| Method of fabricating optical devices using laser treatment of contact regions of gallium and nitrogen containing material A Felker, NA Vickers, R Aldaz, D Press, NJ Pfister, JW Raring, ... US Patent 8,975,615, 2015 | 123 | 2015 |
| Extended depth-of-field microscopy with a high-speed deformable mirror WJ Shain, NA Vickers, BB Goldberg, T Bifano, J Mertz Optics letters 42 (5), 995-998, 2017 | 76 | 2017 |
| The effects of active layer thickness on Programmable Metallization Cell based on Ag–Ge–S F Wang, WP Dunn, M Jain, C De Leo, N Vickers Solid-state electronics 61 (1), 33-37, 2011 | 27 | 2011 |
| Drop impact reliability of edge-bonded lead-free chip scale packages A Farris, J Pan, A Liddicoat, M Krist, N Vickers, BJ Toleno, D Maslyk, ... Microelectronics Reliability 49 (7), 761-770, 2009 | 20 | 2009 |
| Axial localization with modulated-illumination extended-depth-of-field microscopy WJ Shain, NA Vickers, J Li, X Han, T Bifano, J Mertz Biomedical optics express 9 (4), 1771-1782, 2018 | 11 | 2018 |
| Techniques of forming Ohmic contacts on GaN light emitting diodes AJ Felker, NA Vickers US Patent 8,148,180, 2012 | 11 | 2012 |
| Dual fluorescence-absorption deconvolution applied to extended-depth-of-field microscopy WJ Shain, NA Vickers, A Negash, T Bifano, A Sentenac, J Mertz Optics letters 42 (20), 4183-4186, 2017 | 9 | 2017 |
| Jasbir Bath, Dennis Willie, and David A A Farris, J Pan, A Liddicoat, M Krist, N Vickers, BJ Toleno, D Maslyk, ... Geiger,“Drop impact reliability of edge-bonded lead-free chip scale packages …, 2008 | 7 | 2008 |
| Board level failure analysis of chip scale package drop test assemblies N Vickers, K Rauen, A Farris, J Pan Proceedings of the 41st International Symposium on Microelectronics …, 2008 | 7 | 2008 |
| Techniques of forming ohmic contacts on GaN light emitting diodes AJ Felker, NA Vickers US Patent 8,389,305, 2013 | 6 | 2013 |
| The effects of thermal annealing on the obliquely deposited Ag–Ge–S thin films F Wang, WP Dunn, M Jain, C De Leo, N Vicker, R Savage, X Jin, ... Journal of Physics and Chemistry of Solids 70 (6), 978-981, 2009 | 6 | 2009 |
| An estimation algorithm for general linear single particle tracking models with time-varying parameters BI Godoy, NA Vickers, SB Andersson Molecules 26 (4), 886, 2021 | 3 | 2021 |
| Monte Carlo simulation of Brownian motion using a piezo-actuated microscope stage NA Vickers, SB Andersson 2019 American Control Conference (ACC), 567-572, 2019 | 3 | 2019 |
| Volumetric chemical imaging in vivo by a remote-focusing stimulated Raman scattering microscope P Lin, H Ni, H Li, NA Vickers, Y Tan, R Gong, T Bifano, JX Cheng Optics Express 28 (20), 30210-30221, 2020 | 2 | 2020 |
| Estimation of general time-varying single particle tracking linear models using local likelihood BI Godoy, NA Vickers, Y Lin, SB Andersson 2020 European Control Conference (ECC), 527-533, 2020 | 2 | 2020 |
| droP imPaCt dynamiC resPonse stUdy of JedeC Jesd22-b111 test board J Pan, M Krist, A Farris, N Vickers Honors Undergraduate Research Journal 2 (1), 10, 2009 | 2 | 2009 |
| Drop impact dynamic response study of JEDEC JESD22-B111 test board M Krist, J Pan, A Farris, N Vickers Proceedings of the 41st International Symposium on Microelectronics …, 2008 | 2 | 2008 |
| Tracking Multiple Diffusing Particles Using Information Optimal Control SC Pinto, NA Vickers, F Sharifi, SB Andersson 2021 American Control Conference (ACC), 4033-4038, 2021 | 1 | 2021 |
| Estimation of Time-Varying Single Particle Tracking Models using Local Likelihood BI Godoy, NA Vickers, SB Andersson Biophysical Journal 116 (3), 569a, 2019 | 1 | 2019 |
| droP imPaCt dynamiC resPonse stUdy of JedeC Jesd22-b111 test board M Krist, A Farris, N Vickers CAL POLY, 80, 2009 | 1 | 2009 |
Thomas BifanoBoston University Photonics CenterVerified email at bu.edu
