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Rijul Dhanker
Rijul Dhanker
Quality and Reliability engineer, Intel Corporation
Verified email at intel.com
Title
Cited by
Cited by
Year
Random lasing in organo-lead halide perovskite microcrystal networks
R Dhanker, AN Brigeman, AV Larsen, RJ Stewart, JB Asbury, NC Giebink
Applied Physics Letters 105 (15), 2014
1562014
Mesoscopic structural length scales in P3HT/PCBM mixtures remain invariant for various processing conditions
S Vajjala Kesava, R Dhanker, DR Kozub, K Vakhshouri, UH Choi, ...
Chemistry of Materials 25 (14), 2812-2818, 2013
262013
Large bipolaron density at organic semiconductor/electrode interfaces
R Dhanker, CL Gray, S Mukhopadhyay, S Nunez, CY Cheng, AN Sokolov, ...
Nature communications 8 (1), 2252, 2017
252017
Reducing exciton-polaron annihilation in organic planar heterojunction solar cells
B Verreet, A Bhoolokam, A Brigeman, R Dhanker, D Cheyns, P Heremans, ...
Physical Review B 90 (11), 115304, 2014
212014
Charged polaron polaritons in an organic semiconductor microcavity
CY Cheng, R Dhanker, CL Gray, S Mukhopadhyay, ER Kennehan, ...
Physical review letters 120 (1), 017402, 2018
192018
Plasmonic internal photoemission for accurate device in situ measurement of metal‐organic semiconductor injection barriers
R Dhanker, N Chopra, NC Giebink
Advanced Functional Materials 24 (30), 4775-4781, 2014
42014
Injection and Bipolaronic Charge Species at Metal-organic Semiconductor Contact Interfaces
R Dhanker
The Pennsylvania State University, 2018
2018
Plasmonic Photoinjection Spectroscopy: Unraveling Charge Carrier Injection Directly in Organic Electronic Devices
N Giebink, R Dhanker
ECS Meeting Abstracts, 844, 2013
2013
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Articles 1–8