Gian Piero Gibiino
Title
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Cited by
Year
A double-pulse technique for the dynamic I/V characterization of GaN FETs
A Santarelli, R Cignani, GP Gibiino, D Niessen, PA Traverso, C Florian, ...
IEEE microwave and wireless components letters 24 (2), 132-134, 2013
532013
Compact behavioral models of nonlinear active devices using response surface methodology
P Barmuta, F Ferranti, GP Gibiino, A Lewandowski, DMMP Schreurs
IEEE Transactions on Microwave Theory and Techniques 63 (1), 56-64, 2014
292014
GaN FET Nonlinear Modeling Based on Double PulseCharacteristics
A Santarelli, D Niessen, R Cignani, GP Gibiino, PA Traverso, C Florian, ...
IEEE Transactions on Microwave Theory and Techniques 62 (12), 3262-3273, 2014
262014
Charge-controlled GaN FET modeling by displacement current integration from frequency-domain NVNA measurements
D Niessen, GP Gibiino, R Cignani, A Santarelli, DMMP Schreurs, F Filicori
IEEE Transactions on Microwave Theory and Techniques 64 (12), 4382-4393, 2016
172016
A three-port nonlinear dynamic behavioral model for supply-modulated RF PAs
GP Gibiino, G Avolio, DMMP Schreurs, A Santarelli, F Filicori
IEEE Transactions on Microwave Theory and Techniques 64 (1), 133-147, 2015
152015
Nonlinear charge trapping effects on pulsed I/V characteristics of GaN FETs
A Santarelli, R Cignani, GP Gibiino, D Niessen, PA Traverso, C Florian, ...
European Microwave Integrated Circuits Conference (EuMIC), 2013, 404-407, 2013
142013
A GaN HEMT global large-signal model including charge trapping for multibias operation
GP Gibiino, A Santarelli, F Filicori
IEEE Transactions on Microwave Theory and Techniques 66 (11), 4684-4697, 2018
122018
A compact measurement set-up for envelope-tracking RF PAs with calibrated sensing of baseband V/I at the supply terminal
J Couvidat, GP Gibiino, G Pailloncy, MV Bossche, A Ghiotto, D Schreurs
2015 86th ARFTG Microwave Measurement Conference, 1-4, 2015
92015
Multi-bias nonlinear characterization of GaN FET trapping effects through a multiple pulse time domain network analyzer
A Santarelli, R Cignani, D Niessen, GP Gibiino, PA Traverso, D Schreurs, ...
2015 10th European Microwave Integrated Circuits Conference (EuMIC), 81-84, 2015
92015
Mixer-like modeling with dynamic baseband characterization for supply-modulated PAs
GP Gibiino, G Avolio, D Schreurs, A Santarelli, F Filicori
2014 44th European Microwave Conference, 1313-1316, 2014
82014
Two-input nonlinear dynamic model inversion for the linearization of envelope-tracking RF PAs
GP Gibiino, A Santarelli, D Schreurs, F Filicori
IEEE Microwave and Wireless Components Letters 27 (1), 79-81, 2016
72016
Design of experiments using centroidal Voronoi tessellation
P Barmuta, GP Gibiino, F Ferranti, A Lewandowski, DMMP Schreurs
IEEE Transactions on Microwave Theory and Techniques 64 (11), 3965-3973, 2016
72016
A two-port nonlinear dynamic behavioral model of RF PAs subject to wideband load modulation
GP Gibiino, K Łukasik, P Barmuta, A Santarelli, DMMP Schreurs, F Filicori
IEEE Transactions on Microwave Theory and Techniques 66 (2), 831-844, 2017
62017
Supply-terminal 40 MHz BW characterization of impedance-like nonlinear functions for envelope tracking PAs
GP Gibiino, J Couvidat, G Avolio, D Schreurs, A Santarelli
2016 87th ARFTG Microwave Measurement Conference (ARFTG), 1-4, 2016
62016
Measurement-based automatic extraction of FET parasitic network by linear regression
GP Gibiino, A Santarelli, R Cignani, PA Traverso, F Filicori
IEEE Microwave and Wireless Components Letters 29 (9), 598-600, 2019
52019
Isotrap PulsedCharacterization of GaN HEMTs for PA Design
GP Gibiino, C Florian, A Santarelli, T Cappello, Z Popović
IEEE Microwave and Wireless Components Letters 28 (8), 672-674, 2018
52018
Nonlinear behavioral models of HEMTs using response surface methodology
P Barmuta, GP Gibiino, F Ferranti, A Lewandowski, D Schreurs
2014 International Conference on Numerical Electromagnetic Modeling and …, 2014
52014
Automatic Extraction of Measurement-Based Large-Signal FET Models by Nonlinear Function Sampling
TM Martín-Guerrero, A Santarelli, GP Gibiino, PA Traverso, ...
IEEE Transactions on Microwave Theory and Techniques 68 (5), 1627-1636, 2020
42020
Microwave Characterization of Trapping Effects in 100-nm GaN-on-Si HEMT Technology
GP Gibiino, AM Angelotti, A Santarelli, C Florian
IEEE Microwave and Wireless Components Letters 29 (9), 604-606, 2019
42019
Characterization and modeling of RF GaN switches accounting for trap-induced degradation under operating regimes
C Florian, GP Gibiino, A Santarelli
IEEE Transactions on Microwave Theory and Techniques 66 (12), 5491-5500, 2018
42018
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