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Fan (Fred) Lin
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Test data analytics—Exploring spatial and test-item correlations in production test data
CK Hsu, F Lin, KT Cheng, W Zhang, X Li, JM Carulli, KM Butler
2013 IEEE International Test Conference (ITC), 1-10, 2013
422013
Fast Dimensional Analysis for Root Cause Investigation in Large-Scale Service Environment
F Lin, K Muzumdar, NP Laptev, MV Curelea, S Lee, S Sankar
ACM SIGMETRICS, 2020
372020
Hardware Remediation At Scale
FF Lin, M Beadon, HD Dixit, G Vunnam, A Desai, S Sankar
IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2018
162018
An artificial neural network approach for screening test escapes
F Lin, KT Cheng
2017 22nd Asia and South Pacific Design Automation Conference (ASP-DAC), 414-419, 2017
162017
Feature engineering with canonical analysis for effective statistical tests screening test escapes
F Lin, CK Hsu, KT Cheng
2014 International Test Conference, 1-10, 2014
152014
Learning from production test data: Correlation exploration and feature engineering
F Lin, CK Hsu, KT Cheng
2014 IEEE 23rd Asian Test Symposium, 236-241, 2014
142014
Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction
S Zhang, F Lin, CK Hsu, KT Cheng, H Wang
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
142014
Predicting Remediations for Hardware Failures in Large-Scale Datacenters
F Lin, A Davoli, I Akbar, S Kalmanje, L Silva, J Stamford, Y Golany, ...
IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2020
132020
Adatest: An efficient statistical test framework for test escape screening
F Lin, CK Hsu, KT Cheng
2015 IEEE International Test Conference (ITC), 1-8, 2015
132015
Near-Realtime Server Reboot Monitoring and Root Cause Analysis in a Large-Scale System
F Lin, B Bolla, E Pinkham, N Kodner, D Moore, A Desai, S Sankar
6*
Pairwise proximity-based features for test escape screening
F Lin, CK Hsu, AG Busetto, KT Cheng
2015 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 300-306, 2015
52015
Optimizing Interrupt Handling Performance for Memory Failures in Large Scale Data Centers
HD Dixit, F Lin, B Holland, M Beadon, Z Yang, S Sankar
ACM/SPEC International Conference on Performance Engineering, 2020
22020
Evaluating Robustness of Deep Learning-based Recommendation Systems against Hardware Errors: A Case Study
SS Xun Jiao, Fred Lin, Matt Xiao, Alban Desmaison, Daniel Moore
IEEE Real-Time Systems Symposium, 2023
2023
Hard Disk Drive Failure Analysis and Prediction: An Industry View
FL Zach Miller, Olusiji Medaiyese, Madhavan Ravi, Alex Beatty
IEEE/IFIP International Conference on Dependable Systems and Networks (DSN), 2023
2023
Industry Track Programme Committee DSN 2021
N Kanekawa, HV Ramasamy, R Bertrand, L Di Martino, M Hiltunen, ...
Industry Track Programme Committee DSN 2020
F Brancati, C Constantinescu, J Currey, L Di Martino, J Lala, B Hall, ...
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