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Hossein Bardareh
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MOMENT: A cross-layer method to mitigate multiple event transients in combinational circuits
AM Hajisadeghi, H Bardareh, HR Zarandi
2018 21st Euromicro Conference on Digital System Design (DSD), 237-243, 2018
92018
A low-cost soft error tolerant read circuit for single/multi-level cross-point RRAM arrays
H Bardareh, AM Hajisadeghi, HR Zarandi
2018 IEEE 24th International Symposium on On-Line Testing And Robust System …, 2018
82018
Designing a differential 3R-2bit RRAM cell for enhancing read margin in cross-point RRAM arrays
M Nakhkash, H Bardareh, F Zokaee, HR Zarandi
2017 IEEE Nordic Circuits and Systems Conference (NORCAS): NORCHIP and …, 2017
72017
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