Annick De Backer
Annick De Backer
EMAT, Department of Physics, University of Antwerp
Verified email at uantwerpen.be - Homepage
Title
Cited by
Cited by
Year
In situ study of the formation mechanism of two-dimensional superlattices from PbSe nanocrystals
JJ Geuchies, C Van Overbeek, WH Evers, B Goris, A De Backer, ...
Nature materials 15 (12), 1248-1254, 2016
1362016
Procedure to count atoms with trustworthy single-atom sensitivity
S Van Aert, A De Backer, GT Martinez, B Goris, S Bals, G Van Tendeloo, ...
Physical Review B 87 (6), 064107, 2013
1032013
Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals
B Goris, A De Backer, S Van Aert, S Gómez-Graña, LM Liz-Marzán, ...
Nano letters 13 (9), 4236-4241, 2013
852013
Measuring lattice strain in three dimensions through electron microscopy
B Goris, J De Beenhouwer, A De Backer, D Zanaga, KJ Batenburg, ...
Nano letters 15 (10), 6996-7001, 2015
762015
StatSTEM: an efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images
A De Backer, KHW Van den Bos, W Van den Broek, J Sijbers, S Van Aert
Ultramicroscopy 171, 104-116, 2016
662016
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy
GT Martinez, A Rosenauer, A De Backer, J Verbeeck, S Van Aert
Ultramicroscopy 137, 12-19, 2014
652014
Atom counting in HAADF STEM using a statistical model-based approach: methodology, possibilities, and inherent limitations
A De Backer, GT Martinez, A Rosenauer, S Van Aert
Ultramicroscopy 134, 23-33, 2013
632013
Estimation of unknown structure parameters from high-resolution (S) TEM images: What are the limits?
AJ Den Dekker, J Gonnissen, A De Backer, J Sijbers, S Van Aert
Ultramicroscopy 134, 34-43, 2013
402013
Unscrambling mixed elements using high angle annular dark field scanning transmission electron microscopy
KHW van den Bos, A De Backer, GT Martinez, N Winckelmans, S Bals, ...
Physical review letters 116 (24), 246101, 2016
352016
Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting
A De Backer, GT Martinez, KE MacArthur, L Jones, A Béché, PD Nellist, ...
Ultramicroscopy 151, 56-61, 2015
352015
Optimal experimental design for nano-particle atom-counting from high-resolution STEM images
A De Backer, A De wael, J Gonnissen, S Van Aert
Ultramicroscopy, 2014
322014
Quantitative STEM normalisation: the importance of the electron flux
GT Martinez, L Jones, A De Backer, A Béché, J Verbeeck, S Van Aert, ...
Ultramicroscopy 159, 46-58, 2015
252015
Three-dimensional quantification of the facet evolution of Pt nanoparticles in a variable gaseous environment
T Altantzis, I Lobato, A De Backer, A Béché, Y Zhang, S Basak, M Porcu, ...
Nano letters 19 (1), 477-481, 2018
212018
Three-dimensional atomic models from a single projection using Z-contrast imaging: verification by electron tomography and opportunities
A De Backer, L Jones, I Lobato, T Altantzis, B Goris, PD Nellist, S Bals, ...
Nanoscale 9 (25), 8791-8798, 2017
202017
The effect of probe inaccuracies on the quantitative model-based analysis of high angle annular dark field scanning transmission electron microscopy images
GT Martinez, A De Backer, A Rosenauer, J Verbeeck, S Van Aert
Micron 63, 57-63, 2014
192014
Optimal experimental design for the detection of light atoms from high-resolution scanning transmission electron microscopy images
J Gonnissen, A De Backer, AJ Den Dekker, GT Martinez, A Rosenauer, ...
Applied Physics Letters 105 (6), 063116, 2014
182014
Atomic resolution electron tomography
S Bals, B Goris, A De Backer, S Van Aert, G Van Tendeloo
MRS Bulletin 41 (7), 525-530, 2016
162016
Advanced electron crystallography through model-based imaging
S Van Aert, A De Backer, GT Martinez, AJ den Dekker, D Van Dyck, ...
IUCrJ 3 (1), 71-83, 2016
162016
Hybrid statistics-simulations based method for atom-counting from ADF STEM images
A De Backer, L Jones, PD Nellist, S Van Aert
Ultramicroscopy 177, 69-77, 2017
112017
High precision measurements of atom column positions using model-based exit wave reconstruction
A De Backer, S Van Aert, D Van Dyck
Ultramicroscopy 111 (9-10), 1475-1482, 2011
102011
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Articles 1–20