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Divya Prasad
Divya Prasad
AMD Inc
Verified email at amd.com
Title
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Cited by
Year
Buried Power Rails and Back-side Power Grids: Arm® CPU Power Delivery Network Design Beyond 5nm
D Prasad, SST Nibhanupudi, S Das, O Zografos, B Chehab, S Sarkar, ...
2019 IEEE International Electron Devices Meeting (IEDM), 19.1. 1-19.1. 4, 2019
642019
Adapting interconnect technology to multigate transistors for optimum performance
D Prasad, A Ceyhan, C Pan, A Naeemi
IEEE Transactions on Electron Devices 62 (12), 3938-3944, 2015
222015
A 64-bit arm CPU at cryogenic temperatures: Design technology co-optimization for power and performance
R Saligram, D Prasad, D Pietromonaco, A Raychowdhury, B Cline
2021 IEEE Custom Integrated Circuits Conference (CICC), 1-2, 2021
152021
Impact of interconnect variability on circuit performance in advanced technology nodes
D Prasad, C Pan, A Naeemi
2016 17th International Symposium on Quality Electronic Design (ISQED), 398-404, 2016
152016
A high-density logic-on-logic 3DIC design using face-to-face hybrid wafer-bonding on 12nm FinFET process
S Sinha, S Hung, D Fisher, X Xu, C Chao, P Chandupatla, F Frederick, ...
2020 IEEE International Electron Devices Meeting (IEDM), 15.1. 1-15.1. 4, 2020
132020
Modeling interconnect variability at advanced technology nodes and potential solutions
D Prasad, C Pan, A Naeemi
IEEE Transactions on Electron Devices 64 (3), 1246-1253, 2017
102017
Cryo-computing for infrastructure applications: A technology-to-microarchitecture co-optimization study
D Prasad, M Vangala, M Bhargava, A Beckers, A Grill, D Tierno, ...
2022 International Electron Devices Meeting (IEDM), 23.5. 1-23.5. 4, 2022
92022
A holistic evaluation of buried power rails and back-side power for sub-5 nm technology nodes
SST Nibhanupudi, D Prasad, S Das, O Zografos, A Robinson, A Gupta, ...
IEEE Transactions on Electron Devices 69 (8), 4453-4459, 2022
92022
Interconnect design and technology optimization for conventional and emerging nanoscale devices: A physical design perspective
D Prasad, A Naeemi
2018 IEEE International Electron Devices Meeting (IEDM), 5.1. 1-5.1. 4, 2018
92018
Power from Below: Buried Interconnects Will Help Save Moore's Law
B Cline, D Prasad, E Beyne, O Zografos
IEEE Spectrum 58 (9), 46-51, 2021
82021
Crafting power aware coverage: verification closure with UPF IEEE 1801
P Khondkar, P Yeung, D Prasad, G Chidolue, M Bhargava
Journal of VLSI Design and Verification, 6-17, 2017
62017
Interconnect design for evolutionary, and revolutionary transistor technologies
D Prasad, A Naeemi
2017 IEEE International Interconnect Technology Conference (IITC), 1-3, 2017
42017
Systems, Devices, and Methods for Dedicated Low Temperature Design and Operation
DMS Prasad, DV Pietromonaco, BT Cline
US Patent App. 17/798,518, 2023
12023
Wirelength distribution schemes and techniques
DMS Prasad, SP Sinha, BT Cline, SL Moore
US Patent 10,657,218, 2020
12020
Accurate processor-level wirelength distribution model for technology pathfinding using a modernized interpretation of rent's rule
D Prasad, S Sinha, B Cline, S Moore, A Naeemi
Proceedings of the 55th Annual Design Automation Conference, 1-6, 2018
12018
A novel performance model for state-of-the-art processors by modernization of Rent's rule
D Prasad, S Sinha, B Cline, S Moore, A Naeemi
2017 IEEE International Electron Devices Meeting (IEDM), 20.6. 1-20.6. 4, 2017
12017
Devices, systems, and methods for detecting and mitigating silent data corruptions via adaptive voltage-frequency scaling
DMS Prasad, S Gurumurthi, Y Eckert, JR Rearick, S Gurumurthy, A Mehra, ...
US Patent 11,966,283, 2024
2024
Systems, Devices, and Methods of Charge-Based Storage Elements
DMS Prasad, DV Pietromonaco, BT Cline, M Bhargave
US Patent App. 17/902,798, 2024
2024
Systems, Devices, and Methods of Cache Memory
DMS Prasad, K Nathella, DV Pietromonaco
US Patent App. 17/866,448, 2024
2024
Paradigm Shift in Semiconductor Technology Scaling Calling for Advancements in Design Modelling
D Prasad, G Kini, S Chandrasekaran, S Gurumurthi, A Novak, T Burd
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
2023
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