| A new compact temperature-compensated CMOS current reference F Fiori, PS Crovetti IEEE Transactions on Circuits and Systems II: Express Briefs 52 (11), 724-728, 2005 | 196 | 2005 |
| Nonlinear effects of radio-frequency interference in operational amplifiers F Fiori, PS Crovetti IEEE Transactions on Circuits and Systems I: Fundamental Theory and …, 2002 | 98 | 2002 |
| A new nonlinear model of EMI-induced distortion phenomena in feedback CMOS operational amplifiers F Fiori IEEE Transactions on Electromagnetic Compatibility 44 (4), 495-502, 2002 | 77 | 2002 |
| Design of an operational amplifier input stage immune to EMI F Fiori IEEE Transactions on Electromagnetic Compatibility 49 (4), 834-839, 2007 | 76 | 2007 |
| Worst-case induced disturbances in digital and analog interchip interconnects by an external electromagnetic plane wave—Part I: Modeling and algorithm JL Lagos, F Fiori IEEE Transactions on Electromagnetic Compatibility 53 (1), 178-184, 2010 | 44 | 2010 |
| Comparison of IC conducted emission measurement methods F Fiori, F Musolino IEEE transactions on Instrumentation and Measurement 52 (3), 839-845, 2003 | 44 | 2003 |
| Modified Gummel-Poon model for susceptibility prediction F Fiori, V Pozzolo IEEE Transactions on Electromagnetic Compatibility 42 (2), 206-213, 2000 | 44 | 2000 |
| Operational amplifier input stage robust to EMI F Fiori Electronics Letters 37 (15), 1, 2001 | 39 | 2001 |
| A critical assessment of the closed-loop bulk current injection immunity test performed in compliance with ISO 11452-4 PS Crovetti, F Fiori IEEE Transactions on Instrumentation and Measurement 60 (4), 1291-1297, 2011 | 37 | 2011 |
| A linear voltage regulator model for EMC analysis PS Crovetti, FL Fiori IEEE Transactions on Power Electronics 22 (6), 2282-2292, 2007 | 33 | 2007 |
| Susceptibility to EMI of a Battery Management System IC for electric vehicles O Aiello, PS Crovetti, F Fiori 2015 IEEE International Symposium on Electromagnetic Compatibility (EMC …, 2015 | 32 | 2015 |
| Complementary differential pair with high immunity to RFI F Fiori, PS Crovetti Electronics Letters 38 (25), 1, 2002 | 32 | 2002 |
| Prediction of EMI effects in operational amplifiers by a two-input Volterra series model F Fiori, PS Crovetti IEE Proceedings-Circuits, Devices and Systems 150 (3), 185-193, 2003 | 31 | 2003 |
| Investigation on VLSIs' input ports susceptibility to conducted RF interference F Fiori, S Benelli, G Gaidano, V Pozzolo IEEE 1997, EMC, Austin Style. IEEE 1997 International Symposium on …, 1997 | 31 | 1997 |
| Prediction of high-power EMI effects in CMOS operational amplifiers FL Fiori, PS Crovetti IEEE Transactions on Electromagnetic Compatibility 48 (1), 153-160, 2006 | 29 | 2006 |
| Investigation on RFI effects in bandgap voltage references F Fiori, PS Crovetti Microelectronics journal 35 (6), 557-561, 2004 | 29 | 2004 |
| Modeling the IEC 61000-4-4 EFT injection clamp F Musolino, F Fiori IEEE Transactions on electromagnetic compatibility 50 (4), 869-875, 2008 | 28 | 2008 |
| Distributed conversion of common-mode into differential-mode interference PS Crovetti, F Fiori IEEE transactions on microwave theory and techniques 59 (8), 2140-2150, 2011 | 26 | 2011 |
| Efficient BEM-based substrate network extraction in silicon SoCs PS Crovetti, FL Fiori Microelectronics journal 39 (12), 1774-1784, 2008 | 23 | 2008 |
| Compact temperature-compensated CMOS current reference F Fiori, PS Crovetti Electronics Letters 39 (1), 1, 2003 | 23 | 2003 |
Paolo S. CrovettiAssociate Professor, Politecnico di TorinoVerified email at polito.it
