Vasileios Tenentes
Vasileios Tenentes
Assistant Professor of Computer Science and Engineering, University of Ioannina
Verified email at arm.com
Title
Cited by
Cited by
Year
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece
A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ...
Natural Hazards and Earth System Science 14 (1), 143-153, 2014
412014
Aging Benefits in Nanometer CMOS Designs
D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi
IEEE Transactions on Circuits and Systems II: Express Briefs 64 (3), 324-328, 2017
292017
Reliable power gating with NBTI aging benefits
D Rossi, V Tenentes, S Yang, S Khursheed, B Al-Hashimi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1-10, 2016
222016
Single and variable-state-skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010
222010
State skip LFSRs: bridging the gap between test data compression and test set embedding for IP cores
V Tenentes, X Kavousianos, E Kalligeros
2008 Design, Automation and Test in Europe, 474-479, 2008
222008
Defect aware x-filling for low-power scan testing
S Balatsouka, V Tenentes, X Kavousianos, K Chakrabarty
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
212010
NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating
D Rossi, V Tenentes, S Khursheed, B Al-Hashimi
20th IEEE European Test Symposium (ETS 2015), 2015
172015
BTI and leakage aware dynamic voltage scaling for reliable low power cache memories
D Rossi, V Tenentes, S Khursheed, BM Al-Hashimi
IEEE international on-Line testing symposium (IOLTS'15), 2015
152015
High-quality statistical test compression with narrow ATE interface
V Tenentes, X Kavousianos
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
142013
Defect-Oriented LFSR Reseeding to Target Unmodeled Defects Using Stuck-at Test Sets
X Kavousianos, V Tenentes, K Chakrabarty, E Kalligeros
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (12 …, 2011
142011
Coarse-Grained Online Monitoring of BTI Aging by Reusing Power-Gating Infrastructure
V Tenentes, D Rossi, S Yang, S Khursheed, BM Al-Hashimi, SR Gunn
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017
112017
High quality testing of grid style power gating
V Tenentes, S Khursheed, BM Al-Hashimi, S Zhong, S Yang
2014 IEEE 23rd Asian Test Symposium, 186-191, 2014
102014
BTI aware thermal management for reliable DVFS designs
H Chahal, V Tenentes, D Rossi, BM Al-Hashimi
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2016
92016
Low power test-compression for high test-quality and low test-data volume
V Tenentes, X Kavousianos
20th IEEE Asian Test Symposium (ATS), 2011, 46-53, 2011
92011
Test-data volume and scan-power reduction with low ATE interface for multi-core SoCs
V Tenentes, X Kavousianos
IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 2011 …, 2011
92011
DFT Architecture with Power-Distribution-Network Consideration for Delay-based Power Gating Test
V Tenentes, S Khursheed, D Rossi, S Yang, B Al-Hashimi
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2015
72015
Susceptible workload driven selective fault tolerance using a probabilistic fault model
MD Gutierrez, V Tenentes, TJ Kazmierski
On-Line Testing and Robust System Design (IOLTS), 2016 IEEE 22nd …, 2016
62016
Exploiting aging benefits for the design of reliable drowsy cache memories
D Rossi, V Tenentes, SM Reddy, BM Al-Hashimi, A Brown
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018
52018
Sensitivity and evaluation of current fire risk and future projections due to climate change: the case study of Greece
A Karali, M Hatzaki, C Giannakopoulos, A Roussos, G Xanthopoulos, ...
NHESD 1 (5), 4777-4800, 2013
52013
Defect coverage-driven window-based test compression
X Kavousianos, K Chakrabarty, E Kalligeros, V Tenentes
2010 19th IEEE Asian test symposium, 141-146, 2010
52010
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