Xrysovalantis Kavousianos
Xrysovalantis Kavousianos
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Optimal selective Huffman coding for test-data compression
X Kavousianos, E Kalligeros, D Nikolos
IEEE transactions on computers 56 (8), 1146-1152, 2007
1502007
Multilevel Huffman coding: An efficient test-data compression method for IP cores
X Kavousianos, E Kalligeros, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2007
582007
Multilevel-Huffman test-data compression for IP cores with multiple scan chains
X Kavousianos, E Kalligeros, D Nikolos
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 16 (7), 926-931, 2008
472008
Test data compression based on variable-to-variable Huffman encoding with codeword reusability
X Kavousianos, E Kalligeros, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2008
452008
Multiphase BIST: A new reseeding technique for high test-data compression
E Kalligeros, X Kavousianos, D Nikolos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
322004
Test schedule optimization for multicore SoCs: Handling dynamic voltage scaling and multiple voltage islands
X Kavousianos, K Chakrabarty, A Jain, R Parekhji
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
312012
Efficient partial scan cell gating for low-power scan-based testing
X Kavousianos, D Bakalis, D Nikolos
ACM Transactions on Design Automation of Electronic Systems (TODAES) 14 (2 …, 2009
272009
An efficient seeds selection method for LFSR-based test-per-clock BIST
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Proceedings International Symposium on Quality Electronic Design, 261-266, 2002
262002
Novel single and double output TSC Berger code checkers
X Kavousianos, D Nikolos
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 348-353, 1998
241998
Defect aware x-filling for low-power scan testing
S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
222010
Reseeding-based test set embedding with reduced test sequences
E Kalligeros, D Kaseridis, X Kavousianos, D Nikolos
Sixth international symposium on quality electronic design (isqed'05), 226-231, 2005
222005
On the design of self-testing checkers for modified Berger codes
SJ Piestrak, D Bakalis, X Kavousianos
Proceedings Seventh International On-Line Testing Workshop, 153-157, 2001
222001
State skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
2008 Design, Automation and Test in Europe, 474-479, 2008
212008
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
202010
On-the-fly reseeding: A new reseeding technique for test-per-clock BIST
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Journal of Electronic Testing 18 (3), 315-332, 2002
202002
Static power reduction using variation-tolerant and reconfigurable multi-mode power switches
Z Zhang, X Kavousianos, K Chakrabarty, Y Tsiatouhas
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 22 (1), 13-26, 2013
192013
Test scheduling for multicore SoCs with dynamic voltage scaling and multiple voltage islands
X Kavousianos, K Chakrabarty, A Jain, R Parekhji
2011 Asian Test Symposium, 33-39, 2011
192011
New reseeding technique for LFSR-based test pattern generation
E Kalligeros, X Kavousianos, D Bakalis, D Nikolos
Proceedings Seventh International On-Line Testing Workshop, 80-86, 2001
192001
A robust and reconfigurable multi-mode power gating architecture
Z Zhang, X Kavousianos, K Chakrabarty, Y Tsiatouhas
2011 24th Internatioal Conference on VLSI Design, 280-285, 2011
172011
Generation of compact test sets with high defect coverage
X Kavousianos, K Chakrabarty
2009 Design, Automation & Test in Europe Conference & Exhibition, 1130-1135, 2009
172009
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Artikelen 1–20