| Diffusion in strained Si (Ge) NEB Cowern, PC Zalm, P Van der Sluis, DJ Gravesteijn, WB De Boer Physical Review Letters 72 (16), 2585, 1994 | 320 | 1994 |
| Impurity diffusion via an intermediate species: The B-Si system NEB Cowern, KTF Janssen, GFA Van de Walle, DJ Gravesteijn Physical review letters 65 (19), 2434, 1990 | 209 | 1990 |
| Experiments on atomic-scale mechanisms of diffusion NEB Cowern, GFA Van de Walle, DJ Gravesteijn, CJ Vriezema Physical review letters 67 (2), 212, 1991 | 186 | 1991 |
| Microscale elastic‐strain determination by backscatter Kikuchi diffraction in the scanning electron microscope KZ Troost, P Van Der Sluis, DJ Gravesteijn Applied Physics Letters 62 (10), 1110-1112, 1993 | 172 | 1993 |
| Ge segregation at Si/Si1−xGex interfaces grown by molecular beam epitaxy PC Zalm, GFA Van De Walle, DJ Gravesteijn, AA Van Gorkum Applied physics letters 55 (24), 2520-2522, 1989 | 133 | 1989 |
| Non-local impact ionization in silicon devices JW Slotboom, G Streutker, MJ Van Dort, PH Woerlee, A Pruijmboom, ... International Electron Devices Meeting 1991 [Technical Digest], 127-130, 1991 | 124 | 1991 |
| Materials developments for write-once and erasable phase-change optical recording DJ Gravesteijn Applied optics 27 (4), 736-738, 1988 | 118 | 1988 |
| Parasitic energy barriers in SiGe HBTs JW Slotboom, G Streutker, A Pruijmboom, DJ Gravesteijn IEEE Electron device letters 12 (9), 486-488, 1991 | 117 | 1991 |
| Kinetics and mechanism of low temperature atomic oxygen-assisted oxidation of SiGe layers C Tetelin, X Wallart, JP Nys, L Vescan, DJ Gravesteijn Journal of Applied Physics 83 (5), 2842-2846, 1998 | 80 | 1998 |
| Heterojunction bipolar transistors with SiGe base grown by molecular beam epitaxy A Pruijmboom, JW Slotboom, DJ Gravesteijn, CW Fredriksz, ... IEEE electron device letters 12 (7), 357-359, 1991 | 74 | 1991 |
| Diffusion and Electrical Properties of Boron and Arsenic Doped Poly‐Si and Poly‐Ge x Si1− x (x∼ 0.3) as Gate Material for Sub‐0.25 μm Complementary Metal Oxide Semiconductor … C Salm, DT Van Veen, DJ Gravesteijn, J Holleman, PH Woerlee Journal of the Electrochemical Society 144 (10), 3665, 1997 | 72 | 1997 |
| Evidence of the thermo-electric Thomson effect and influence on the program conditions and cell optimization in phase-change memory cells DT Castro, L Goux, GAM Hurkx, K Attenborough, R Delhougne, J Lisoni, ... 2007 IEEE International Electron Devices Meeting, 315-318, 2007 | 64 | 2007 |
| Characterization of low-energy (100 eV–10 keV) boron ion implantation EJH Collart, K Weemers, DJ Gravesteijn, JGM Van Berkum Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1998 | 64 | 1998 |
| Single wavelength optical recording in pure, solvent coated infrared dye layers DJ Gravesteijn, C Steenbergen, J Van der Veen Optical Storage Media 420, 327-331, 1983 | 64 | 1983 |
| Recording element having a pyrylium or thiopyrylium-squarylium dye layer and new pyrylium or thiopyrylium-squarylium compounds DJ Gravesteijn, C Steenbergen, J van der Veen, WPM Nijssen US Patent 4,508,811, 1985 | 63 | 1985 |
| RF characterization and analytical modelling of through silicon vias and coplanar waveguides for 3D integration YPR Lamy, KB Jinesh, F Roozeboom, DJ Gravesteijn, WFA Besling IEEE Transactions on Advanced Packaging 33 (4), 1072-1079, 2010 | 59 | 2010 |
| Gas phase sensing of alcohols by Metal Organic Framework–polymer composite materials S Sachdeva, SJH Koper, A Sabetghadam, D Soccol, DJ Gravesteijn, ... ACS applied materials & interfaces 9 (29), 24926-24935, 2017 | 56 | 2017 |
| Polymer–metal organic framework composite films as affinity layer for capacitive sensor devices S Sachdeva, D Soccol, DJ Gravesteijn, F Kapteijn, EJR Sudhölter, ... ACS sensors 1 (10), 1188-1192, 2016 | 56 | 2016 |
| Degradation of the reset switching during endurance testing of a phase-change line cell L Goux, DT Castro, GAM Hurkx, JG Lisoni, R Delhougne, DJ Gravesteijn, ... IEEE Transactions on Electron Devices 56 (2), 354-358, 2009 | 56 | 2009 |
| The interaction of Sb overlayers with Si (001) WFJ Slijkerman, PM Zagwijn, JF Van der Veen, DJ Gravesteijn, ... Surface science 262 (1-2), 25-32, 1992 | 56 | 1992 |
