Halil Kükner
Halil Kükner
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Comparison of Reaction-Diffusion and Atomistic Trap-based BTI Models for Logic Gates
H Kukner, S Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, ...
TDMR: IEEE Transactions on Device and Materials Reliability 14 (1), 182-193, 2014
Defect-based Methodology for Workload-dependent Circuit Lifetime Projections – Application to SRAM
P Weckx, B Kaczer, M Toledano-Luque, T Grasser, PJ Roussel, H Kukner, ...
IRPS'13: IEEE Int. Reliability Physics Symposium, 2013
Bias Temperature Instability Analysis of FinFET based SRAM cells
S Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor
DATE'14: 17th Design, Automation & Test in Europe Conference, 2014
Dynamically variable step search motion estimation algorithm and a dynamically reconfigurable hardware for its implementation
O Tasdizen, A Akin, H Kukner, I Hamzaoglu
IEEE Transactions on Consumer Electronics 55 (3), 1645-1653, 2009
BTI Impacts on Logical Gates in Nano-scale CMOS Technology
S Khan, S Hamdioui, H Kukner, F Catthoor, P Raghavan
DDECS'12: 15th IEEE Symposium on Design and Diagnostics of Electronic …, 2012
Integral Impact of BTI, PVT Variation, and Workload on SRAM Sense Amplifier
I Agbo, M Taouil, D Kraak, S Hamdioui, H Kükner, P Weckx, P Raghavan, ...
TVLSI: IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017
Degradation Analysis of Datapath Logic Subblocks under NBTI Aging in FinFET Technology
H Kükner, M Khatib, S Morrison, P Weckx, P Raghavan, B Kaczer, ...
ISQED'14: IEEE 15th International Symposium on Quality Electronic Design, 2014
Generic, orthogonal and low-cost March Element based memory BIST
AJ van de Goor, S Hamdioui, H Kukner
ITC'11: IEEE International Test Conference, 1-10, 2011
Scaling of BTI reliability in presence of time-zero variability
H Kukner, P Weckx, J Franco, M Toledano-Luque, M Cho, B Kaczer, ...
IRPS'14: 52nd IEEE International Reliability Physics Symposium, CA. 5.1-CA. 5.7, 2014
Non-Monte-Carlo Methodology for High-Sigma Simulations of Circuits Under Workload-Dependent BTI Degradation—Application to 6T SRAM
P Weckx, B Kaczer, H Kukner, PJ Roussel, P Raghavan, F Catthoor, ...
IRPS'14: IEEE 52nd International Reliability Physics Symposium, 2014
Integral Impact of BTI and Voltage Temperature variation on SRAM Sense Amplifier
I Agbo, M Taouil, S Hamdioui, H Kukner, P Raghavan, F Catthoor
VTS'15: IEEE VLSI Test Symposium, Napa, CA, USA, 2015
Incorporating Parameter Variations in BTI Impact on Nano-scale Logical Gates Analysis
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
DFT’12: IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2012
The defect-centric perspective of device and circuit reliability—From individual defects to circuits
B Kaczer, J Franco, P Weckx, PJ Roussel, E Bury, M Cho, R Degraeve, ...
ESSDERC'15: 45th European Solid State Device Research Conference, 218-225, 2015
Impact of partial resistive defects and Bias Temperature Instability on SRAM decoder reliablity
S Khan, M Taouil, S Hamdioui, H Kukner, P Raghavan, F Catthoor
IDT'13: IEEE 8th International Design and Test Symposium, 1-6, 2013
Optimizing memory BIST Address Generator implementations
AJ van de Goor, H Kukner, S Hamdioui
DTIS'11: 6th IEEE International Conference on Design & Technology of …, 2011
The impact of process variation and stochastic aging in nanoscale VLSI
S Kiamehr, P Weckx, M Tahoori, B Kaczer, H Kukner, P Raghavan, ...
IRPS'16: IEEE International Reliability Physics Symposium, CR-1-1-CR-1-6, 2016
BTI Reliability from Planar to FinFET nodes: Will the next node be more or less reliable?
H Kukner, P Weckx, P Raghavan, B Kaczer, D Jang, F Catthoor, ...
MEDIAN'14: 3rd Workshop on Manufacturable and Dependable Multicore …, 2014
High performance hardware architectures for a hexagon-based motion estimation algorithm
Ö Taşdizen, A Akın, HS Kükner, İ Hamzaoğlu, F Uğurdağ
VLSI-SoC'08: 16th IFIP/IEEE International Conference on Very Large Scale …, 2008
Impact of duty factor, stress stimuli, gate and drive strength on gate delay degradation with an atomistic trap-based BTI model
H Kukner, P Weckx, P Raghavan, B Kaczer, F Catthoor, L Van der Perre, ...
MICPRO: Elsevier Microprocessors and Microsystems, 2013
Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model
H Kukner, P Weckx, P Raghavan, B Kaczer, F Catthoor, L Van Der Perre, ...
DSD'12: 15th Euromicro Conference on Digital System Design, 1-7, 2012
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