Bruce F. Cockburn
Title
Cited by
Cited by
Year
Efficient architectures for 1-D and 2-D lifting-based wavelet transforms
H Liao, MK Mandal, BF Cockburn
IEEE Transactions on Signal Processing 52 (5), 1315-1326, 2004
2562004
A compact and accurate Gaussian variate generator
A Alimohammad, SF Fard, BF Cockburn, C Schlegel
IEEE transactions on very large scale integration (VLSI) systems 16 (5), 517-527, 2008
882008
Tutorial on semiconductor memory testing
BF Cockburn
Journal of Electronic Testing 5 (4), 321-336, 1994
721994
Low-power approximate multipliers using encoded partial products and approximate compressors
MS Ansari, H Jiang, BF Cockburn, J Han
IEEE journal on emerging and selected topics in circuits and systems 8 (3 …, 2018
612018
Compact Rayleigh and Rician fading simulator based on random walk processes
A Alimohammad, SF Fard, BF Cockburn, C Schlegel
IET communications 3 (8), 1333-1342, 2009
512009
An investigation into crosstalk noise in DRAM structures
M Redeker, BF Cockburn, DG Elliott
Proceedings of the 2002 IEEE International Workshop on Memory Technology …, 2002
492002
A scalable LDPC decoder ASIC architecture with bit-serial message exchange
T Brandon, R Hang, G Block, VC Gaudet, B Cockburn, S Howard, ...
Integration 41 (3), 385-398, 2008
482008
Novel architectures for the lifting-based discrete wavelet transform
H Liao, MK Mandal, BF Cockburn
IEEE CCECE2002. Canadian Conference on Electrical and Computer Engineering …, 2002
44*2002
Synthesized transparent BIST for detecting scrambled pattern-sensitive faults in RAMs
BF Cockburn, YFN Sat
Proceedings of 1995 IEEE International Test Conference (ITC), 23-32, 1995
411995
A single FPGA filter-based multipath fading emulator
SF Fard, A Alimohammad, B Cockburn, C Schlegel
GLOBECOM 2009-2009 IEEE Global Telecommunications Conference, 1-5, 2009
382009
Deterministic tests for detecting single V-coupling faults in RAMs
BF Cockburn
Journal of Electronic Testing 5 (1), 91-113, 1994
381994
Voiceband signal classifier
JS Sewall, BF Cockburn, DP Sarda
US Patent 6,708,146, 2004
342004
Modeling and hardware implementation aspects of fading channel simulators
A Alimohammad, BF Cockburn
IEEE Transactions on Vehicular Technology 57 (4), 2055-2069, 2008
332008
Improving the Accuracy and Hardware Efficiency of Neural Networks Using Approximate Multipliers
MS Ansari, V Mrazek, BF Cockburn, L Sekanina, Z Vasicek, J Han
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 28 (2), 317-328, 2020
322020
A true random number generator based on parallel STT-MTJs
Y Qu, J Han, BF Cockburn, W Pedrycz, Y Zhang, W Zhao
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017
292017
Design, evaluation and fault-tolerance analysis of stochastic FIR filters
R Wang, J Han, BF Cockburn, DG Elliott
Microelectronics Reliability 57, 111-127, 2016
292016
Design and test of a 175-Mb/s, rate-1/2 (128, 3, 6) low-density parity-check convolutional code encoder and decoder
R Swamy, S Bates, TL Brandon, BF Cockburn, DG Elliott, JC Koob, ...
IEEE journal of solid-state circuits 42 (10), 2245-2256, 2007
282007
A comparative simulation study of four multilevel DRAMs
G Birk, DG Elliott, BF Cockburn
Records of the 1999 IEEE International Workshop on Memory Technology, Design …, 1999
281999
Method and apparatus for testing electronic memories for the presence of multiple cell coupling faults
BF Cockburn
US Patent 5,506,959, 1996
281996
Deterministic tests for detecting scrambled pattern-sensitive faults in RAMs
BF Cockburn
Records of the 1995 IEEE International Workshop on Memory Technology, Design …, 1995
281995
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Articles 1–20