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René Paris
René Paris
Verified email at acin.tuwien.ac.at
Title
Cited by
Cited by
Year
Low-latency Shack–Hartmann wavefront sensor based on an industrial smart camera
M Thier, R Paris, T Thurner, G Schitter
IEEE Transactions on Instrumentation and Measurement 62 (5), 1241-1249, 2012
212012
Probabilistic absolute position sensor based on objective laser speckles
R Paris, M Melik-Merkumians, G Schitter
IEEE Transactions on Instrumentation and Measurement 65 (5), 1188-1196, 2016
152016
Knowledge driven mobile robots applied in the disassembly domain
G Koppensteiner, R Hametner, R Paris, AM Passani, M Merdan
The 5th International Conference on Automation, Robotics and Applications, 52-56, 2011
82011
Compensation based displacement measurement using objective laser speckles
R Paris, T Thurner, G Schitter
IFAC Proceedings Volumes 46 (5), 264-270, 2013
52013
Towards high speed ferrule-top atomic force microscopy
PI Chang, D Chavan, R Paris, D Iannuzzi, G Schitter
IFAC Proceedings Volumes 46 (5), 131-137, 2013
32013
Shack-Hartmann wavefront sensor based on an industrial smart camera
R Paris, M Thier, T Thurner, G Schitter
2012 IEEE International Instrumentation and Measurement Technology …, 2012
32012
Intelligente Kameras in der Messtechnik
R Paris, T Thurner, T Berndorfer, HW Yoo, G Schitter
e & i Elektrotechnik und Informationstechnik 1 (129), 34-41, 2012
22012
Vision-based probabilistic absolute position sensor
R Paris, M Melik-Merkumians, G Schitter
2015 IEEE International Instrumentation and Measurement Technology …, 2015
12015
Increasing sensitivity while reducing crosstalk of the force sensor in atomic force microscopes
J Steininger, R Paris, G Schitter
Proceedings of the 14th euspen International Conference, R. Leach, Ed 1, 321-324, 2014
12014
Method and apparatus for measuring a curved wavefront using at least one wavefront sensor
G Schitter, M Thier, R Paris, S Unger, HW Yoo
US Patent App. 16/311,615, 2020
2020
Vision-based absolute position sensing on technical surfaces
R Paris
Technische Universität Wien, 2019
2019
Improving the Deflection Readout Mechanism of an Atomic Force Microscope
J Steininger, R Paris, G Schitter
MESS14 Microelectronic Systems Symposium, Band 76 der OVE-Schriftenreihe, 22, 2014
2014
Smart cameras as metrology systems
R Paris, T Thurner, T Berndorfer, HW Yoo, G Schitter
e & i Elektrotechnik und Informationstechnik 129, 34-41, 2012
2012
Kommunikationsprozessanalyse zur Taktzeitoptimierung einer robotergestützten Montagezelle
R Paris
2010
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