Casain, S Sonde, DP Brunco, ...
IEEE transactions on electron devices 55 (9), 2287-2296, 2008
972008
Temperature measurements of polyimide during KrF excimer laser ablation
DP Brunco, MO Thompson, CE Otis, PM Goodwin
Journal of applied Physics 72 (9), 4344-4350, 1992
961992
Scaling down the interpoly dielectric for next generation flash memory: Challenges and opportunities
B Govoreanu, DP Brunco, J Van Houdt
Solid-state electronics 49 (11), 1841-1848, 2005
892005
Germanium partitioning in silicon during rapid solidification
DP Brunco, MO Thompson, DE Hoglund, MJ Aziz, HJ Gossmann
Journal of applied physics 78 (3), 1575-1582, 1995
811995
Ch. Dieker, EK Evangelou, S. Galata, M. Houssa, and MM Heyns
A Dimoulas, DP Brunco, S Ferrari, JW Seo, Y Panayiotatos, ...
Thin Solid Films 515, 6337, 2007
802007
Degradation and breakdown of 0.9 nm EOT SiO/sub 2/ALD HfO/sub 2/metal gate stacks under positive constant voltage stress
R Degraeve, T Kauerauf, M Cho, M Zahid, LA Ragnarsson, DP Brunco, ...
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest …, 2005
762005
Nonequilibrium partitioning during rapid solidification of Si As alloys
JA Kittl, MJ Aziz, DP Brunco, MO Thompson
Journal of crystal growth 148 (1-2), 172-182, 1995
761995
Silicides and germanides for nano-CMOS applications
JA Kittl, K Opsomer, C Torregiani, C Demeurisse, S Mertens, DP Brunco, ...
Materials Science and Engineering: B 154, 144-154, 2008
622008
Electron energy band alignment at interfaces of (100) Ge with rare-earth oxide insulators
VV Afanas’ ev, S Shamuilia, A Stesmans, A Dimoulas, Y Panayiotatos, ...
Applied physics letters 88 (13), 132111, 2006
612006
Materials and electrical characterization of molecular beam deposited and bilayers on germanium
DP Brunco, A Dimoulas, N Boukos, M Houssa, T Conard, K Martens, ...
Journal of Applied Physics 102 (2), 024104, 2007
562007
Scaling to sub-1 nm equivalent oxide thickness with hafnium oxide deposited by atomic layer deposition
A Delabie, M Caymax, B Brijs, DP Brunco, T Conard, E Sleeckx, ...
Journal of the Electrochemical Society 153 (8), F180, 2006
562006
High performance 70-nm germanium pMOSFETs with boron LDD implants
G Hellings, J Mitard, G Eneman, B De Jaeger, DP Brunco, D Shamiryan, ...
IEEE Electron Device Letters 30 (1), 88-90, 2008
552008
Observation and suppression of nickel germanide overgrowth on germanium substrates with patterned SiO2 structures
DP Brunco, K Opsomer, B De Jaeger, G Winderickx, K Verheyden, ...
Electrochemical and Solid State Letters 11 (2), H39, 2007
542007
Germanium MOSFETs With Gate Stacks
G Nicholas, DP Brunco, A Dimoulas, J Van Steenbergen, F Bellenger, ...
IEEE transactions on electron devices 54 (6), 1425-1430, 2007
532007
The system can't perform the operation now. Try again later.
Articles 1–20