Farshad Firouzi
Farshad Firouzi
Geverifieerd e-mailadres voor duke.edu
TitelGeciteerd doorJaar
Towards fog-driven IoT eHealth: Promises and challenges of IoT in medicine and healthcare
B Farahani, F Firouzi, V Chang, M Badaroglu, N Constant, K Mankodiya
Future Generation Computer Systems 78, 659-676, 2018
2322018
Internet-of-Things and big data for smarter healthcare: from device to architecture, applications and analytics
F Firouzi, AM Rahmani, K Mankodiya, M Badaroglu, GV Merrett, P Wong, ...
Future Generation Computer Systems 78, 583-586, 2018
702018
NBTI mitigation by optimized NOP assignment and insertion
F Firouzi, S Kiamehr, MB Tahoori
Proceedings of the Conference on Design, Automation and Test in Europe, 218-223, 2012
442012
An accurate model for soft error rate estimation considering dynamic voltage and frequency scaling effects
F Firouzi, ME Salehi, F Wang, SM Fakhraie
Microelectronics Reliability 51 (2), 460-467, 2011
312011
Representative critical-path selection for aging-induced delay monitoring
F Firouzi, F Ye, K Chakrabarty, MB Tahoori
2013 IEEE International Test Conference (ITC), 1-10, 2013
302013
Power-aware minimum NBTI vector selection using a linear programming approach
F Firouzi, S Kiamehr, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2012
292012
Aging-aware timing analysis considering combined effects of NBTI and PBTI
S Kiamehr, F Firouzi, MB Tahoori
International Symposium on Quality Electronic Design (ISQED), 53-59, 2013
282013
A linear programming approach for minimum NBTI vector selection
F Firouzi, S Kiamehr, MB Tahoori
Proceedings of the 21st edition of the great lakes symposium on Great lakes …, 2011
282011
Reducing NBTI-induced processor wearout by exploiting the timing slack of instructions
F Oboril, F Firouzi, S Kiamehr, M Tahoori
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware …, 2012
252012
Incorporating the impacts of workload-dependent runtime variations into timing analysis
F Firouzi, S Kiamehr, M Tahoori, S Nassif
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2013
242013
Statistical analysis of BTI in the presence of process-induced voltage and temperature variations
F Firouzi, S Kiamehr, MB Tahoori
2013 18th Asia and South Pacific Design Automation Conference (ASP-DAC), 594-600, 2013
212013
Aging-and variation-aware delay monitoring using representative critical path selection
F Firouzi, F Ye, K Chakrabarty, MB Tahoori
ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (3), 39, 2015
192015
On-line prediction of NBTI-induced aging rates
R Baranowski, F Firouzi, S Kiamehr, C Liu, M Tahoori, HJ Wunderlich
Proceedings of the 2015 Design, Automation & Test in Europe Conference …, 2015
192015
Input and transistor reordering for NBTI and HCI reduction in complex CMOS gates
S Kiamehr, F Firouzi, MB Tahoori
Proceedings of the great lakes symposium on VLSI, 201-206, 2012
192012
Keynote Paper: From EDA to IoT eHealth: Promises, Challenges, and Solutions
F Firouzi, B Farahani, M Ibrahim, K Chakrabarty
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2018
182018
Architectural strategies in standard-cell design for the 7 nm and beyond technology node
JR Sherazi, Syed Muhammad Yasser, Bharani Chava, Peter Debacker, Marie ...
Journal of Micro/Nanolithography, MEMS, and MOEMS, 2016
182016
Aging-aware standard cell library design
S Kiamehr, F Firouzi, M Ebrahimi, MB Tahoori
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-4, 2014
182014
Instruction reliability analysis for embedded processors
A Azarpeyvand, ME Salehi, F Firouzi, A Yazdanbakhsh, SM Fakhraie
13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and …, 2010
182010
Negative bias temperature instability-aware instruction scheduling: A cross-layer approach
F Oboril, F Firouzi, S Kiamehr, MB Tahoori
Journal of Low Power Electronics 9 (4), 389-402, 2013
132013
Extending standard cell library for aging mitigation
S Kiamehr, M Ebrahimi, F Firouzi, MB Tahoori
IET Computers & Digital Techniques 9 (4), 206-212, 2015
122015
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Artikelen 1–20