Vasileios Tenentes
Vasileios Tenentes
Assistant Professor of Computer Science and Engineering, University of Ioannina
Verified email at arm.com
Title
Cited by
Cited by
Year
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece
A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ...
Natural Hazards and Earth System Science 14 (1), 143-153, 2014
512014
Aging Benefits in Nanometer CMOS Designs
D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi
IEEE Transactions on Circuits and Systems II: Express Briefs 64 (3), 324-328, 2017
352017
State skip LFSRs: Bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
2008 Design, Automation and Test in Europe, 474-479, 2008
272008
Reliable power gating with NBTI aging benefits
D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-10, 2016
262016
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
242010
Defect aware x-filling for low-power scan testing
S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
232010
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating
D Rossi, V Tenentes, S Khursheed, B Al-Hashimi
20th IEEE European Test Symposium (ETS 2015), 2015
192015
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets
X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (12 …, 2011
172011
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories
D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi
IEEE international on-Line testing symposium (IOLTS'15), 2015
162015
High-quality statistical test compression with narrow ATE interface
V Tenentes, X Kavousianos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
162013
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure
V Tenentes, D Rossi, S Yang, S Khursheed, BM Al-Hashimi, SR Gunn
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017
152017
BTI aware thermal management for reliable DVFS designs
H Chahal, V Tenentes, D Rossi, BM Al-Hashimi
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016
112016
High quality testing of grid style power gating
V Tenentes, S Khursheed, BM Al-Hashimi, S Zhong, S Yang
2014 IEEE 23rd Asian Test Symposium, 186-191, 2014
102014
Low power test-compression for high test-quality and low test-data volume
V Tenentes, X Kavousianos
20th IEEE Asian Test Symposium (ATS), 2011, 46-53, 2011
102011
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs
V Tenentes, X Kavousianos
IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2011 …, 2011
102011
Exploiting aging benefits for the design of reliable drowsy cache memories
D Rossi, V Tenentes, SM Reddy, BM Al-Hashimi, A Brown
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018
92018
Recycled IC detection through aging sensor
D Rossi, V Tenentes, S Khursheed, SM Reddy
2018 IEEE 23rd European Test Symposium (ETS), 1-2, 2018
72018
DFT Architecture with Power-Distribution-Network Consideration for Delay-based Power Gating Test
V Tenentes, S Khursheed, D Rossi, S Yang, B Al-Hashimi
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2015
72015
Susceptible workload driven selective fault tolerance using a probabilistic fault model
MD Gutierrez, V Tenentes, TJ Kazmierski
On-Line Testing and Robust System Design (IOLTS), 2016 IEEE 22nd …, 2016
62016
MeV ion event observed at 0950 UT on 4 May 1998 at a quasi‐perpendicular bow shock region: New observations and an alternative interpretation on its origin
GC Anagnostopoulos, V Tenentes, ES Vassiliadis
Journal of Geophysical Research: Space Physics 114 (A9), 2009
62009
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