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Bappaditya Dey, PhD
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Year
Code generation using machine learning: A systematic review
E Dehaerne, B Dey, S Halder, S De Gendt, W Meert
Ieee Access 10, 82434-82455, 2022
292022
Neuro-NoC: Energy optimization in heterogeneous many-core NoC using neural networks in dark silicon era
MF Reza, TT Le, B De, M Bayoumi, D Zhao
2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018
272018
A novel reconfigurable hardware architecture of neural network
K Khalil, O Eldash, B Dey, A Kumar, M Bayoumi
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems …, 2019
232019
SEM image denoising with unsupervised machine learning for better defect inspection and metrology
B Dey, S Halder, K Khalil, G Lorusso, J Severi, P Leray, MA Bayoumi
Metrology, Inspection, and Process Control for Semiconductor Manufacturing …, 2021
222021
Deep learning-based defect classification and detection in SEM images
B Dey, D Goswami, S Halder, K Khalil, P Leray, MA Bayoumi
Metrology, Inspection, and Process Control XXXVI 12053, 2022
202022
Optimizing YOLOv7 for semiconductor defect detection
E Dehaerne, B Dey, S Halder, S De Gendt
Metrology, Inspection, and Process Control XXXVII 12496, 635-642, 2023
122023
A novel design gate based low-cost configurable ro puf using reversible logic
B Dey, K Khalil, A Kumar, M Bayoumi
2019 IEEE 62nd International Midwest Symposium on Circuits and Systems …, 2019
122019
A reversible-logic based architecture for long short-term memory (LSTM) network
K Khalil, B Dey, A Kumar, M Bayoumi
2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021
112021
A reversible-logic based architecture for artificial neural network
B Dey, K Khalil, A Kumar, M Bayoumi
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020
92020
Unsupervised machine learning based CD-SEM image segregator for OPC and process window estimation
B Dey, D Cerbu, K Khalil, S Halder, P Leray, S Das, Y Sherazi, ...
Design-Process-Technology Co-optimization for Manufacturability XIV 11328 …, 2020
92020
Towards improving challenging stochastic defect detection in SEM images based on improved YOLOv5
B Dey, E Dehaerne, S Halder
Photomask Technology 2022 12293, 28-37, 2022
82022
Architecture of a novel low-cost hardware neural network
K Khalil, O Eldash, B Dey, A Kumar, M Bayoumi
2020 IEEE 63rd International Midwest Symposium on Circuits and Systems …, 2020
72020
Unsupervised machine learning based SEM image denoising for robust contour detection
B Dey, S Wu, S Das, K Khalil, S Halder, P Leray, S Bhamidipati, K Ahi, ...
International Conference on Extreme Ultraviolet Lithography 2021 11854, 88-102, 2021
52021
A low power hardware implementation of multi-object DPM detector for autonomous driving
A Ali, OG Olaleye, B Dey, K Khalil, MA Bayoumi
2018 IEEE International Conference on Acoustics, Speech and Signal …, 2018
52018
YOLOv8 for defect inspection of hexagonal directed self-assembly patterns: a data-centric approach
E Dehaerne, B Dey, H Esfandiar, L Verstraete, HS Suh, S Halder, ...
38th European Mask and Lithography Conference (EMLC 2023) 12802, 286-299, 2023
42023
A comparative study of deep-learning object detectors for semiconductor defect detection
E Dehaerne, B Dey, S Halder
2022 29th IEEE International Conference on Electronics, Circuits and Systems …, 2022
42022
Joren Severi, Philippe Leray, Magdy A
B Dey, S Halder, K Khalil, G Lorusso
Bayoumi,“SEM image denoising with Unsupervised Machine Learning for better …, 2021
42021
A novel design reversible logic based configurable fault-tolerant embryonic hardware
K Khalil, B Dey, Y Sherazi, A Kumar, M Bayoumi
2020 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2020
42020
Spectrum-awareness-based performance and scalability of cognitive radio networks
OG Olaleye, A Ali, K Khalil, B Dey, D Perkins, M Bayoumi
2018 IEEE International Conference on Communications Workshops (ICC …, 2018
42018
SEMI-PointRend: improved semiconductor wafer defect classification and segmentation as rendering
MJ Hwang, B Dey, E Dehaerne, S Halder, Y Shin
Metrology, Inspection, and Process Control XXXVII 12496, 25-31, 2023
32023
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