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Jannatul Susoma
Jannatul Susoma
Aalto University, Tokyo Institute of Technology
Verified email at alumni.aalto.fi
Title
Cited by
Cited by
Year
A MoSe2/WSe2 Heterojunction‐Based Photodetector at Telecommunication Wavelengths
H Xue, Y Wang, Y Dai, W Kim, H Jussila, M Qi, J Susoma, Z Ren, Q Dai, ...
Advanced Functional Materials 28 (47), 1804388, 2018
1112018
Tunable Graphene-GaSe Dual Heterojunction Device.
W Kim, C Li, FA Chaves, D Jiménez, RD Rodriguez, J Susoma, ...
Advanced Materials (Deerfield Beach, Fla.) 28 (9), 1845-1852, 2016
1012016
Second and third harmonic generation in few-layer gallium telluride characterized by multiphoton microscopy
J Susoma, L Karvonen, A Säynätjoki, S Mehravar, RA Norwood, ...
Applied Physics Letters 108 (7), 2016
752016
Crystal quality of two-dimensional gallium telluride and gallium selenide using Raman fingerprint
J Susoma, J Lahtinen, M Kim, J Riikonen, H Lipsanen
Aip Advances 7 (1), 2017
632017
Direct transfer of wafer-scale graphene films
M Kim, A Shah, C Li, P Mustonen, J Susoma, F Manoocheri, J Riikonen, ...
2D Materials 4 (3), 035004, 2017
402017
Versatile water-based transfer of large-area graphene films onto flexible substrates
M Kim, C Li, J Susoma, J Riikonen, H Lipsanen
MRS Advances 2 (60), 3749-3754, 2017
32017
Channel Length Scaling and Surface Nitridation of Silicon Nanocrystals for High-Performance Electron Devices
SJ Ferdous, Y Nakamine, T Kodera, K Usami, Y Kawano, S Oda
Japanese Journal of Applied Physics 52 (4S), 04CH08, 2013
22013
Low-dimensional semiconducting materials for next-generation nanoelectronics
J Susoma
Aalto University, 2016
2016
Second and Third Harmonic Generation in Few-Layer Gallium Telluride by Multiphoton Microscopy
J Susoma, L Karvonen, A Säynätjoki, S Mehravar, RA Norwood, ...
2015
Channel length scaling and surface nitridation of silicon nanocrystals devices for high electron transport properties
J Susoma
Tokyo Institute of Technology, 2012
2012
Design and implementation of a 5 bit frequency meter
J Susoma
American International University-Bangladesh, 2008
2008
CHARACTERIZATION OF GaSe USING RAMAN SPECTROSCOPY AND ATOMIC FORCE MICROSCOPY
J Susoma, C Li, H Lipsanen, J Riikonen
Using ultra-violet exposure to study the effect of chemical vapor deposition growth process on the graphene grain size
J Susoma, C Li, J Riikonen, H Lipsanen
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Articles 1–13