| Accurate extraction of fabricated geometry using optical measurement Y Xing, J Dong, S Dwivedi, U Khan, W Bogaerts Photonics Research 6 (11), 1008-1020, 2018 | 56 | 2018 |
| Capturing the effects of spatial process variations in silicon photonic circuits Y Xing, J Dong, U Khan, W Bogaerts ACS Photonics 10 (4), 928-944, 2022 | 23 | 2022 |
| Hierarchical model for spatial variations of integrated photonics Y Xing, J Dong, U Khan, W Bogaerts 2018 IEEE 15th International Conference on Group IV Photonics (GFP), 1-2, 2018 | 15 | 2018 |
| Correlation between pattern density and linewidth variation in silicon photonics waveguides Y Xing, J Dong, U Khan, W Bogaerts Optics express 28 (6), 7961-7968, 2020 | 12 | 2020 |
| From parameter extraction, variability models to yield prediction Y Xing, J Dong, U Khan, Y Ye, D Spina, T Dhaene, W Bogaerts Latin America Optics and Photonics Conference, W3E. 1, 2018 | 2 | 2018 |
| Predicting yield of photonic circuits with wafer-scale fabrication variability W Bogaerts, Y Xing, Y Ye, U Khan, J Dong, J Geessels, M Fiers, D Spina, ... 2019 IEEE MTT-S International Conference on Numerical Electromagnetic and …, 2019 | | 2019 |
| Location-aware variability analysis for silicon photonic circuits J Dong | | 2018 |
