Experiences in hardware Trojan design and implementation Y Jin, N Kupp, Y Makris 2009 IEEE international workshop on hardware-oriented security and trust, 50-57, 2009 | 305 | 2009 |
DFTT: Design for Trojan test Y Jin, N Kupp, Y Makris 2010 17th IEEE International Conference on Electronics, Circuits and Systems …, 2010 | 46 | 2010 |
Improving analog and RF device yield through performance calibration N Kupp, H Huang, Y Makris, P Drineas IEEE Design & Test of Computers 28 (3), 64-75, 2010 | 41 | 2010 |
Post-production performance calibration in analog/RF devices N Kupp, H Huang, P Drineas, Y Makris 2010 IEEE International Test Conference, 1-10, 2010 | 39 | 2010 |
Spatial correlation modeling for probe test cost reduction in RF devices N Kupp, K Huang, JM Carulli Jr, Y Makris Proceedings of the International Conference on Computer-Aided Design, 23-29, 2012 | 36 | 2012 |
Spatial estimation of wafer measurement parameters using gaussian process models N Kupp, K Huang, J Carulli, Y Makris 2012 IEEE international test conference, 1-8, 2012 | 35 | 2012 |
A comparative study of one-shot statistical calibration methods for analog/RF ICs Y Lu, KS Subramani, H Huang, N Kupp, K Huang, Y Makris 2015 IEEE International Test Conference (ITC), 1-10, 2015 | 33 | 2015 |
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests K Huang, N Kupp, JM Carulli, Y Makris 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 553-558, 2013 | 27 | 2013 |
Correlating inline data with final test outcomes in analog/RF devices N Kupp, M Slamani, Y Makris 2011 Design, Automation & Test in Europe, 1-6, 2011 | 26 | 2011 |
Confidence estimation in non-RF to RF correlation-based specification test compaction N Kupp, P Drineas, M Slamani, Y Makris 2008 13th European Test Symposium, 35-40, 2008 | 25 | 2008 |
Process monitoring through wafer-level spatial variation decomposition K Huang, N Kupp, JM Carulli, Y Makris 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 23 | 2013 |
Applying the model-view-controller paradigm to adaptive test N Kupp, Y Makris IEEE Design & Test of computers 29 (1), 28-35, 2011 | 19 | 2011 |
On boosting the accuracy of non-RF to RF correlation-based specification test compaction N Kupp, P Drineas, M Slamani, Y Makris Journal of Electronic Testing 25, 309-321, 2009 | 18 | 2009 |
Low-cost analog/RF IC testing through combined intra-and inter-die correlation models K Huang, N Kupp, C Xanthopoulos, JM Carulli, Y Makris IEEE Design & Test 32 (1), 53-60, 2014 | 17 | 2014 |
On proving the efficiency of alternative RF tests N Kupp, H Stratigopoulos, P Drineas, Y Makris 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 762-767, 2011 | 17 | 2011 |
On combining alternate test with spatial correlation modeling in analog/RF ICs K Huang, N Kupp, JM Carulli, Y Makris 2013 18th IEEE European Test Symposium (ETS), 1-6, 2013 | 11 | 2013 |
Integrated optimization of semiconductor manufacturing: A machine learning approach N Kupp, Y Makris 2012 IEEE International Test Conference, 1-10, 2012 | 10 | 2012 |
A low cost advanced encryption standard (AES) Co-processor implementation OJ Hernandez, T Sodon, M Adel, N Kupp Journal of Computer Science and Technology 8 (01), 8-14, 2008 | 10 | 2008 |
CSAW 2008 Team Report (Yale University) Y Jin, N Kupp CSAW Embedded System Challenge, 2008 | 9 | 2008 |
Silicon demonstration of statistical post-production tuning Y Lu, K Subramani, H Huang, N Kupp, Y Makris 2015 IEEE computer society annual symposium on VLSI, 628-633, 2015 | 5 | 2015 |