Saman Kiamehr
Saman Kiamehr
SEG-Auomotive
Geverifieerd e-mailadres voor seg-automotive.com
TitelGeciteerd doorJaar
Aging-aware logic synthesis
M Ebrahimi, F Oboril, S Kiamehr, MB Tahoori
Proceedings of the International Conference on Computer-Aided Design, 61-68, 2013
512013
NBTI mitigation by optimized NOP assignment and insertion
F Firouzi, S Kiamehr, MB Tahoori
Proceedings of the Conference on Design, Automation and Test in Europe, 218-223, 2012
442012
Aging mitigation in memory arrays using self-controlled bit-flipping technique
A Gebregiorgis, M Ebrahimi, S Kiamehr, F Oboril, S Hamdioui, ...
The 20th Asia and South Pacific Design Automation Conference, 231-236, 2015
322015
Investigation of NBTI and PBTI induced aging in different LUT implementations
S Kiamehr, A Amouri, MB Tahoori
2011 International Conference on Field-Programmable Technology, 1-8, 2011
312011
Power-aware minimum NBTI vector selection using a linear programming approach
F Firouzi, S Kiamehr, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
292012
Aging-aware timing analysis considering combined effects of NBTI and PBTI
S Kiamehr, F Firouzi, MB Tahoori
International Symposium on Quality Electronic Design (ISQED), 53-59, 2013
282013
A linear programming approach for minimum NBTI vector selection
F Firouzi, S Kiamehr, MB Tahoori
Proceedings of the 21st edition of the great lakes symposium on Great lakes …, 2011
272011
Reducing NBTI-induced processor wearout by exploiting the timing slack of instructions
F Oboril, F Firouzi, S Kiamehr, M Tahoori
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware …, 2012
252012
Incorporating the impacts of workload-dependent runtime variations into timing analysis
F Firouzi, S Kiamehr, M Tahoori, S Nassif
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013
242013
Altering LUT configuration for wear-out mitigation of FPGA-mapped designs
PMB Rao, A Amouri, S Kiamehr, MB Tahoori
2013 23rd International Conference on Field programmable Logic and …, 2013
232013
Radiation-induced soft error analysis of SRAMs in SOI FinFET technology: A device to circuit approach
S Kiamehr, T Osiecki, M Tahoori, S Nassif
Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014
212014
Statistical analysis of BTI in the presence of process-induced voltage and temperature variations
F Firouzi, S Kiamehr, MB Tahoori
2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 594-600, 2013
212013
On-line prediction of NBTI-induced aging rates
R Baranowski, F Firouzi, S Kiamehr, C Liu, M Tahoori, HJ Wunderlich
Proceedings of the 2015 Design, Automation & Test in Europe Conference …, 2015
192015
Input and transistor reordering for NBTI and HCI reduction in complex CMOS gates
S Kiamehr, F Firouzi, MB Tahoori
Proceedings of the great lakes symposium on VLSI, 201-206, 2012
192012
Aging-aware standard cell library design
S Kiamehr, F Firouzi, M Ebrahimi, MB Tahoori
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014
182014
Fine-grained aging-induced delay prediction based on the monitoring of run-time stress
A Vijayan, A Koneru, S Kiamehr, K Chakrabarty, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016
172016
Investigation of aging effects in different implementations and structures of programmable routing resources of FPGAs
A Amouri, S Kiamehr, M Tahoori
2012 International Conference on Field-Programmable Technology, 215-219, 2012
172012
Analysis of transient voltage fluctuations in FPGAs
DRE Gnad, F Oboril, S Kiamehr, MB Tahoori
2016 International Conference on Field-Programmable Technology (FPT), 12-19, 2016
162016
Aging effects in fpgas: an experimental analysis
A Amouri, F Bruguier, S Kiamehr, P Benoit, L Torres, M Tahoori
2014 24th international conference on Field Programmable Logic and …, 2014
162014
Temperature-aware dynamic voltage scaling to improve energy efficiency of near-threshold computing
S Kiamehr, M Ebrahimi, MS Golanbari, MB Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (7), 2017
132017
Het systeem kan de bewerking nu niet uitvoeren. Probeer het later opnieuw.
Artikelen 1–20