Yu Hu (胡 瑜)
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Scaling for edge inference of deep neural networks
X Xu, Y Ding, SX Hu, M Niemier, J Cong, Y Hu, Y Shi
Nature Electronics 1 (4), 216-222, 2018
1152018
IVF: Characterizing the Vulnerability of Microprocessor Structures to Intermittent Faults
Songjun Pan, Yu Hu, Xiaowei Li
Design, Automation & Test in Europe Conference & Exhibition (DATE), 238-243, 2010
68*2010
iFill: an impact-oriented X-filling method for shift-and capture-power reduction in at-speed scan-based testing
J Li, Q Xu, Y Hu, X Li
Design, Automation & Test in Europe Conference & Exhibition (DATE), 1184-1189, 2008
562008
Rt3d: Real-time 3-d vehicle detection in lidar point cloud for autonomous driving
Y Zeng, Y Hu, S Liu, J Ye, Y Han, X Li, N Sun
IEEE Robotics and Automation Letters 3 (4), 3434-3440, 2018
462018
On capture power-aware test data compression for scan-based testing
J Li, X Liu, Y Zhang, Y Hu, X Li, Q Xu
IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 67-72, 2008
442008
Quantization of fully convolutional networks for accurate biomedical image segmentation
X Xu, Q Lu, L Yang, S Hu, D Chen, Y Hu, Y Shi
Proceedings of the IEEE conference on computer vision and pattern …, 2018
422018
Embedded test decompressor to reduce the required channels and vector memory of tester for complex processor circuit
Y Han, Y Hu, X Li, H Li, A Chandra
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI) 15 …, 2007
362007
RPUF: Physical unclonable function with randomized challenge to resist modeling attack
J Ye, Y Hu, X Li
2016 IEEE Asian Hardware-Oriented Security and Trust (AsianHOST), 1-6, 2016
332016
X-filling for simultaneous shift-and capture-power reduction in at-speed scan-based testing
J Li, Q Xu, Y Hu, X Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI) 18 …, 2010
322010
An on-chip test clock control scheme for multi-clock at-speed testing
XX Fan, Y Hu, LT Wang
IEEE Asian Test Symposium (ATS), 341-348, 2007
29*2007
Localized random access scan: towards low area and routing overhead
Y Hu, X Fu, X Fan, H Fujiwara
IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC), 565-570, 2008
252008
See and think: Disentangling semantic scene completion
S Liu, Y Hu, Y Zeng, Q Tang, B Jin, Y Han, X Li
Advances in Neural Information Processing Systems, 263-274, 2018
232018
Reliability-Oriented Placement and Routing Algorithm for SRAM-Based FPGAs
Keheng Huang, Yu Hu, Xiaowei Li
IEEE Transactions on Very Large Scale Integration (VLSI) Systems (TVLSI), 22 …, 2014
21*2014
Diagnosis of multiple arbitrary faults with mask and reinforcement effect
J Ye, Y Hu, X Li
Design, Automation & Test in Europe Conference & Exhibition (DATE), 885-890, 2010
202010
OPUF: Obfuscation logic based physical unclonable function
J Ye, Y Hu, X Li
2015 IEEE 21st International On-Line Testing Symposium (IOLTS), 156-161, 2015
192015
Partial-SET: Write Speedup of PCM Main Memory
Bing Li, Shuchang Shan, Yu Hu, Xiaowei Li
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014
192014
Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code
Y Han, Y Hu, H Li, X Li
IEEE/ACM Asia and South Pacific Design Automation Conference (ASPDAC), 53-58, 2005
192005
Design-for-Testability and Test Technologies for System-on-a-Chip [J]
H Yu, H Yinhe, L Xiaowei
Journal of Computer Research and Development 1, 2005
192005
Efficient attack on non-linear current mirror PUF with genetic algorithm
Q Guo, J Ye, Y Gong, Y Hu, X Li
2016 IEEE 25th Asian Test Symposium (ATS), 49-54, 2016
182016
A scan-based delay test method for reduction of overtesting
H Liu, H Li, Y Hu, X Li
IEEE International Symposium on Electronic Design, Test and Applications …, 2008
182008
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Artikelen 1–20