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Fangming Ye
Fangming Ye
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TSV open defects in 3D integrated circuits: Characterization, test, and optimal spare allocation
F Ye, K Chakrabarty
Proceedings of the 49th Annual Design Automation Conference, 1024-1030, 2012
1282012
Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting
F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013
1052013
TSV defects and TSV-induced circuit failures: The third dimension in test and design-for-test
K Chakrabarty, S Deutsch, H Thapliyal, F Ye
2012 IEEE International Reliability Physics Symposium (IRPS), 5F. 1.1-5F. 1.12, 2012
782012
Board-level functional fault diagnosis using multikernel support vector machines and incremental learning
F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2014
592014
On effective and efficient in-field TSV repair for stacked 3D ICs
L Jiang, F Ye, Q Xu, K Chakrabarty, B Eklow
Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013
462013
Representative critical-path selection for aging-induced delay monitoring
F Firouzi, F Ye, K Chakrabarty, MB Tahoori
2013 IEEE International Test Conference (ITC), 1-10, 2013
402013
Aging-and variation-aware delay monitoring using representative critical path selection
F Firouzi, F Ye, K Chakrabarty, MB Tahoori
ACM Transactions on Design Automation of Electronic Systems (TODAES) 20 (3 …, 2015
352015
Efficient board-level functional fault diagnosis with missing syndromes
S Jin, F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
342015
Adaptive board-level functional fault diagnosis using decision trees
F Ye, Z Zhang, K Chakrabarty, X Gu
2012 IEEE 21st Asian Test Symposium, 202-207, 2012
332012
On-chip droop-induced circuit delay prediction based on support-vector machines
F Ye, F Firouzi, Y Yang, K Chakrabarty, MB Tahoori
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
252015
On-chip voltage-droop prediction using support-vector machines
F Ye, F Firouzi, Y Yang, K Chakrabarty, MB Tahoori
2014 IEEE 32nd VLSI Test Symposium (VTS), 1-6, 2014
212014
Adaptive board-level functional fault diagnosis using incremental decision trees
F Ye, Z Zhang, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
202015
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis
F Ye, Z Zhang, K Chakrabarty, X Gu
2014 International Test Conference, 1-10, 2014
192014
Test and design-for-testability solutions for 3D integrated circuits
K Chakrabarty, M Agrawal, S Deutsch, B Noia, R Wang, F Ye
IPSJ Transactions on System LSI Design Methodology 7, 56-73, 2014
192014
Board-level functional fault identification using streaming data
M Liu, F Ye, X Li, K Chakrabarty, X Gu
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020
172020
Re-using BIST for circuit aging monitoring
F Firouzi, F Ye, A Vijayan, A Koneru, K Chakrabarty, MB Tahoori
2015 20th IEEE European Test Symposium (ETS), 1-2, 2015
162015
Fine-grained adaptive testing based on quality prediction
M Liu, R Pan, F Ye, X Li, K Chakrabarty, X Gu
ACM Transactions on Design Automation of Electronic Systems (TODAES) 25 (5 …, 2020
132020
Board-level functional fault diagnosis using learning based on incremental support-vector machines
F Ye, Z Zhang, K Chakrabarty, X Gu
2012 IEEE 21st Asian Test Symposium, 208-213, 2012
132012
Machine learning for iot
F Firouzi, B Farahani, F Ye, M Barzegari
Intelligent Internet of Things: From Device to Fog and Cloud, 243-313, 2020
122020
Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis
F Ye, Z Zhang, K Chakrabarty, X Gu
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
122013
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Artikelen 1–20