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Wei-Chen ChenU.S. Food and Drug AdministrationVerified email at iastate.edu
Pragneshkumar PatelUniversity of TennesseeVerified email at utk.edu
Nagiza SamatovaNorth Carolina State UniversityVerified email at csc.ncsu.edu
Scott KlaskyOak Ridge National LaboratoryVerified email at ornl.gov
Matthew WolfSamsung Seminconductor, Inc.Verified email at samsung.com
Auroop R GangulyCollege of Engineering Distinguished Professor, Fellow ASCE, Northeastern University, Boston, MAVerified email at northeastern.edu
Sean D. AhernANSYSVerified email at ansys.com
E. Wes BethelSan Francisco State University, Lawrence Berkeley National LaboratoryVerified email at sfsu.edu
Jeremy LoganOak Ridge National LaboratoryVerified email at ornl.gov
Jong Youl ChoiOak Ridge National LaboratoryVerified email at ornl.gov
Jeremy MeredithGoogleVerified email at google.com
Norbert PodhorszkiScientific Data Group, Oak Ridge National LaboratoryVerified email at ornl.gov
Lipeng WanGeorgia State UniversityVerified email at gsu.edu
Hank ChildsProfessor of Computer Science, University of OregonVerified email at uoregon.edu
David R. PugmireOak Ridge National LaboratoryVerified email at ornl.gov
Valerio PascucciEndowed Chair professor and Director of the Center for Extreme Data Management Analysis andVerified email at sci.utah.edu
Jian HuangProfessor of Computer Science, University of TennesseeVerified email at utk.edu
Kesheng WuLawrence Berkeley National LabVerified email at lbl.gov
Vladimir ProtopopescuChief Scientist, CSED, ORNLVerified email at ornl.gov
Qing LiuAssociate Professor, New Jersey Institute of TechnologyVerified email at njit.edu
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George Ostrouchov
Oak Ridge National Laboratory and University of Tennessee
Verified email at ornl.gov - Homepage