| Evolution of random access process: From Legacy networks to 5G and beyond WT Toor, A Basit, N Maroof, SA Khan, M Saadi Transactions on Emerging Telecommunications Technologies 33 (6), e3776, 2022 | 17 | 2022 |
| An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation SA Khan, C Lim, G Bak, S Baeg, S Lee Microelectronics Reliability 69, 100-108, 2017 | 5 | 2017 |
| Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation SA Khan, SJ Wen, S Baeg IEICE Electronics Express 13 (17), 20160627-20160627, 2016 | 5 | 2016 |
| A Novel Dissimilarity of Activity Biomarker and Functional Connectivity Analysis for the Epilepsy Diagnosis AAK Abdul Basit, Saqib Ali Khan, Waqas Tariq Toor, Naeem Maroof, Muhammad Saadi Symmetry 11 (8), 979, 2019 | 2 | 2019 |
| Reversible encryption and lossless data hiding for medical imaging aiding smart health care A Basit, WT Toor, M Saadi, N Maroof, SA Khan, SA Otaibi Cluster Computing 26 (5), 2977-2991, 2023 | 1 | 2023 |
| Proton and Neutron SEB Testing and Electrical Analysis on 4H-SiC MOSFETs and Diodes YK Dongwoo Bae, Saqib Ali Khan, Kiseog Kim, Sung S. Chung, Joongsik Kih ... RADiation Effects on Components and Systems (RADECS), 2023 | | 2023 |
| Synergism between STress and Cosmic Ray Neutron Irradiation in 650V RAted IGBTs for Automotive Applications YK Dongwoo Bae, Saqib Ali Khan, Sung S. Chung, Joongsik Kih, Seungjoo Woo ... IEEE NUCLEAR AND SPACE RADIATION EFFECTS CONFERENCE, 2023 | | 2023 |
| Evaluation of Neutron Radiation Impact for 1200V class 4H-SiC MOSFET at Gate Switching Mode with TCAD Simulation Y Bae, Dongwoo and Kim, Kiseog and Lee, Hyeokjae and Chung, Sung S. and Kih ... IEEE Transactions on Nuclear Science, 2023 | | 2023 |
| A semiconductor device radiation test method, and a semiconductor device radiation test system SS Kim Young Boo, Chung Sung Soo, Kih Joongsik, Kim Ki Seog, Lee Hyeokjae ... KR Patent 10-2,418,633, 2022 | | 2022 |
| A semiconductor device inspection method, a semiconductor device radiation test system, a test beam evaluation method, and a test beam evaluation system using reference … Kim Young Boo, Chung Sung Soo, Kih Joongsik, Kim Ki Seog, Lee Hyeokjae, Kim ... KR Patent 10-2,418,634, 2022 | | 2022 |
| Architectural design tradeoffs in SRAM-based TCAMs A Ahmed, K Park, SA Khan, N Maroof, S Baeg IEICE Electronics Express 16 (13), 20190267-20190267, 2019 | | 2019 |
Naeem MaroofUniversity of JeddahGeverifieerd e-mailadres voor uj.edu.sa
