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Lee Barford
Lee Barford
Fellow, Keysight Technologies
Verified email at keysight.com
Title
Cited by
Cited by
Year
An introduction to wavelets
LA Barford, RS Fazzio, DR Smith
Hewlett Packard, 1992
641992
Model-based diagnostic system with automated procedures for next test selection
V Kanevsky, LA Barford
US Patent 6,167,352, 2000
602000
Method and apparatus for using parameters to simulate an electronic circuit
LA Barford, NH Chang, B Troyanovsky
US Patent 5,946,482, 1999
601999
Method and apparatus for extraction of nonlinear black-box behavioral models from embeddings of the time-domain measurements
LA Barford, LA Kamas, NB Tufillaro, DA Usikov
US Patent 6,850,871, 2005
562005
Revising a test suite using diagnostic efficacy evaluation
LA Barford
US Patent 7,139,676, 2006
532006
Method of controlling a device and a device controlled thereby
LA Barford, SA Newton
US Patent App. 11/933,189, 2009
482009
Method of computer-aided prediction of collisions between objects including fabrication tools and parts to be fabricated
SA Conradson, LA Barford
US Patent 5,307,282, 1994
451994
Apparatus and method for computer-aided design of sheet metal fabricated parts
SA Conradson, LA Barford, WD Fisher, MJ Weinstein, JD Wilker
US Patent 5,587,914, 1996
431996
A GRAPHICAL, LANGUAGE-BASED EDITOR FOR GENERIC SOLID MODELS REPRESENTED BY CONSTRAINTS (CAD)
LA Barford
Cornell University, 1987
411987
Construction of behavioral models for microwave devices from time domain large‐signal measurements to speed up high‐level design simulations
D Schreurs, J Wood, N Tufillaro, L Barford, DE Root
International Journal of RF and Microwave Computer‐Aided Engineering: Co …, 2003
402003
An approach for fault detection and isolation in dynamic systems from distributed measurements
EJ Manders, LA Barford, G Biswas
IEEE Transactions on instrumentation and Measurement 51 (2), 235-240, 2002
392002
Nanostructured ferrite based electronic nose sensitive to ammonia at room temperature
UB Gawas, VMS Verenkar, DR Patil
International Frequency Sensor Association (IFSA) Publishing, 2011
382011
Signal interpretation for monitoring and diagnosis, a cooling system testbed
EJ Manders, G Biswas, PJ Mosterman, LA Barford, RJ Barnett
IEEE Transactions on Instrumentation and Measurement 49 (3), 503-508, 2000
362000
Probabilistic diagnosis, in particular for embedded and remote applications
LA Barford, DR Smith
US Patent 6,691,249, 2004
322004
The construction and evaluation of behavioral models for microwave devices based on time-domain large-signal measurements
D Schreurs, J Wood, N Tufillaro, D Usikov, L Barford, DE Root
International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No …, 2000
322000
Attribute grammars in constraint‐based graphics systems
LA Barford, BT Vander Zanden
Software: Practice and Experience 19 (4), 309-328, 1989
291989
Sequential Bayesian bit error rate measurement
L Barford
IEEE Transactions on Instrumentation and measurement 53 (4), 947-954, 2004
222004
System model determination for failure detection and isolation, in particular in computer systems
LA Barford, C Zurhorst
US Patent 6,587,960, 2003
212003
A layer-oriented interface for visualizing time-series data from oscilloscopes
R Lopez-Hernandez, D Guilmaine, MJ McGuffin, L Barford
2010 IEEE Pacific Visualization Symposium (PacificVis), 41-48, 2010
202010
Fourier analysis from networked measurements using time synchronization
L Barford, J Burch
2005 IEEE Instrumentationand Measurement Technology Conference Proceedings 3 …, 2005
192005
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