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Joseph P. Kozak
Joseph P. Kozak
Johns Hopkins University Applied Physics Laboratory
Verified email at vt.edu
Title
Cited by
Cited by
Year
Surge-energy and overvoltage ruggedness of P-gate GaN HEMTs
R Zhang, JP Kozak, M Xiao, J Liu, Y Zhang
IEEE Transactions on Power Electronics 35 (12), 13409-13419, 2020
1022020
True Breakdown Voltage and Overvoltage Margin of GaN Power HEMTs in Hard Switching
JP Kozak, R Zhang, Q Song, J Liu, W Saito, Y Zhang
IEEE Electron Device Letters, 2021
602021
Dynamic breakdown voltage of GaN power HEMTs
R Zhang, JP Kozak, Q Song, M Xiao, J Liu, Y Zhang
2020 IEEE International Electron Devices Meeting (IEDM), 23.3. 1-23.3. 4, 2020
502020
Stability, reliability, and robustness of GaN power devices: A review
JP Kozak, R Zhang, M Porter, Q Song, J Liu, B Wang, R Wang, W Saito, ...
IEEE Transactions on Power Electronics, 2023
472023
Robustness of cascode GaN HEMTs in unclamped inductive switching
Q Song, R Zhang, JP Kozak, J Liu, Q Li, Y Zhang
IEEE Transactions on Power Electronics 37 (4), 4148-4160, 2021
442021
Impact of accelerated stress-tests on SiC MOSFET precursor parameters
JP Kozak, KDT Ngo, DJ DeVoto, JJ Major
2018 Second International Symposium on 3D Power Electronics Integration and …, 2018
342018
Touch screens: A pressing technology
T Hoye, J Kozak
Tenth Annual Freshman Engineering Sustainability in the New Millennium …, 2010
272010
Degradation of SiC MOSFETs under High-Bias Switching Events
JP Kozak, R Zhang, J Liu, KDT Ngo, Y Zhang
IEEE Journal of Emerging and Selected Topics in Power Electronics, 2021
252021
Degradation and recovery of GaN HEMTs in overvoltage hard switching near breakdown voltage
JP Kozak, Q Song, R Zhang, Y Ma, J Liu, Q Li, W Saito, Y Zhang
IEEE Transactions on Power Electronics 38 (1), 435-446, 2022
242022
An Analytical Model for Predicting Turn-on Overshoot in Normally-off GaN HEMTs
JP Kozak, A Barchowsky, MR Hontz, NB Koganti, W Stanchina, G Reed, ...
IEEE Journal of Emerging and Selected Topics in Power Electronics, 2019
232019
Analytical and experimental optimization of external gate resistance for safe rapid turn on of normally off GaN HFETs
A Barchowsky, JP Kozak, MR Hontz, WE Stanchina, GF Reed, ZH Mao, ...
2017 IEEE Applied Power Electronics Conference and Exposition (APEC), 1958-1963, 2017
222017
A GaN-based modular multilevel DC-DC converter for high-density anode discharge power modules
A Barchowsky, JP Kozak, BM Grainger, WE Stanchina, GF Reed
2017 IEEE Aerospace Conference, 1-10, 2017
212017
Trends in SiC MOSFET threshold voltage and on-resistance measurements from thermal cycling and electrical switching stresses
JP Kozak, DJ DeVoto, JJ Major, KDT Ngo
CIPS 2018; 10th International Conference on Integrated Power Electronics …, 2018
202018
Surge energy robustness of GaN gate injection transistors
R Zhang, JP Kozak, J Liu, M Xiao, Y Zhang
2020 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2020
182020
Failure mechanisms of cascode GaN HEMTs under overvoltage and surge energy events
Q Song, R Zhang, JP Kozak, J Liu, Q Li, Y Zhang
2021 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2021
172021
Robustness of cascode GaN HEMTs under repetitive overvoltage and surge energy stresses
Q Song, R Zhang, JP Kozak, J Liu, Q Li, Y Zhang
2021 IEEE Applied Power Electronics Conference and Exposition (APEC), 363-369, 2021
142021
Robustness of GaN gate injection transistors under repetitive surge energy and overvoltage
JP Kozak, Q Song, R Zhang, J Liu, Y Zhang
2021 IEEE International Reliability Physics Symposium (IRPS), 1-5, 2021
142021
Evaluation of 650V, 100A direct-drive GaN power switch for electric vehicle powertrain applications
Q Song, JP Kozak, M Xiao, Y Ma, B Wang, R Zhang, R Volkov, K Smith, ...
2021 IEEE 8th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2021
122021
Hard-switched overvoltage robustness of p-gate GaN HEMTs at increasing temperatures
JP Kozak, R Zhang, J Liu, Q Song, M Xiao, Y Zhang
2020 IEEE Energy Conversion Congress and Exposition (ECCE), 677-682, 2020
122020
IEEE International Reliability Physics Symposium (IRPS)
R Zhang, JP Kozak, J Liu, M Xiao, Y Zhang
Dallas, TX, 2020
102020
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