Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3–4 nm wide fins and 20 nm gate length for quantum computing applications S Gupta, A Rathi, B Parvais, A Dixit
Solid-State Electronics 185, 108089, 2021
12 2021 Large signal RF reliability of 45-nm RFSOI power amplifier cell for Wi-Fi6 applications A Rathi, P Srinivasan, F Guarin, A Dixit
2021 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2021
11 2021 RF reliability of CMOS-based power amplifier cell for 5G mmWave applications A Rathi, A Dixit, P Srinivasan, OH Gonzalez, F Guarin
2022 IEEE International Reliability Physics Symposium (IRPS), 4B. 3-1-4B. 3-6, 2022
4 2022 Impact of hot carrier degradation on DC and RF performance of 45-nm power amplifier cell A Rathi, P Srinivasan, F Guarin, A Dixit
2021 IEEE Latin America Electron Devices Conference (LAEDC), 1-4, 2021
4 2021 Characterization and analysis of hot carrier degradation under DC and large-signal RF stress in a PDSOI floating-body NFET-based power amplifier cell under WiFi operating … A Rathi, P Srinivasan, F Guarin, A Dixit
IEEE Transactions on Device and Materials Reliability 22 (2), 232-238, 2022
3 2022 Superior mm-Wave Large Signal Power Amplifier Reliability of p-Type FET in a 45-nm Partially-Depleted Silicon-On-Insulator RF Technology A Rathi, P Srinivasan, F Guarin, A Dixit
IEEE Electron Device Letters 43 (5), 797-800, 2022
3 2022 Investigation of temperature dependence of mmWave power amplifier large-signal reliability performance A Rathi, P Srinivasan, F Guarin, A Dixit
IEEE Transactions on Electron Devices 70 (3), 928-933, 2023
2 2023 Deep cryogenic temperature TDDB in 45-nm PDSOI N-channel FETs for quantum computing applications A Amin, A Rathi, SK Singh, A Dixit, OH Gonzalez, P Srinivasan, F Guarin
2022 IEEE International Reliability Physics Symposium (IRPS), 11A. 5-1-11A. 5-6, 2022
2 2022 Impact of RF Frequency Bands on the DC and Large Signal Reliability of a 45nm RFSOI NFET based Power Amplifier Cell A Rathi, P Srinivasan, A Dixit
2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2023
1 2023 Heavy-Ion Induced Single Event Transients in Sub-7nm Bulk and SOI NSFETs CK Jha, A Rathi, P Yogi, K Aditya, A Dixit
2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020
1 2020 Modeling of RF Bulk and SOI Planar MOSFETs using Industry Standard BSIM Models A Rathi, M Kumar, JK Verma, HS Jatana, YS Chauhan, A Dixit
2020 5th IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2020
1 2020 Impact of gate oxide thickness on flicker noise (1/f) in PDSOI n-channel FETs S Pathak, S Gupta, A Rathi, P Srinivasan, A Dixit
Solid-State Electronics, 108935, 2024
2024 Temperature Dependent Study of Large-Signal Reliability of p-FET Based Power Amplifier for mmWave Applications A Rathi, P Srinivasan, F Guarin, A Dixit
IEEE Transactions on Device and Materials Reliability, 2023
2023 Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications A Rathi, A Dixit, N Satish, P Srinivasan, F Guarin
2023 IEEE International Reliability Physics Symposium (IRPS), 1-6, 2023
2023