Mehdi B. Tahoori
Mehdi B. Tahoori
Professor of Computer Science, Karlsruhe Institute of Technology, Germany
Geverifieerd e-mailadres voor kit.edu - Homepage
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Reliable on-chip systems in the nano-era: Lessons learnt and future trends
J Henkel, L Bauer, N Dutt, P Gupta, S Nassif, M Shafique, M Tahoori, ...
2013 50th ACM/EDAC/IEEE Design Automation Conference (DAC), 1-10, 2013
1922013
Testing of quantum cellular automata
MB Tahoori, J Huang, M Momenzadeh, F Lombardi
IEEE Transactions on Nanotechnology 3 (4), 432-442, 2004
1822004
Characterization, test, and logic synthesis of and-or-inverter (AOI) gate design for QCA implementation
M Momenzadeh, J Huang, MB Tahoori, F Lombardi
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2005
1432005
Defects and faults in quantum cellular automata at nano scale
MB Tahoori, M Momenzadeh, J Huang, F Lombardi
22nd IEEE VLSI Test Symposium, 2004. Proceedings., 291-296, 2004
1312004
Balancing performance and reliability in the memory hierarchy
GH Asadi, VS Mehdi, B Tahoori, D Kaeli
IEEE International Symposium on Performance Analysis of Systems and Software …, 2005
1092005
Soft error rate estimation and mitigation for SRAM-based FPGAs
G Asadi, MB Tahoori
Proceedings of the 2005 ACM/SIGDA 13th international symposium on Field …, 2005
992005
An analytical approach for soft error rate estimation in digital circuits
G Asadi, MB Tahoori
2005 IEEE International Symposium on Circuits and Systems, 2991-2994, 2005
922005
Evaluation of hybrid memory technologies using SOT-MRAM for on-chip cache hierarchy
F Oboril, R Bishnoi, M Ebrahimi, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
912015
ExtraTime: Modeling and analysis of wearout due to transistor aging at microarchitecture-level
F Oboril, MB Tahoori
IEEE/IFIP International Conference on Dependable Systems and Networks (DSN …, 2012
892012
An accurate SER estimation method based on propagation probability [soft error rate]
G Asadi, MB Tahoori
Design, Automation and Test in Europe, 306-307, 2005
892005
Design and architectures for dependable embedded systems
J Henkel, L Bauer, J Becker, O Bringmann, U Brinkschulte, S Chakraborty, ...
Proceedings of the seventh IEEE/ACM/IFIP international conference on …, 2011
882011
On the defect tolerance of nano-scale two-dimensional crossbars
J Huang, MB Tahoori, F Lombardi
19th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2004
832004
Soft error susceptibility analysis of SRAM-based FPGAs in high-performance information systems
H Asadi, MB Tahoori, B Mullins, D Kaeli, K Granlund
IEEE Transactions on Nuclear Science 54 (6), 2714-2726, 2007
762007
Ultra-fast and high-reliability SOT-MRAM: From cache replacement to normally-off computing
G Prenat, K Jabeur, P Vanhauwaert, G Di Pendina, F Oboril, R Bishnoi, ...
IEEE Transactions on Multi-Scale Computing Systems 2 (1), 49-60, 2015
752015
Soft error mitigation for SRAM-based FPGAs
GH Asadi, MB Tahoori
23rd IEEE VLSI Test Symposium (VTS'05), 207-212, 2005
752005
Application-dependent testing of FPGAs
M Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 14 (9 …, 2006
692006
Soft error rate estimation of digital circuits in the presence of multiple event transients (METs)
M Fazeli, SN Ahmadian, SG Miremadi, H Asadi, MB Tahoori
2011 Design, Automation & Test in Europe, 1-6, 2011
662011
Reducing data cache susceptibility to soft errors
V Sridharan, H Asadi, MB Tahoori, D Kaeli
IEEE Transactions on Dependable and Secure Computing 3 (4), 353-364, 2006
642006
A mapping algorithm for defect-tolerance of reconfigurable nano-architectures
MB Tahoori
ICCAD-2005. IEEE/ACM International Conference on Computer-Aided Design, 2005 …, 2005
622005
Vulnerability analysis of L2 cache elements to single event upsets
H Asadi, V Sridharan, MB Tahoori, D Kaeli
Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006
592006
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Artikelen 1–20