Dr. Mangesh S. Diware

Cited by

	All	Since 2019
Citations	372	295
h-index	10	9
i10-index	11	9

2013201420152016201720182019202020212022202320243 8 3 4 21 36 46 61 46 70 49 23

Co-authors

Young Dong KimKyung Hee UniversityVerified email at khu.ac.kr
Tae Jung KimKyung Hee UniversityVerified email at khu.ac.kr
Jihun MunKorea Research Institute of Standards and ScienceVerified email at kriss.re.kr
TaeWan Kim (김태완)Associate Professor, University of SeoulVerified email at jbnu.ac.kr
Junho ChoiKyung Hee UniversityVerified email at khu.ac.kr
ChaeHo shinKorea Research Institute of Standards and ScienceVerified email at kriss.re.kr
Dr. Shraddha Prakash GanorkarApplied Mechanics and Material Design lab, Sungkyunkwan University, Suwon, South KoreaVerified email at skku.edu
Hyungjun KimSchool of Electrical abd Electronic Engineering, Yonsei UniversityVerified email at yonsei.ac.kr
Se-Hwan paekKorea UniversityVerified email at korea.ac.kr
Nilesh BarangePostdoctoral Research ScholarVerified email at ncsu.edu
Jungyoon KimMechanical Engineering, University of MinnesotaVerified email at umn.edu
Kee Hoon KimDepartment of physics and astronomy, Seoul National UniversityVerified email at snu.ac.kr

Dr. Mangesh S. Diware

Application Scientist, Optics R&D center, Park Systems Corp.

Verified email at parksystems.com

Optical metrology Ellipsometry Imaging ellipsometry Material physics


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Wafer-scale production of highly uniform two-dimensional MoS2 by metal-organic chemical vapor deposition TW Kim, J Mun, H Park, DH Joung, M Diware, C Won, J Park, SH Jeong, ... Nanotechnology 28 (18), 18LT01, 2017	107	2017
Wafer‐Scale Epitaxial 1T′, 1T′–2H Mixed, and 2H Phases MoTe₂ Thin Films Grown by Metal–Organic Chemical Vapor Deposition TW Kim, H Park, DH Joung, DH Kim, R Lee, CH Shin, M Diware, ... Advanced Materials Interfaces 5 (15), 1800439, 2018	46	2018
Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry MS Diware, K Park, J Mun, HG Park, W Chegal, YJ Cho, HM Cho, J Park, ... Current Applied Physics 17 (10), 1329-1334, 2017	34	2017
Ultrasensitive, label-free detection of cardiac biomarkers with optical SIS sensor MS Diware, HM Cho, W Chegal, YJ Cho, DS Kim, KS Kim, SH Paek Biosensors and Bioelectronics 87, 242-248, 2017	33	2017
Temperature dependence of the dielectric functions and the critical points of InSb by spectroscopic ellipsometry from 31 to 675 K T Jung Kim, S Yong Hwang, J Seok Byun, MS Diware, J Choi, ... Journal of Applied Physics 114 (10), 103501-103501-5, 2013	21	2013
Dielectric function, critical points, and Rydberg exciton series of WSe2 monolayer MS Diware, SP Ganorkar, K Park, W Chegal, HM Cho, YJ Cho, YD Kim, ... Journal of Physics: Condensed Matter 30 (23), 235701, 2018	16	2018
Solution immersed silicon (SIS)-based biosensors: a new approach in biosensing MS Diware, HM Cho, W Chegal, YJ Cho, JH Jo, O SW, SH Paek, YH Yoon, ... Analyst 140 (3), 706-709, 2015	15	2015
Dielectric function of polycrystalline α-Ag2S by spectroscopic ellipsometry MS Diware, SP Ganorkar, J Kim, SN Bramhe, HM Cho, YJ Cho, W Chegal Applied Physics Letters 107 (17), 2015	14	2015
Label-free detection of hepatitis B virus using solution immersed silicon sensors MS Diware, HM Cho, W Chegal, YJ Cho, SH Paek, DS Kim, KS Kim, ... Biointerphases 12 (1), 2017	13	2017
Characteristics and Electronic Band Alignment of a Transparent p-CuI/n-SiZnSnO Heterojunction Diode with a High Rectification Ratio JH Lee, BH Lee, J Kang, M Diware, K Jeon, C Jeong, SY Lee, KH Kim Nanomaterials 11 (5), 1237, 2021	12	2021
Preferred‐oriented polycrystalline Y₃Fe₅O₁₂ films grown on quartz with low microwave loss B Bhoi, MS Diware Journal of the American Ceramic Society 104 (6), 2423-2427, 2021	10	2021
Correlation between Ru–O hybridization and the oxygen evolution reaction in ruthenate epitaxial thin films SA Lee, J Lee, S Oh, S Lee, JS Bae, W Chegal, MS Diware, S Park, ... Sustainable Energy & Fuels 3 (10), 2867-2872, 2019	9	2019
Parameterization of the dielectric function of InP from 1.19 to 6.57 eV for temperatures from 25 to 700 K T Jung Kim, S Yong Hwang, J Seok Byun, MS Diware, J Choi, ... Journal of Applied Physics 112 (1), 2012	8	2012
Optical study of sol-gel processed ZrO2/Si films by spectroscopic ellipsometry JJ Yoon, SM Lee, TJ Kim, SY Hwang, M Diware, YD Kim, SM Hwang, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2011	7	2011
Normal-incidence type solution immersed silicon (SIS) biosensor for ultra-sensitive, label-free detection of cardiac troponin I DH Kim, W Chegal, YJ Cho, L Van Le, MS Diware, SH Paek, YD Kim, ... Biosensors and Bioelectronics 168, 112525, 2020	5	2020
Parametric model dielectric functions of InAs for temperatures from 22 to 675 K TJ Kim, SY Hwang, JS Byun, MS Diware, JY Kim, YD Kim Journal of the Korean Physical Society 61, 1821-1825, 2012	5	2012
Nanotechnology 28, 18LT01 (2017) T Kim, J Mun, H Park, D Joung, M Diware, C Won, J Park, SH Jeong, ...	5
Analytic representation of the dielectric functions of InAsxSb1− x alloys in the parametric model SY Hwang, TJ Kim, JS Byun, NS Barange, MS Diware, YD Kim, ... Thin solid films 547, 276-279, 2013	4	2013
Optical properties and photo-oxidative degradation of regioregular poly (3-butylthiophene) films by spectroscopic ellipsometry MS Diware, TJ Kim, JS Byun, SY Hwang, NS Barange, YD Kim Thin solid films 542, 338-342, 2013	4	2013
Dielectric functions of In1− xAlxSb alloys for arbitrary compositions with parametric modeling MS Diware, TJ Kim, JJ Yoon, NS Barange, JS Byun, HG Park, YD Kim, ... Thin solid films 546, 26-30, 2013	2	2013

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