| TSV open defects in 3D integrated circuits: Characterization, test, and optimal spare allocation F Ye, K Chakrabarty DAC Design Automation Conference 2012, 1024-1030, 2012 | 109 | 2012 |
| Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting F Ye, Z Zhang, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013 | 75 | 2013 |
| TSV defects and TSV-induced circuit failures: The third dimension in test and design-for-test K Chakrabarty, S Deutsch, H Thapliyal, F Ye 2012 IEEE International Reliability Physics Symposium (IRPS), 5F. 1.1-5F. 1.12, 2012 | 69 | 2012 |
| On effective and efficient in-field TSV repair for stacked 3D ICs L Jiang, F Ye, Q Xu, K Chakrabarty, B Eklow Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013 | 42 | 2013 |
| Board-level functional fault diagnosis using multikernel support vector machines and incremental learning F Ye, Z Zhang, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014 | 32 | 2014 |
| Representative critical-path selection for aging-induced delay monitoring F Firouzi, F Ye, K Chakrabarty, MB Tahoori 2013 IEEE International Test Conference (ITC), 1-10, 2013 | 31 | 2013 |
| Adaptive board-level functional fault diagnosis using decision trees F Ye, Z Zhang, K Chakrabarty, X Gu 2012 IEEE 21st Asian Test Symposium, 202-207, 2012 | 28 | 2012 |
| Aging-and variation-aware delay monitoring using representative critical path selection F Firouzi, F Ye, K Chakrabarty, MB Tahoori ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (3 …, 2015 | 22 | 2015 |
| Test and design-for-testability solutions for 3D integrated circuits K Chakrabarty, M Agrawal, S Deutsch, B Noia, R Wang, F Ye IPSJ Transactions on System LSI Design Methodology 7, 56-73, 2014 | 17 | 2014 |
| Efficient board-level functional fault diagnosis with missing syndromes S Jin, F Ye, Z Zhang, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 14 | 2015 |
| Board-level functional fault diagnosis using learning based on incremental support-vector machines F Ye, Z Zhang, K Chakrabarty, X Gu 2012 IEEE 21st Asian Test Symposium, 208-213, 2012 | 13 | 2012 |
| On-chip voltage-droop prediction using support-vector machines F Ye, F Firouzi, Y Yang, K Chakrabarty, MB Tahoori 2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014 | 12 | 2014 |
| Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis F Ye, Z Zhang, K Chakrabarty, X Gu 2013 18th IEEE European Test Symposium (ETS), 1-6, 2013 | 11 | 2013 |
| Knowledge discovery and knowledge transfer in board-level functional fault diagnosis F Ye, Z Zhang, K Chakrabarty, X Gu 2014 International Test Conference, 1-10, 2014 | 10 | 2014 |
| On-chip droop-induced circuit delay prediction based on support-vector machines F Ye, F Firouzi, Y Yang, K Chakrabarty, MB Tahoori IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 9 | 2015 |
| Re-using BIST for circuit aging monitoring F Firouzi, F Ye, A Vijayan, A Koneru, K Chakrabarty, MB Tahoori 2015 20th IEEE European Test Symposium (ETS), 1-2, 2015 | 9 | 2015 |
| Adaptive board-level functional fault diagnosis using incremental decision trees F Ye, Z Zhang, K Chakrabarty, X Gu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 6 | 2015 |
| Information-theoretic framework for evaluating and guiding board-level functional-fault diagnosis F Ye, K Chakrabarty, Z Zhang, X Gu IEEE Design & Test of Computers, 65-75, 2014 | 6 | 2014 |
| Information-theoretic syndrome evaluation, statistical root-cause analysis, and correlation-based feature selection for guiding board-level fault diagnosis F Ye, Z Zhang, K Chakrabarty, X Gu IEEE transactions on computer-aided design of integrated circuits and …, 2015 | 5 | 2015 |
| Handling missing syndromes in board-level functional-fault diagnosis F Ye, S Jin, Z Zhang, K Chakrabarty, X Gu 2013 22nd Asian Test Symposium, 73-78, 2013 | 5 | 2013 |
Krishnendu ChakrabartyJohn Cocke Distinguished Professor and Chair, Electrical and Computer Engineering, DukeGeverifieerd e-mailadres voor duke.edu
