Mafalda Cortez, Ph.D.
Mafalda Cortez, Ph.D.
Senior Security Analyst @ Riscure B.V.
Geverifieerd e-mailadres voor riscure.com - Homepage
TitelGeciteerd doorJaar
Modeling SRAM start-up behavior for physical unclonable functions
M Cortez, A Dargar, S Hamdioui, GJ Schrijen
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012
592012
Adapting Voltage Ramp-up Time for Temperature Noise Reduction on Memory-based PUFs
M Cortez, S Hamdioui, V van der Leest, R Maes, GJ Schrijen
(HOST) IEEE International Symposium on Hardware-Oriented Security and Trust …, 2013
312013
Testing PUF-based Secure Key Storage Circuits
A Cortez, G Roelofs, S Hamdioui, G di Natale
Design, Automation and Test in Europe Conference and Exhibition (DATE), 1-6, 2014
122014
Intelligent Voltage Ramp-up Time Adaptation for Temperature Noise Reduction on Memory-based PUF Systems
M Cortez, S Hamdioui, A Kaichouhi, V van der Leest, R Maes, GJ Schrijen
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2015
92015
Design Dependent SRAM PUF Robustness Analysis
A Cortez, S Hamdioui, R Ishihara
16th IEEE Latin-American Test Symposium, 1-6, 2015
22015
Noise Reduction on Memory-based PUFs
M Cortez, S Hamdioui, V van der Leest, R Maes, GJ Schrijen
(TRUDEVICE) First Workshop on Trustworthy Manufacturing and Utilization of …, 2013
12013
Reliability Assessment and Test Methods for Anti-counterfeiting Technology
AM Monteiro Oliveira Cortez
Delft University of Technology, 2015
2015
Multi-segment Enhanced Scan-chains for Secure ICs
M Cortez, S Hamdioui, G Di Natale, ML Flottes, B Rouzeyre, I Polian
TRUDEVICE: Secure Hardware and Security Evaluation, 2015
2015
Hierarchical Secure DfT
M Cortez, S Hamdioui, G Di Natale, ML Flottes, B Rouzeyre
TRUDEVICE: Secure Hardware and Security Evaluation, 2015
2015
Secure Test Method for Fuzzy Extractor
M Cortez, G Roelofs, S Hamdioui, G Di Natale
Joint MEDIAN-TRUDEVICE Open Forum, 2014
2014
Testing Methods for PUF-Based Secure Key Storage Circuits
M Cortez, G Roelofs, S Hamdioui, G di Natale
Journal of Electronic Testing: Theory and Applications (JETTA) 30 (5), 581-594, 2014
2014
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Artikelen 1–11