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Yin Sun
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Year
Tunneling contact IGZO TFTs with reduced saturation voltages
L Wang, Y Sun, X Zhang, L Zhang, S Zhang, M Chan
Applied Physics Letters 110 (15), 2017
342017
Measurement methodologies for acoustic noise induced by multilayer ceramic capacitors of power distribution network in mobile systems
Y Sun, S Wu, J Zhang, C Hwang, Z Yang
IEEE Transactions on Electromagnetic Compatibility 62 (4), 1515-1523, 2020
202020
Jitter-aware economic pdn optimization with a genetic algorithm
Z Xu, Z Wang, Y Sun, C Hwang, H Delingette, J Fan
IEEE Transactions on Microwave Theory and Techniques 69 (8), 3715-3725, 2021
162021
Simulation methodologies for acoustic noise induced by multilayer ceramic capacitors of power distribution network in mobile systems
Y Sun, S Wu, J Zhang, C Hwang, Z Yang
IEEE Transactions on Electromagnetic Compatibility 63 (2), 589-597, 2020
152020
Mechanism and validation of USB 3.0 connector caused radio frequency interference
Y Sun, H Lin, BC Tseng, D Pommerenke, C Hwang
IEEE Transactions on Electromagnetic Compatibility 62 (4), 1169-1178, 2019
152019
RFI noise source quantification based on reciprocity
Y Sun, BC Tseng, H Lin, C Hwang
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and …, 2018
152018
Jitter-aware target impedance
Y Sun, J Kim, C Hwang
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2019
142019
Characterization of interface trap dynamics responsible for hysteresis in organic thin-film transistors
Y Sun, L Zhang, Z Ahmed, M Chan
Organic Electronics 27, 192-196, 2015
142015
Analyzing multiple vias in a parallel-plate pair based on a nonorthogonal PEEC method
X Sun, T Huang, L Ye, Y Sun, S Jin, J Fan
IEEE Transactions on Electromagnetic Compatibility 61 (5), 1602-1611, 2018
122018
Measurement investigation on acoustic noise caused by “singing” capacitors on mobile devices
Y Sun, J Zhang, Z Yang, C Hwang, S Wu
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2019
112019
Causality analyzing for transmission line with surface roughness
X Sun, Y Guo, Y Sun, K Song, L Ye, X Ye, JL Drewniak, J Fan
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2019
112019
A generalized power supply induced jitter model based on power supply rejection ratio response
Y Sun, J Lee, C Hwang
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 29 (6 …, 2021
92021
Improved target impedance concept with jitter specification
Y Sun, J Kim, M Ouyang, C Hwang
IEEE Transactions on Electromagnetic Compatibility 62 (4), 1534-1545, 2020
92020
Modeling stripline with slotted ground plane in multilayered circuit board using PEEC formulation
L Ye, X Sun, T Huang, Y Sun, S Jin, B Chen, J Fan
IEEE Transactions on Electromagnetic Compatibility 62 (1), 280-284, 2019
92019
Mechanism analysis on radio frequency radiation in IC/package with bonding wires
M Ouyang, Y Sun, J Lee, J Kim, C Hwang
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
72020
An efficient approach to find the truncation frequency for transmission line-based dielectric material property extraction
X Sun, L Ye, K Song, Y Sun, S Jin, B Chen, M Tsiklauri, X Ye, J Fan
2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and …, 2018
72018
Decoupling capacitor layout design guidelines for acoustic noise consideration in power distribution network
Y Sun, S Wu, J Zhang, C Hwang, Z Yang
2020 IEEE International Symposium on Electromagnetic Compatibility & Signal …, 2020
62020
Simulation Investigation on Acoustic Noise Caused by “Singing” Capacitors on Mobile Devices
Y Sun, J Zhang, Z Yang, C Hwang, S Wu
2019 IEEE International Symposium on Electromagnetic Compatibility, Signal …, 2019
62019
Modeling of power supply noise associated with package parasitics in an on-chip ldo regulator
J Joo, Y Sun, J Lee, S Kong, S Kang, I Song, C Hwang
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 395-399, 2021
52021
Improving power supply induced jitter simulation accuracy for IBIS model
Y Sun, C Hwang
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium, 1127-1132, 2021
32021
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