jiaxing dong
jiaxing dong
Verified email at cumec.cn
Cited by
Cited by
Accurate extraction of fabricated geometry using optical measurement
Y Xing, J Dong, S Dwivedi, U Khan, W Bogaerts
Photonics Research 6 (11), 1008-1020, 2018
Hierarchical model for spatial variations of integrated photonics
Y Xing, J Dong, U Khan, W Bogaerts
2018 IEEE 15th International Conference on Group IV Photonics (GFP), 1-2, 2018
From parameter extraction, variability models to yield prediction
Y Xing, J Dong, U Khan, Y Ye, D Spina, T Dhaene, W Bogaerts
Latin America Optics and Photonics Conference, W3E. 1, 2018
Correlation between pattern density and linewidth variation in silicon photonics waveguides
Y Xing, J Dong, U Khan, W Bogaerts
Optics Express 28 (6), 7961-7968, 2020
Predicting Yield of Photonic Circuits With Wafer-scale Fabrication Variability
W Bogaerts, Y Xing, Y Ye, U Khan, J Dong, J Geessels, M Fiers, D Spina, ...
2019 IEEE MTT-S International Conference on Numerical Electromagnetic and …, 2019
Location-aware variability analysis for silicon photonic circuits
J Dong
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