Mohammad Saber Golanbari
Mohammad Saber Golanbari
Research Assistant, Karlsruhe Institute of Technology (KIT)
Geverifieerd e-mailadres voor kit.edu - Homepage
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A smooth EKV-based DC model for accurate simulation of printed transistors and their process variations
F Rasheed, MS Golanbari, GC Marques, MB Tahoori, ...
IEEE Transactions on Electron Devices 65 (2), 667-673, 2018
262018
Inkjet-printed EGFET-based physical unclonable function—Design, evaluation, and fabrication
AT Erozan, GC Marques, MS Golanbari, R Bishnoi, S Dehm, ...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (12 …, 2018
202018
Temperature-aware dynamic voltage scaling to improve energy efficiency of near-threshold computing
S Kiamehr, M Ebrahimi, MS Golanbari, MB Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (7), 2017
182017
Variation-aware near threshold circuit synthesis
MS Golanbari, S Kiamehr, M Ebrahimi, MB Tahoori
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2016
132016
Aging guardband reduction through selective flip-flop optimization
MS Golanbari, S Kiamehr, M Ebrahimi, MB Tahoori
2015 20th IEEE European Test Symposium (ETS), 1-6, 2015
132015
VAET-STT: A variation aware estimator tool for STT-MRAM based memories
SM Nair, R Bishnoi, MS Golanbari, F Oboril, MB Tahoori
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
122017
Analysis and optimization of flip-flops under process and runtime variations
MS Golanbari, S Kiamehr, MB Tahoori, S Nassif
Sixteenth International Symposium on Quality Electronic Design, 191-196, 2015
122015
VAET-STT: Variation aware STT-MRAM analysis and design space exploration tool
SM Nair, R Bishnoi, MS Golanbari, F Oboril, F Hameed, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017
112017
Design and evaluation of physical unclonable function for inorganic printed electronics
AT Erozan, MS Golanbari, R Bishnoi, J Aghassi-Hagmann, MB Tahoori
2018 19th International Symposium on Quality Electronic Design (ISQED), 419-424, 2018
102018
Maximizing energy efficiency in NTC by variation-aware microprocessor pipeline optimization
A Gebregiorgis, MS Golanbari, S Kiamehr, F Oboril, MB Tahoori
Proceedings of the 2016 International Symposium on Low Power Electronics and …, 2016
92016
A cross-layer approach for resiliency and energy efficiency in near threshold computing
MS Golanbari, A Gebregiorgis, F Oboril, S Kiamehr, MB Tahoori
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-8, 2016
82016
Hold-time violation analysis and fixing in near-threshold region
MS Golanbari, S Kiamehr, MB Tahoori
2016 26th International Workshop on Power and Timing Modeling, Optimization …, 2016
82016
Aging-aware coding scheme for memory arrays
MS Golanbari, N Sayed, M Ebrahimi, MHM Esfahany, S Kiamehr, ...
2017 22nd IEEE European Test Symposium (ETS), 1-6, 2017
72017
Leveraging aging effect to improve SRAM-based true random number generators
S Kiamehr, MS Golanbari, MB Tahoori
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
72017
Post-fabrication calibration of near-threshold circuits for energy efficiency
MS Golanbari, S Kiamehr, F Oboril, A Gebregiorgis, MB Tahoori
2017 18th International Symposium on Quality Electronic Design (ISQED), 385-390, 2017
72017
Runtime adjustment of IoT system-on-chips for minimum energy operation
MS Golanbari, MB Tahoori
2018 55th ACM/ESDA/IEEE Design Automation Conference (DAC), 1-6, 2018
52018
Balancing resiliency and energy efficiency of functional units in ultra-low power systems
MS Golanbari, A Gebregiorgis, E Moradi, S Kiamehr, MB Tahoori
2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC), 637-644, 2018
52018
Fault injection acceleration by simultaneous injection of non-interacting faults
M Ebrahimi, MH Moshrefpour, MS Golanbari, MB Tahoori
Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016
42016
Bayesian Optimized Importance Sampling for High Sigma Failure Rate Estimation
DD Weller, M Hefenbrock, MS Golanbari, M Beigl, MB Tahoori
2019 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2019
32019
Selective Flip-Flop Optimization for Reliable Digital Circuit Design
MS Golanbari, S Kiamehr, M Ebrahimi, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019
22019
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