Seyab Khan
Seyab Khan
Geverifieerd e-mailadres voor tudelft.nl
TitelGeciteerd doorJaar
Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
H Kükner, S Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, ...
IEEE transactions on device and materials reliability 14 (1), 182-193, 2013
432013
Fouling resistance model for prediction of CaCO3 scaling in AISI 316 tubes
MS Khan, SM Zubair, MO Budair, AK Sheikh, A Quddus
Heat and mass transfer 32 (1-2), 73-79, 1996
431996
Bias temperature instability analysis of FinFET based SRAM cells
S Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor
Proceedings of the conference on Design, Automation & Test in Europe, 31, 2014
422014
BTI impact on logical gates in nano-scale CMOS technology
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012
402012
Trends and challenges of SRAM reliability in the nano-scale era
S Khan, S Hamdioui
5th International Conference on Design & Technology of Integrated Systems in …, 2010
332010
Modeling and mitigating NBTI in nanoscale circuits
S Khan, S Hamdioui
2011 IEEE 17th International On-Line Testing Symposium, 1-6, 2011
262011
Temperature dependence of NBTI induced delay
S Khan, S Hamdioui
2010 IEEE 16th International On-Line Testing Symposium, 15-20, 2010
222010
NBTI monitoring and design for reliability in nanoscale circuits
S Khan, NZ Haron, S Hamdioui, F Catthoor
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011
152011
BTI impact on SRAM sense amplifier
I Agbo, S Khan, S Hamdioui
2013 8th IEEE Design and Test Symposium, 1-6, 2013
142013
Incorporating parameter variations in BTI impact on nano-scale logical gates analysis
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012
132012
Temperature impact on NBTI modeling in the framework of technology scaling
MS Khan, S Hamdioui
2nd HiPEAC Workshop on Design for Reliability 24, 2010
102010
Impact of partial resistive defects and bias temperature instability on SRAM decoder reliablity
S Khan, M Taouil, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2013 8th IEEE Design and Test Symposium, 1-6, 2013
72013
NBTI Modeling in the Framework of Temperature Variation
S Khan, S Hamdioui
Proc. of Design and Test in Europe (DATE), 978-981, 2010
52010
Bias temperature instability analysis in SRAM decoder
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2013 18th IEEE European Test Symposium (ETS), 1-1, 2013
22013
Comparitive BTI Analysis in Nano-scale Circuits Lifetime
S Khan, S Hamdioui, F Catthoor
Proceedings of the 4th Workshop on Design for Reliability, 2012
22012
Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits
MSK Seyab
12013
ReverseAge: An online NBTI combating technique using time borrowing
S Khan, S Hamdioui
2011 IEEE 6th International Design and Test Workshop (IDT), 36-41, 2011
12011
Analyzing Combined Impacts of Parameter Variations and BTI in Nano-scale Logical Gates
S Khan, S Hamdioui
1st Workshop on Manufacturable and Dependable Multicore Architectures at …, 2012
2012
NBTI-Aware Nanoscaled Circuit Delay Assessment and Mitigation
S Khan, S Hamdioui
3rd HiPEAC Workshop on Design for Reliability, 2011
2011
Model list of essential medicines 16th list.
TM Vijayakumar, D Sathyavati, T Subhashini, S Grandhi, MD Dhanaraju, ...
International Journal of Pharmacology 7 (1), 436-443, 2006
2006
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