Nicholas Vickers
Title
Cited by
Cited by
Year
Method of fabricating optical devices using laser treatment of contact regions of gallium and nitrogen containing material
A Felker, NA Vickers, R Aldaz, D Press, NJ Pfister, JW Raring, ...
US Patent 8,975,615, 2015
1152015
Extended depth-of-field microscopy with a high-speed deformable mirror
WJ Shain, NA Vickers, BB Goldberg, T Bifano, J Mertz
Optics letters 42 (5), 995-998, 2017
682017
Drop test reliability of lead-free chip scale packages
A Farris, J Pan, A Liddicoat, BJ Toleno, D Maslyk, D Shangguan, J Bath, ...
2008 58th Electronic Components and Technology Conference, 1173-1180, 2008
282008
The effects of active layer thickness on Programmable Metallization Cell based on Ag–Ge–S
F Wang, WP Dunn, M Jain, C De Leo, N Vickers
Solid-state electronics 61 (1), 33-37, 2011
262011
Drop impact reliability of edge-bonded lead-free chip scale packages
A Farris, J Pan, A Liddicoat, M Krist, N Vickers, BJ Toleno, D Maslyk, ...
Microelectronics Reliability 49 (7), 761-770, 2009
192009
Techniques of forming Ohmic contacts on GaN light emitting diodes
AJ Felker, NA Vickers
US Patent 8,148,180, 2012
112012
Axial localization with modulated-illumination extended-depth-of-field microscopy
WJ Shain, NA Vickers, J Li, X Han, T Bifano, J Mertz
Biomedical optics express 9 (4), 1771-1782, 2018
102018
Dual fluorescence-absorption deconvolution applied to extended-depth-of-field microscopy
WJ Shain, NA Vickers, A Negash, T Bifano, A Sentenac, J Mertz
Optics letters 42 (20), 4183-4186, 2017
82017
Jasbir Bath, Dennis Willie, and David A
A Farris, J Pan, A Liddicoat, M Krist, N Vickers, BJ Toleno, D Maslyk, ...
Geiger,“Drop impact reliability of edge-bonded lead-free chip scale packages …, 2008
72008
Techniques of forming ohmic contacts on GaN light emitting diodes
AJ Felker, NA Vickers
US Patent 8,389,305, 2013
62013
The effects of thermal annealing on the obliquely deposited Ag–Ge–S thin films
F Wang, WP Dunn, M Jain, C De Leo, N Vicker, R Savage, X Jin, ...
Journal of Physics and Chemistry of Solids 70 (6), 978-981, 2009
62009
Board level failure analysis of chip scale package drop test assemblies
N Vickers, K Rauen, A Farris, J Pan
Proceedings of the 41st International Symposium on Microelectronics …, 2008
62008
Estimation of general time-varying single particle tracking linear models using local likelihood
BI Godoy, NA Vickers, Y Lin, SB Andersson
2020 European Control Conference (ECC), 527-533, 2020
22020
Monte carlo simulation of brownian motion using a piezo-actuated microscope stage
NA Vickers, SB Andersson
2019 American Control Conference (ACC), 567-572, 2019
22019
Volumetric chemical imaging in vivo by a remote-focusing stimulated Raman scattering microscope
P Lin, H Ni, H Li, NA Vickers, Y Tan, R Gong, T Bifano, JX Cheng
Optics Express 28 (20), 30210-30221, 2020
12020
Estimation of Time-Varying Single Particle Tracking Models using Local Likelihood
BI Godoy, NA Vickers, SB Andersson
Biophysical Journal 116 (3), 569a, 2019
12019
Drop impact dynamic response study of JEDEC JESD22-B111 test board
M Krist, J Pan, A Farris, N Vickers
Proceedings of the 41st International Symposium on Microelectronics …, 2008
12008
Information Optimal Particle Tracking with a Confocal or 2-Photon Microscope
NA Vickers, F Sharifii, SC Pinto, SB Andersson
Biophysical Journal 120 (3), 106a, 2021
2021
An Estimation Algorithm for General Linear Single Particle Tracking Models with Time-Varying Parameters
BI Godoy, NA Vickers, SB Andersson
Molecules 26 (4), 886, 2021
2021
Method of Synthetic Motion for Testing Single Particle Tracking Microscopes
NA Vickers, SB Andersson
Biophysical Journal 118 (3), 616a, 2020
2020
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Articles 1–20