Said Hamdioui
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March SS: A test for all static simple RAM faults
S Hamdioui, AJ van de Goor, M Rodgers
Proceedings of the 2002 IEEE International Workshop on Memory Technology …, 2002
1772002
Why is CMOS scaling coming to an END?
NZ Haron, S Hamdioui
2008 3rd International Design and Test Workshop, 98-103, 2008
1582008
Testing static and dynamic faults in random access memories
S Hamdioui, Z Al-Ars, AJ Van de Goor
Proceedings 20th IEEE VLSI Test Symposium (VTS 2002), 395-400, 2002
1472002
An experimental analysis of spot defects in SRAMs: realistic fault models and tests
S Hamdioui, AJ Van De Goor
Proceedings of the Ninth Asian Test Symposium, 131-138, 2000
1342000
Memristor based computation-in-memory architecture for data-intensive applications
S Hamdioui, L Xie, HA Du Nguyen, M Taouil, K Bertels, H Corporaal, ...
2015 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2015
1152015
The state-of-art and future trends in testing embedded memories
S Hamdioui, G Gaydadjiev, AJ Van de Goor
Records of the 2004 International Workshop on Memory Technology, Design and …, 2004
1122004
Testing static random access memories: defects, fault models and test patterns
S Hamdioui
Springer Science & Business Media, 2004
752004
Reliability challenges of real-time systems in forthcoming technology nodes
S Hamdioui, D Gizopoulos, G Guido, M Nicolaidis, A Grasset, P Bonnot
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 129-134, 2013
742013
Importance of dynamic faults for new SRAM technologies
S Hamdioui, R Wadsworth, JD Reyes, AJ van de Goor
The Eighth IEEE European Test Workshop, 2003. Proceedings., 29-34, 2003
732003
Linked faults in random access memories: concept, fault models, test algorithms, and industrial results
S Hamdioui, Z Al-Ars, AJ Van De Goor, M Rodgers
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2004
702004
Testing open defects in memristor-based memories
S Hamdioui, M Taouil, NZ Haron
IEEE Transactions on Computers 64 (1), 247-259, 2013
682013
Modeling SRAM start-up behavior for physical unclonable functions
M Cortez, A Dargar, S Hamdioui, GJ Schrijen
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012
682012
Test cost analysis for 3D die-to-wafer stacking
M Taouil, S Hamdioui, K Beenakker, EJ Marinissen
2010 19th IEEE Asian Test Symposium, 435-441, 2010
672010
On defect oriented testing for hybrid CMOS/memristor memory
NZ Haron, S Hamdioui
2011 Asian Test Symposium, 353-358, 2011
632011
Fast boolean logic mapped on memristor crossbar
L Xie, HA Du Nguyen, M Taouil, S Hamdioui, K Bertels
2015 33rd IEEE International Conference on Computer Design (ICCD), 335-342, 2015
622015
Converting march tests for bit-oriented memories into tests for word-oriented memories
AJ Van de Goor, IBS Tlili, S Hamdioui
Proceedings. International Workshop on Memory Technology, Design and Testing …, 1998
571998
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
H Kükner, S Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, ...
IEEE transactions on device and materials reliability 14 (1), 182-193, 2013
562013
Dynamic faults in random-access-memories: Concept, fault models and tests
S Hamdioui, Z Al-Ars, AJ Van De Goor, M Rodgers
Journal of Electronic Testing 19 (2), 195-205, 2003
562003
Bias temperature instability analysis of FinFET based SRAM cells
S Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
552014
On maximizing the compound yield for 3D wafer-to-wafer stacked ICs
M Taouil, S Hamdioui, J Verbree, EJ Marinissen
2010 IEEE International Test Conference, 1-10, 2010
532010
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Artikelen 1–20