| A CMOS smart temperature sensor with a 3σ inaccuracy of ±0.1 C from −55 C to 125 C MAP Pertijs, KAA Makinwa, JH Huijsing IEEE J. Solid-State Circuits 40 (12), 2805-2815, 2005 | 443* | 2005 |
| Data processing device comprising a touch screen and a force sensor KAA Makinwa, TS Baller US Patent 5,510,813, 1996 | 358 | 1996 |
| A 1.8µW 60 nV/√Hz Capacitively-Coupled Chopper Instrumentation Amplifier in 65 nm CMOS for Wireless Sensor Nodes Q Fan, F Sebastiano, JH Huijsing, KAA Makinwa IEEE Journal of Solid-State Circuits 46 (7), 1534-1543, 2011 | 356 | 2011 |
| A CMOS Temperature Sensor With a Voltage-Calibrated Inaccuracy of ±0.15°C (3σ) From −55°C to 125°C K Souri, Y Chae, KAA Makinwa IEEE Journal of Solid-State Circuits 48 (1), 292-301, 2013 | 303* | 2013 |
| A Chopper Current-Feedback Instrumentation Amplifier With a 1 mHz 1/f Noise Corner and an AC-Coupled Ripple Reduction Loop R Wu, KAA Makinwa, JH Huijsing IEEE Journal of Solid-State Circuits 44 (12), 3232-3243, 2009 | 250 | 2009 |
| A 160µW 8-Channel Active Electrode System for EEG Monitoring J Xu, RF Yazicioglu, B Grundlehner, P Harpe, KAA Makinwa, C Van Hoof IEEE Transactions on Biomedical Circuits and Systems 5 (6), 555-567, 2011 | 244 | 2011 |
| HermesE: A 96-Channel Full Data Rate Direct Neural Interface in 0.13µm CMOS H Gao, RM Walker, P Nuyujukian, KAA Makinwa, KV Shenoy, B Murmann, ... IEEE Journal of Solid-State Circuits 47 (4), 1043-1055, 2012 | 215 | 2012 |
| Multiple-ramp column-parallel ADC architectures for CMOS image sensors MF Snoeij, AJP Theuwissen, KAA Makinwa, JH Huijsing IEEE Journal of Solid-State Circuits 42 (12), 2968-2977, 2007 | 196 | 2007 |
| Force activated touch screen measuring deformation of the front panel TS Baller, KAA Makinwa, R emy Polaert, AJM Hafkamp, GJKM Koolen, ... US Patent 5,541,372, 1996 | 185 | 1996 |
| A single-trim CMOS bandgap reference with a 3σ inaccuracy of ±0.15% from −40°C to 125°C G Ge, C Zhang, G Hoogzaad, K Makinwa Solid-State Circuits, IEEE Journal of, 2011 46 (11), 2011 | 182* | 2011 |
| A 1.2-V 10-µW NPN-Based Temperature Sensor in 65-nm CMOS With an Inaccuracy of 0.2°C (3σ) From −70°C to 125°C F Sebastiano, LJ Breems, KAA Makinwa, S Drago, DMW Leenaerts, ... IEEE Journal of Solid-State Circuits 45 (12), 2591-2601, 2010 | 173* | 2010 |
| A 6.3 µW 20 bit Incremental Zoom-ADC with 6 ppm INL and 1 µV Offset Y Chae, K Souri, KAA Makinwa IEEE Journal of Solid-State Circuits 48 (12), 3019-3027, 2013 | 165 | 2013 |
| A 0.12mm2 7.4μW Micropower Temperature Sensor With an Inaccuracy of ±0.2°C (3σ) From −30°C to 125°C K Souri, KAA Makinwa Solid-State Circuits, IEEE Journal of 46 (7), 1693-1700, 2011 | 133* | 2011 |
| A 4 GHz Continuous-Time ADC With 70 dB DR and −74 dBFS THD in 125 MHz BW M Bolatkale, LJ Breems, R Rutten, KAA Makinwa IEEE journal of solid-state circuits 46 (12), 2857-2868, 2011 | 127 | 2011 |
| A capacitance-to-digital converter for displacement sensing with 17b resolution and 20μs conversion time S Xia, K Makinwa, S Nihtianov 2012 IEEE International Solid-State Circuits Conference, 198-200, 2012 | 126 | 2012 |
| A 21 nV/√Hz Chopper-Stabilized Multi-Path Current-Feedback Instrumentation Amplifier With 2 μV Offset Q Fan, JH Huijsing, KAA Makinwa IEEE Journal of Solid-State Circuits 47 (2), 464-475, 2012 | 125* | 2012 |
| A CMOS chopper offset-stabilized opamp JF Witte, KAA Makinwa, JH Huijsing IEEE Journal of Solid-state circuits 42 (7), 1529-1535, 2007 | 124 | 2007 |
| Precision Instrumentation Amplifiers and Read-Out Integrated Circuits R Wu, J Huijsing, K Makinwa Springer Science & Business Media, 2013 | 120* | 2013 |
| A Current-Feedback Instrumentation Amplifier With 5μV Offset for Bidirectional High-Side Current-Sensing JF Witte, JH Huijsing, KAA Makinwa IEEE Journal of Solid-State Circuits 43 (12), 2769-2775, 2008 | 120 | 2008 |
| A 2.4 GHz 830pJ/bit duty-cycled wake-up receiver with− 82dBm sensitivity for crystal-less wireless sensor nodes S Drago, DMW Leenaerts, F Sebastiano, LJ Breems, KAA Makinwa, ... 2010 IEEE International Solid-State Circuits Conference-(ISSCC), 224-225, 2010 | 119 | 2010 |
johan hendrik huijsingProfessor Electrical Engineering, Delft University of TechnologyVerified email at tudelft.nl
