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Nate Kupp
Nate Kupp
PhD, Yale University
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Experiences in hardware Trojan design and implementation
Y Jin, N Kupp, Y Makris
2009 IEEE international workshop on hardware-oriented security and trust, 50-57, 2009
3052009
DFTT: Design for Trojan test
Y Jin, N Kupp, Y Makris
2010 17th IEEE International Conference on Electronics, Circuits and Systems …, 2010
462010
Improving analog and RF device yield through performance calibration
N Kupp, H Huang, Y Makris, P Drineas
IEEE Design & Test of Computers 28 (3), 64-75, 2010
412010
Post-production performance calibration in analog/RF devices
N Kupp, H Huang, P Drineas, Y Makris
2010 IEEE International Test Conference, 1-10, 2010
392010
Spatial correlation modeling for probe test cost reduction in RF devices
N Kupp, K Huang, JM Carulli Jr, Y Makris
Proceedings of the International Conference on Computer-Aided Design, 23-29, 2012
362012
Spatial estimation of wafer measurement parameters using gaussian process models
N Kupp, K Huang, J Carulli, Y Makris
2012 IEEE international test conference, 1-8, 2012
352012
A comparative study of one-shot statistical calibration methods for analog/RF ICs
Y Lu, KS Subramani, H Huang, N Kupp, K Huang, Y Makris
2015 IEEE International Test Conference (ITC), 1-10, 2015
332015
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests
K Huang, N Kupp, JM Carulli, Y Makris
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 553-558, 2013
272013
Correlating inline data with final test outcomes in analog/RF devices
N Kupp, M Slamani, Y Makris
2011 Design, Automation & Test in Europe, 1-6, 2011
262011
Confidence estimation in non-RF to RF correlation-based specification test compaction
N Kupp, P Drineas, M Slamani, Y Makris
2008 13th European Test Symposium, 35-40, 2008
252008
Process monitoring through wafer-level spatial variation decomposition
K Huang, N Kupp, JM Carulli, Y Makris
2013 IEEE International Test Conference (ITC), 1-10, 2013
232013
Applying the model-view-controller paradigm to adaptive test
N Kupp, Y Makris
IEEE Design & Test of computers 29 (1), 28-35, 2011
192011
On boosting the accuracy of non-RF to RF correlation-based specification test compaction
N Kupp, P Drineas, M Slamani, Y Makris
Journal of Electronic Testing 25, 309-321, 2009
182009
Low-cost analog/RF IC testing through combined intra-and inter-die correlation models
K Huang, N Kupp, C Xanthopoulos, JM Carulli, Y Makris
IEEE Design & Test 32 (1), 53-60, 2014
172014
On proving the efficiency of alternative RF tests
N Kupp, H Stratigopoulos, P Drineas, Y Makris
2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 762-767, 2011
172011
On combining alternate test with spatial correlation modeling in analog/RF ICs
K Huang, N Kupp, JM Carulli, Y Makris
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
112013
Integrated optimization of semiconductor manufacturing: A machine learning approach
N Kupp, Y Makris
2012 IEEE International Test Conference, 1-10, 2012
102012
A low cost advanced encryption standard (AES) Co-processor implementation
OJ Hernandez, T Sodon, M Adel, N Kupp
Journal of Computer Science and Technology 8 (01), 8-14, 2008
102008
CSAW 2008 Team Report (Yale University)
Y Jin, N Kupp
CSAW Embedded System Challenge, 2008
92008
Silicon demonstration of statistical post-production tuning
Y Lu, K Subramani, H Huang, N Kupp, Y Makris
2015 IEEE computer society annual symposium on VLSI, 628-633, 2015
52015
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