| Si-Ge CMOS semiconductor device J Schmitz, PH Woerlee US Patent 6,271,551, 2001 | 270 | 2001 |
| A silicon-based electrical source of surface plasmon polaritons RJ Walters, RVA van Loon, I Brunets, J Schmitz, A Polman Nature materials 9 (1), 21-25, 2010 | 249 | 2010 |
| The charge plasma PN diode RJE Hueting, B Rajasekharan, C Salm, J Schmitz IEEE electron device letters 29 (12), 1367-1369, 2008 | 216 | 2008 |
| Fabrication and characterization of the charge-plasma diode B Rajasekharan, RJE Hueting, C Salm, T van Hemert, RAM Wolters, ... IEEE electron device letters 31 (6), 528-530, 2010 | 184 | 2010 |
| Electron, pion and multiparticle detection with a lead/scintillating-fiber calorimeter D Acosta, S Buontempo, L Caloba, M Caria, R DeSalvo, A Ereditato, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1991 | 176 | 1991 |
| An electron-multiplying ‘Micromegas’ grid made in silicon wafer post-processing technology M Chefdeville, P Colas, Y Giomataris, H van der Graaf, EHM Heijne, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2006 | 119 | 2006 |
| Detection of single electrons by means of a Micromegas-covered MediPix2 pixel CMOS readout circuit M Campbell, M Chefdeville, P Colas, AP Colijn, A Fornaini, Y Giomataris, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2005 | 102 | 2005 |
| Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors HP Tuinhout, AH Montree, J Schmitz, PA Stolk International Electron Devices Meeting. IEDM Technical Digest, 631-634, 1997 | 93 | 1997 |
| Method of manufacturing a nonvolatile memory AH Montree, J Schmitz, PH Woerlee US Patent 6,251,729, 2001 | 91 | 2001 |
| The readout of a GEM or Micromegas-equipped TPC by means of the Medipix2 CMOS sensor as direct anode P Colas, AP Colijn, A Fornaini, Y Giomataris, H Van der Graaf, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2004 | 90 | 2004 |
| Characterization of dielectric charging in RF MEMS capacitive switches RW Herfst, HGA Huizing, PG Steeneken, J Schmitz 2006 IEEE International Conference on Microelectronic Test Structures, 133-136, 2006 | 77 | 2006 |
| Localizing particles showering in a Spaghetti calorimeter D Acosta, S Buontempo, L Caloba, M Caria, R DeSalvo, A Ereditato, ... Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 1991 | 75 | 1991 |
| RF capacitance-voltage characterization of MOSFETs with high leakage dielectrics J Schmitz, FN Cubaynes, RJ Havens, R De Kort, AJ Scholten, ... IEEE electron device letters 24 (1), 37-39, 2003 | 71 | 2003 |
| Growth kinetics and oxidation mechanism of ALD TiN thin films monitored by in situ spectroscopic ellipsometry H Van Bui, AW Groenland, AAI Aarnink, RAM Wolters, J Schmitz, ... Journal of the Electrochemical Society 158 (3), H214, 2011 | 64 | 2011 |
| Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells MK Stodolny, J Anker, BLJ Geerligs, GJM Janssen, BWH Van De Loo, ... Energy Procedia 124, 635-642, 2017 | 62 | 2017 |
| Time and voltage dependence of dielectric charging in RF MEMS capacitive switches RW Herfst, PG Steeneken, J Schmitz 2007 IEEE International Reliability Physics Symposium Proceedings. 45th …, 2007 | 58 | 2007 |
| The electrical conduction and dielectric strength of SU-8 J Melai, C Salm, S Smits, J Visschers, J Schmitz Journal of micromechanics and microengineering 19 (6), 065012, 2009 | 56 | 2009 |
| Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches RW Herfst, PG Steeneken, J Schmitz, AJG Mank, M Van Gils 2008 IEEE International Reliability Physics Symposium, 492-495, 2008 | 53 | 2008 |
| Adding functionality to microchips by wafer post-processing J Schmitz Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007 | 50 | 2007 |
| Strong efficiency improvement of SOI-LEDs through carrier confinement T Hoang, P LeMinh, J Holleman, J Schmitz IEEE electron device letters 28 (5), 383-385, 2007 | 50 | 2007 |
Cora SalmUniversity of TwenteVerified email at utwente.nl
