| March SS: A test for all static simple RAM faults S Hamdioui, AJ van de Goor, M Rodgers Proceedings of the 2002 IEEE International Workshop on Memory Technology …, 2002 | 175 | 2002 |
| Why is CMOS scaling coming to an END? NZ Haron, S Hamdioui 2008 3rd International Design and Test Workshop, 98-103, 2008 | 150 | 2008 |
| Testing static and dynamic faults in random access memories S Hamdioui, Z Al-Ars, AJ Van de Goor Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 395-400, 2002 | 141 | 2002 |
| An experimental analysis of spot defects in SRAMs: realistic fault models and tests S Hamdioui, AJ Van De Goor Proceedings of the Ninth Asian Test Symposium, 131-138, 2000 | 134 | 2000 |
| Memristor based computation-in-memory architecture for data-intensive applications S Hamdioui, L Xie, HA Du Nguyen, M Taouil, K Bertels, H Corporaal, ... 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015 | 111 | 2015 |
| The state-of-art and future trends in testing embedded memories S Hamdioui, G Gaydadjiev, AJ Van de Goor Records of the 2004 International Workshop on Memory Technology, Design and …, 2004 | 111 | 2004 |
| Testing static random access memories: defects, fault models and test patterns S Hamdioui Springer Science & Business Media, 2004 | 74 | 2004 |
| Linked faults in random access memories: concept, fault models, test algorithms, and industrial results S Hamdioui, Z Al-Ars, AJ Van De Goor, M Rodgers IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004 | 71 | 2004 |
| Importance of dynamic faults for new SRAM technologies S Hamdioui, R Wadsworth, JD Reyes, AJ van de Goor The Eighth IEEE European Test Workshop, 2003. Proceedings., 29-34, 2003 | 71 | 2003 |
| Reliability challenges of real-time systems in forthcoming technology nodes S Hamdioui, D Gizopoulos, G Guido, M Nicolaidis, A Grasset, P Bonnot 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 129-134, 2013 | 68 | 2013 |
| Test cost analysis for 3D die-to-wafer stacking M Taouil, S Hamdioui, K Beenakker, EJ Marinissen 2010 19th IEEE Asian Test Symposium, 435-441, 2010 | 67 | 2010 |
| Modeling SRAM start-up behavior for physical unclonable functions M Cortez, A Dargar, S Hamdioui, GJ Schrijen 2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012 | 66 | 2012 |
| On defect oriented testing for hybrid CMOS/memristor memory NZ Haron, S Hamdioui 2011 Asian Test Symposium, 353-358, 2011 | 63 | 2011 |
| Testing open defects in memristor-based memories S Hamdioui, M Taouil, NZ Haron IEEE Transactions on Computers 64 (1), 247-259, 2013 | 62 | 2013 |
| Fast boolean logic mapped on memristor crossbar L Xie, HA Du Nguyen, M Taouil, S Hamdioui, K Bertels 2015 33rd IEEE International Conference on Computer Design (ICCD), 335-342, 2015 | 59 | 2015 |
| Converting march tests for bit-oriented memories into tests for word-oriented memories AJ Van de Goor, IBS Tlili, S Hamdioui Proceedings. International Workshop on Memory Technology, Design and Testing …, 1998 | 59 | 1998 |
| Dynamic faults in random-access-memories: Concept, fault models and tests S Hamdioui, Z Al-Ars, AJ Van De Goor, M Rodgers Journal of Electronic Testing 19 (2), 195-205, 2003 | 57 | 2003 |
| Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates H Kükner, S Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, ... IEEE transactions on device and materials reliability 14 (1), 182-193, 2013 | 56 | 2013 |
| Fault Models and Tests for Two-Port Memories AJ Van de Goor, S Hamdioui Proceedings of the 16th IEEE VLSI Test Symposium, 401, 1998 | 54 | 1998 |
| On maximizing the compound yield for 3D wafer-to-wafer stacked ICs M Taouil, S Hamdioui, J Verbree, EJ Marinissen 2010 IEEE International Test Conference, 1-10, 2010 | 52 | 2010 |
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